Author: Arthur Feddeman Gorton
Publisher:
ISBN:
Category : Reflection (Optics)
Languages : en
Pages : 24

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Book Description

Author: Matt Pharr
Publisher: Morgan Kaufmann
ISBN: 0123750792
Category : Computers
Languages : en
Pages : 1201

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Book Description
This updated edition describes both the mathematical theory behind a modern photorealistic rendering system as well as its practical implementation. Through the ideas and software in this book, designers will learn to design and employ a full-featured rendering system for creating stunning imagery. Includes a companion site complete with source code for the rendering system described in the book, with support for Windows, OS X, and Linux.

Author: Nicolas Pinel
Publisher: John Wiley & Sons
ISBN: 1118579461
Category : Science
Languages : en
Pages : 122

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Book Description
Electromagnetic wave scattering from random rough surfaces is an active, interdisciplinary area of research with myriad practical applications in fields such as optics, acoustics, geoscience and remote sensing. Focusing on the case of random rough surfaces, this book presents classical asymptotic models used to describe electromagnetic wave scattering. The authors begin by outlining the basic concepts relevant to the topic before moving on to look at the derivation of the scattered field under asymptotic models, based on the Kirchhoff-tangent plane, in order to calculate both the scattered field and the statistical average intensity. More elaborated asymptotic models are also described for dealing with specific cases, and numerical results are presented to illustrate these models. Comparisons with a reference numerical method are made to confirm and refine the theoretical validity domains. The final chapter derives the expressions of the scattering intensities of random rough surfaces under the asymptotic models. Its expressions are given for their incoherent contributions, from statistical calculations. These results are then compared with numerical computations using a Monte-Carlo process, as well as with experimental models, for sea surface backscattering. Contents 1. Electromagnetic Wave Scattering from Random Rough Surfaces: Basics. 2. Derivation of the Scattered Field under Asymptotic Models. 3. Derivation of the Normalized Radar Cross-Section under Asymptotic Models. APPENDIX 1. Far-Field Scattered Fields under the Method of Stationary Phase. APPENDIX 2. Calculation of the Scattering Coefficients under the GO for 3D Problems. About the Authors Nicolas Pinel worked as a Research Engineer at the IETR (Institut d’Electronique et de Télécommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) before joining Alyotech Technologies in Rennes, France, in July 2013. His research interests are in the areas of radar and optical remote sensing, scattering and propagation. In particular, he works on asymptotic methods of electromagnetic wave scattering from random rough surfaces and layers. Christophe Bourlier works at the IETR (Institut d’Electronique et de Télécommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) and is also a Researcher at the French National Center for Scientific Research (CNRS) on electromagnetic wave scattering from rough surfaces and objects for remote sensing applications and radar signatures. He is the author of more than 160 journal articles and conference papers.

Author: Dan Fullerton
Publisher: Silly Beagle Productions
ISBN: 0983563306
Category : Education
Languages : en
Pages : 300

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Book Description
APlusPhysics: Your Guide to Regents Physics Essentials is a clear and concise roadmap to the entire New York State Regents Physics curriculum, preparing students for success in their high school physics class as well as review for high marks on the Regents Physics Exam. Topics covered include pre-requisite math and trigonometry; kinematics; forces; Newton's Laws of Motion, circular motion and gravity; impulse and momentum; work, energy, and power; electrostatics; electric circuits; magnetism; waves; optics; and modern physics. Featuring more than five hundred questions from past Regents exams with worked out solutions and detailed illustrations, this book is integrated with the APlusPhysics.com website, which includes online question and answer forums, videos, animations, and supplemental problems to help you master Regents Physics essentials. "The best physics books are the ones kids will actually read." Advance Praise for APlusPhysics Regents Physics Essentials: "Very well written... simple, clear engaging and accessible. You hit a grand slam with this review book." -- Anthony, NY Regents Physics Teacher. "Does a great job giving students what they need to know. The value provided is amazing." -- Tom, NY Regents Physics Teacher. "This was tremendous preparation for my physics test. I love the detailed problem solutions." -- Jenny, NY Regents Physics Student. "Regents Physics Essentials has all the information you could ever need and is much easier to understand than many other textbooks... it is an excellent review tool and is truly written for students." -- Cat, NY Regents Physics Student

Author: Jean Daillant
Publisher: Springer Science & Business Media
ISBN: 3540486968
Category : Science
Languages : en
Pages : 347

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Book Description
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.

Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 794

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Book Description
Vols. for 1903- include Proceedings of the American Physical Society.

Author: Dick Bedeaux
Publisher: World Scientific
ISBN: 1860944507
Category : Science
Languages : en
Pages : 465

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Book Description
This invaluable book represents a substantial body of work describing the theory of the optical properties of thin island films and rough surfaces. In both cases the feature sizes are small compared to the wavelength of light. The approach is extremely rigorous and theoretically very thorough. The reflection, transmission and absorption of light are described. Computer programs that provide exact solutions for theoretical properties of thin island films are available, and this makes the book of great practical use. The early chapters present a comprehensive theoretical framework. In this new edition a chapter on reflection from gyrotropic media has been added. Contributions due to the gyrotropic nature of the interfacial layer are discussed.

Author: Kun-Shan Chen
Publisher: CRC Press
ISBN: 1351011561
Category : Technology & Engineering
Languages : en
Pages : 323

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Book Description
Radar scattering and imaging of rough surfaces is an active interdisciplinary area of research with many practical applications in fields such as mineral and resource exploration, ocean and physical oceanography, military and national defense, planetary exploration, city planning and land use, environmental science, and many more. By focusing on the most advanced analytical and numerical modeling and describing both forward and inverse modeling, Radar Scattering and Imaging of Rough Surfaces: Modeling and Applications with MATLAB® connects the scattering process to imaging techniques by vivid examples through numerical and experimental demonstrations and provides computer codes and practical uses. This book is unique in its simultaneous treatment of radar scattering and imaging. Key Features Bridges physical modeling with simulation for resolving radar imaging problems (the first comprehensive work to do so) Provides excellent basic and advanced information for microwave remote-sensing professionals in various fields of science and engineering Covers most advanced analytical and numerical modeling for both backscattering and bistatic scattering Includes MATLAB® codes useful not only for academics but also for radar engineers and scientists to develop tools applicable in different areas of earth studies Covering both the theoretical and the practical, Radar Scattering and Imaging of Rough Surfaces: Modeling and Applications with MATLAB® is an invaluable resource for professionals and students using remote sensing to study and explain the Earth and its processes. University and research institutes, electrical and radar engineers, remote-sensing image users, application software developers, students, and academics alike will benefit from this book. The author, Kun-Shan Chen, is an internationally known and respected engineer and scientist and an expert in the field of electromagnetic modeling.

Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 968

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Book Description

Author: Yinquan Yu
Publisher: CRC Press
ISBN: 1000821234
Category : Technology & Engineering
Languages : en
Pages : 413

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Book Description
This book introduces the latest processing technologies for a variety of materials in advanced manufacturing and applications. Design criteria and considerations of processing or devices are theoretically introduced, and numerical simulation and experimental study are included. FEATURES Covers a variety of materials, including hard materials, soft materials, metals, and composites Describes nanotechnology approaches, modern piezoelectric techniques, and physical and mechanical studies of the structure-sensitive properties of the materials Reviews advanced manufacturing for antenna applications and embroidered RFID tags for wearable applications Considers additive manufacturing of cellular solids and metal additive manufacturing Discusses advanced materials for sound absorption Aimed at engineers, researchers, and advanced students in materials processing and advanced manufacturing, this work helps readers to understand which processing technology is suitable for a specific material and the design rules for a particular application.