Pulse Transient Hot Strip Technique for Measurement of Thermal Properties of Non-conducting Substances and Thin Insulating Layers on Substrates PDF Download
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Author: Mohammed Aslam Chohan
Publisher:
ISBN:
Category : Solids
Languages : en
Pages : 276
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Author: Mohammed Aslam Chohan
Publisher:
ISBN:
Category : Solids
Languages : en
Pages : 276
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Author: Peter S. Gaal
Publisher: CRC Press
ISBN: 9781566767118
Category : Technology & Engineering
Languages : en
Pages : 874
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Author: Timothy W. Tong
Publisher: CRC Press
ISBN: 9781566761727
Category : Technology & Engineering
Languages : en
Pages : 1022
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Author:
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ISBN:
Category : Architecture and energy conservation
Languages : en
Pages : 324
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Author:
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ISBN:
Category : Combustion
Languages : en
Pages : 1074
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Author:
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ISBN:
Category : Heat
Languages : en
Pages : 1070
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Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
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Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author: A. Cezairliyan
Publisher: Springer Science & Business Media
ISBN: 1461532868
Category : Science
Languages : en
Pages : 639
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Book Description
Building on the extensive coverage of the first volume, Volume 2 focuses on the fundamentals of measurements and computational techniques that will aid researchers in the construction and use of measurement devices.
Author:
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ISBN:
Category : Aeronautics
Languages : en
Pages : 1146
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Author:
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ISBN:
Category : Metallurgy
Languages : en
Pages : 1412
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