Proceedings of the International Congress on High Speed Photography and Photonics PDF Download
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Author:
Publisher:
ISBN:
Category : Photography, High-speed
Languages : en
Pages : 622
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Book Description
Author:
Publisher:
ISBN:
Category : Photography, High-speed
Languages : en
Pages : 622
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Book Description
Author: Lincoln L. Endelman
Publisher:
ISBN:
Category : Optical instruments
Languages : en
Pages : 582
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Book Description
Author: Michel L. André
Publisher:
ISBN:
Category : Photography
Languages : en
Pages : 550
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Book Description
Author: Joseph R. Lakowicz
Publisher: Springer Science & Business Media
ISBN: 0306470578
Category : Science
Languages : en
Pages : 462
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Book Description
In this inaugural volume of a new series, experts in the field help biochemists, analytical chemists, spectroscopists, biophysicists, and other specialists keep up with the latest techniques and technologies available in fluorescence spectroscopy.
Author:
Publisher:
ISBN:
Category : Photography, High-speed
Languages : en
Pages : 614
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Book Description
Author:
Publisher:
ISBN:
Category : Communication of technical information
Languages : en
Pages : 236
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Author:
Publisher:
ISBN:
Category : Detonation
Languages : en
Pages : 830
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Book Description
Author: Dennis L. Paisley
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Photography
Languages : en
Pages : 720
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Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author: United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1080
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Book Description
Author: D.J. Thompson
Publisher: Springer Science & Business Media
ISBN: 9401704457
Category : Technology & Engineering
Languages : en
Pages : 1065
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Book Description
An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas urements, includes Sections (5) through (9).
