Retained Austenite and Its Measurements by X-ray Diffraction PDF Download
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Author: Chester F. Jatczak
Publisher:
ISBN: 9780898832242
Category : Austenite
Languages : en
Pages : 55
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Book Description
Author: Chester F. Jatczak
Publisher:
ISBN: 9780898832242
Category : Austenite
Languages : en
Pages : 55
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Book Description
Author: Kiyoshi Funatani
Publisher: ASM International
ISBN: 1615032053
Category : Technology & Engineering
Languages : en
Pages : 1214
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Book Description
Author: C. J. Bechtoldt
Publisher:
ISBN:
Category : Austenite
Languages : en
Pages : 24
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Book Description
Author: Yoshio Waseda
Publisher: Springer Science & Business Media
ISBN: 3642166350
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author: Bob B. He
Publisher: John Wiley & Sons
ISBN: 1119356067
Category : Science
Languages : en
Pages : 492
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Book Description
An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis Two-Dimensional X-Ray Diffraction, Second Edition is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 608
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Book Description
Author: Halle Abrams
Publisher: ASTM International
ISBN:
Category : Metallography
Languages : en
Pages : 658
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Book Description
Author: Marc Seefeldt
Publisher: Materials Research Forum LLC
ISBN: 1945291893
Category : Technology & Engineering
Languages : en
Pages : 310
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Book Description
The European Conference on Residual Stresses (ECRS) series is the leading European forum for scientific exchange on internal and residual stresses in materials. It addresses both academic and industrial experts and covers a broad gamut of stress-related topics from instrumentation via experimental and modelling methodology up to stress problems in specific processes such as welding or shot-peening, and their impact on materials properties. Chapters: Diffraction Methods; Mechanical Relaxation Methods; Acoustic and Electromagnetic Methods; Composites, Nano and Microstructures; Films, Coatings and Oxides; Cold Working and Machining; Heat Treatments and Phase Transformations; Welding, Fatigue and Fracture: Stresses in Additive Manufacturing.
Author: Arunansu Haldar
Publisher: Springer Science & Business Media
ISBN: 1848824548
Category : Technology & Engineering
Languages : en
Pages : 484
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Book Description
Microstructure and Texture in Steels and Other Materials comprises a collection of articles pertaining to experimental and theoretical aspects of the evolution of crystallographic texture and microstructure during processing of steels and some other materials. Among the topics covered is the processing-microstructure-texture-property relationship in various kinds of steels, including the latest grade. Special emphasis has been given to introduce recent advances in the characterization of texture and microstructure, as well as modeling. The papers included are written by well-known experts from academia and industrial R and D, which will provide the reader with state-of-the-art, in-depth knowledge of the subject. With these attributes, Microstructure and Texture in Steels and Other Materials is expected to serve the cause of creating awareness of current developments in microstructural science and materials engineering among academic and R and D personnel working in the field.
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
