Scanning Probe Microscopy of Soft Matter PDF Download
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Author: Vladimir V. Tsukruk
Publisher: John Wiley & Sons
ISBN: 3527639969
Category : Technology & Engineering
Languages : en
Pages : 663
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Book Description
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors
Author: Vladimir V. Tsukruk
Publisher: John Wiley & Sons
ISBN: 3527639969
Category : Technology & Engineering
Languages : en
Pages : 663
Get Book Here
Book Description
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors
Author: Laurene Tetard
Publisher: American Chemical Society
ISBN: 0841299579
Category : Science
Languages : en
Pages : 203
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Book Description
Techniques of nanoscale functional imaging and spectroscopy have blossomed since the invention of scanning probe microscopy (SPM) tools, starting with scanning tunneling microscopy in the early 1980s. The ability to resolve topographical features with nanoscale—sometimes atomic—precision has revolutionized our understanding of molecules, matter, and living systems. These observations have led scientists to pose increasingly more complex questions about properties beyond morphology and their evolution upon external stimuli. Overall, SPM-based schemes provide versatile ways to probe structural, electrical, mechanical, and chemical properties of materials at the nanoscale. Getting started with SPM can be intimidating. This digital primer aims to provide undergraduate and graduate students majoring in various fields of science and engineering with a practical guide to grasp essential concepts and principles related to SPM image and spectra formation and their interpretation. This guide may also be helpful to researchers who are considering new ways of evaluating nanoscale properties of materials, devices, or living systems as applicable to their respective fields. Because of the extensive literature on the developments and applications of SPM, it was impossible to comprehensively cover all aspects of the field. Hence, deliberate choices were made to emphasize some techniques that have not been discussed as extensively in the literature but hold great promise to understand complex systems at the nanoscale.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3642104975
Category : Technology & Engineering
Languages : en
Pages : 823
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Book Description
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3642254136
Category : Science
Languages : en
Pages : 634
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Book Description
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3642254144
Category : Science
Languages : en
Pages : 634
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Book Description
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author: Sergei V. Kalinin
Publisher: Springer Science & Business Media
ISBN: 144197167X
Category : Technology & Engineering
Languages : en
Pages : 563
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Book Description
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
Author: Eugene Michael Terentjev
Publisher: Oxford University Press, USA
ISBN: 0199667926
Category : Science
Languages : en
Pages : 605
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Book Description
This handbook will provide the reader with a profound introduction to the key subjects comprising the relatively new topic of Soft Condensed Matter. It will provide students and researchers with an authoritative overview of the field, identify key principles at play, and the most prominent ways of further development.
Author: Ritesh K Shukla
Publisher: CRC Press
ISBN: 1000600149
Category : Science
Languages : en
Pages : 367
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Book Description
Forensic Microscopy: Truth Under the Lenses provides an overview and understanding of the various types of microscopes and their techniques employed in forensic science. The book emphasizes both the theoretical and practical aspects of microscopy to enrich the reader’s understanding of the various tools, techniques, and utility—including strengths and weaknesses—of types of microscopes in analyzing certain forms of evidence. The book begins with the history of microscopes, the basic optics for microscopy, then moves to advanced microscopies such as electron microscopes and atomic force microscopes. In addition to the various types of microscopes and how to use and best utilize them, the book looks at the analysis of specific types of evidence, including hair, fiber, fingerprint, body fluids, tool marks, ink, pollen grains, spores, diatoms, bullets, cartridges, among other evidence types. Since forensic science is an applied, hands-on discipline, the book includes both a theoretical and a practical approach to the topic. Key Features: Addresses simple to advanced microscopy techniques for the effective analyses of trace evidence Pairs chapters on a particular type of microscopy, explaining it thoroughly, before delving into specific usage for forensic applications Presents theories and as well as real-world application of concepts Provides abundant micro-photographs, including graphical representations and flow charts, to illustrate concepts clearly Forensic Microscopy serves as a helpful reference for undergraduate and postgraduate students in forensic science, forensic biology, forensic chemistry and related programs. It is also recommended for research students, academicians, technicians, industry and laboratory professionals working on trace evidence analysis.
Author: Bert Voigtländer
Publisher: Springer
ISBN: 3662452405
Category : Technology & Engineering
Languages : en
Pages : 375
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Book Description
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Author: Nikodem Tomczak
Publisher: World Scientific
ISBN: 9814324760
Category : Science
Languages : en
Pages : 277
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Book Description
Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumentation and techniques are new and previously unthought-of opportunities in materials nanofabrication and characterisation. In particular, the developments in addressing and manipulating matter at the level of single atoms or molecules, and studies of biological materials (e.g. live cells, or cell membranes) result in new and exciting discoveries. The rising importance of SPM demands a concise treatment in the form of a book which is accessible to interdisciplinary practitioners. This book highlights recent advances in the field of SPM with sufficient depth and breadth to provide an intellectually stimulating overview of the current state of the art. The book is based on a set of carefully selected original works from renowned contributors on topics that range from atom technology, scanning tunneling spectroscopy of self-assembled nanostructures, SPM probe fabrication, scanning force microscopy applications in biology and materials science down to the single molecule level, novel scanning probe techniques, and nanolithography. The variety of topics underlines the strong interdisciplinary character of SPM related research and the combined expertise of the contributors gives us a unique opportunity to discuss possible future trends in SPM related research. This makes the book not merely a collection of already published material but an enlightening insight into cutting edge research and global SPM research trends.
