Radiation Effects Design Handbook. Section 1 - Semiconductor Diodes PDF Download
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Author: D. J. Hamman
Publisher:
ISBN:
Category :
Languages : en
Pages : 52
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Book Description
Author: D. J. Hamman
Publisher:
ISBN:
Category :
Languages : en
Pages : 52
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 696
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Book Description
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1104
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Book Description
Author: V. S. Vavilov
Publisher: Springer Science & Business Media
ISBN: 1468490699
Category : Science
Languages : en
Pages : 280
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Book Description
Author: Allan H Johnston
Publisher: World Scientific
ISBN: 9814467650
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.
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Category : Nuclear energy
Languages : en
Pages : 764
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Book Description
Author:
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ISBN:
Category : Government publications
Languages : en
Pages : 1388
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Book Description
Author: William C. Cooley
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 124
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Book Description
Prepared under contract for NASA by Exotech, Incorporated, Alexandria, Virginia, and reproduced photographically from copy supplied by the contractor.
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 412
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Book Description
Author: Marius Bazu
Publisher: John Wiley & Sons
ISBN: 1119990009
Category : Technology & Engineering
Languages : en
Pages : 372
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Book Description
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
