Reliability Screening and Step-stress Testing of Digital-type Microcircuits PDF Download
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Author: H. F. Dean
Publisher:
ISBN:
Category :
Languages : en
Pages : 72
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Book Description
The effectiveness of thermal infrared mapping and nondestructive electrical tests for reliability screening was tested on 100 specimens of an industrial grade digital-type microcircuit. It was shown that more effective screening tests are needed, as a number of early failures were not predictable by the test methods employed. It was also shown that microcircuit containers may be opened for inspection and testing without degrading their reliability. (Author).
Author: H. F. Dean
Publisher:
ISBN:
Category :
Languages : en
Pages : 72
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Book Description
The effectiveness of thermal infrared mapping and nondestructive electrical tests for reliability screening was tested on 100 specimens of an industrial grade digital-type microcircuit. It was shown that more effective screening tests are needed, as a number of early failures were not predictable by the test methods employed. It was also shown that microcircuit containers may be opened for inspection and testing without degrading their reliability. (Author).
Author:
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ISBN:
Category : Aeronautics
Languages : en
Pages : 1278
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Author:
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ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 556
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Author:
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ISBN:
Category : Integrated circuits
Languages : en
Pages : 412
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Author: Texas Instruments Incorporated
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 116
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Author: Chung P. Wu
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Category :
Languages : en
Pages :
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Author:
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ISBN:
Category : Aeronautics
Languages : en
Pages : 2098
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Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 840
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Author: David B. Nicholls
Publisher:
ISBN:
Category : Digital integrated circuits
Languages : en
Pages : 352
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Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1074
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