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Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128134054
Category : Science
Languages : en
Pages : 767
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Book Description
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. - Offers a fully revised and expanded new edition based on the latest research developments in electron optics - Written by the top experts in the field - Covers every significant advance in electron optics since the subject originated - Contains exceptionally complete and carefully selected references and notes - Serves both as a reference and text
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128134054
Category : Science
Languages : en
Pages : 767
Get Book Here
Book Description
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. - Offers a fully revised and expanded new edition based on the latest research developments in electron optics - Written by the top experts in the field - Covers every significant advance in electron optics since the subject originated - Contains exceptionally complete and carefully selected references and notes - Serves both as a reference and text
Author:
Publisher: Academic Press
ISBN: 0080577474
Category : Computers
Languages : en
Pages : 357
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Book Description
Advances in Electronics and Electron Physics
Author: Jian Min Zuo
Publisher: Springer
ISBN: 1493966073
Category : Technology & Engineering
Languages : en
Pages : 741
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Book Description
This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Author:
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Category : Electron microscopes
Languages : en
Pages : 744
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Book Description
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Category : Mass spectrometry
Languages : en
Pages : 626
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Book Description
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ISBN:
Category : Aeronautics
Languages : en
Pages : 384
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Book Description
Author:
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ISBN:
Category : Science
Languages : en
Pages : 1014
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Book Description
Author:
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ISBN:
Category : Electron microscopy
Languages : en
Pages : 488
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Book Description
Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops.
Author: Andre Heck
Publisher: Springer Science & Business Media
ISBN: 0306486032
Category : Science
Languages : en
Pages : 1102
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Book Description
With about 200,000 entries, StarBriefs Plus represents the most comprehensive and accurately validated collection of abbreviations, acronyms, contractions and symbols within astronomy, related space sciences and other related fields. As such, this invaluable reference source (and its companion volume, StarGuides Plus) should be on the reference shelf of every library, organization or individual with any interest in these areas. Besides astronomy and associated space sciences, related fields such as aeronautics, aeronomy, astronautics, atmospheric sciences, chemistry, communications, computer sciences, data processing, education, electronics, engineering, energetics, environment, geodesy, geophysics, information handling, management, mathematics, meteorology, optics, physics, remote sensing, and so on, are also covered when justified. Terms in common use and/or of general interest have also been included where appropriate.
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Category : Government publications
Languages : en
Pages : 1470
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Book Description
