Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures (ICMIS) , Long Beach Hyatt Regency, Long Beach, Ca. , Feb. 22-23, 1988 PDF Download

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1986 1986

Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures (ICMIS) , Long Beach Hyatt Regency, Long Beach, Ca. , Feb. 22-23, 1988

Author: IEEE Electron Devices Society
Publisher:
ISBN:
Category :
Languages : en
Pages : 206

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Book Description

Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures (ICMIS) , Long Beach Hyatt Regency, Long Beach, Ca. , Feb. 22-23, 1988

Author: IEEE Electron Devices Society
Publisher:
ISBN:
Category :
Languages : en
Pages : 206

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Book Description

Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures

Author: International Conference on Microelectronic Test Structures (1, 1988, Long Beach, Calif.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 206

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Book Description

Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS

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Publisher:
ISBN:
Category :
Languages : en
Pages : 206

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1988 IEEE Proceedings on Microelectronic Test Structures (ICMTS)

Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages :

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Proceedings of the ... IEEE International Conference on Microelectronic Test Structures

Author: International Conference on Microelectronic Test Structures
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS

Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 206

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Proceedings of the 1988 I.E.E.E. International Conference on Microelectronic Test Structures, ICMTS.

Author: IEEE Electron Devices Society
Publisher:
ISBN:
Category :
Languages : en
Pages : 206

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Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on

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Category : Electronic books
Languages : en
Pages :

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1997 IEEE International Conference on Microelectronic Test Structures Proceedings

Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780332430
Category : Technology & Engineering
Languages : en
Pages : 225

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ICMTS 93

Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780308572
Category : Integrated circuits
Languages : en
Pages : 298

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Book Description
This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.