Proceedings / International Test Conference. 1993. Designing, testing, and diagnostics - join them : October 17 - 21, 1993, Convention Center, Baltimore, Maryland, USA PDF Download
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Author: International Test Conference
Publisher:
ISBN: 9780780314290
Category :
Languages : en
Pages :
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Author: International Test Conference
Publisher:
ISBN: 9780780314290
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN: 9780780314306
Category : Automatic test equipment
Languages : en
Pages : 1065
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Author: IEEE Computer Society. Test Technology Technical Committee
Publisher:
ISBN:
Category :
Languages : en
Pages : 1065
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 1065
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Book Description
Author:
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1065
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Author: Institute of Electrical and Electronics Engineers
Publisher: Conference
ISBN:
Category : Automatic checkout equipment
Languages : en
Pages : 1032
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Book Description
Annotation The proceedings of the 23rd edition of the premier technical conference on electronic testing, held in Baltimore, Maryland, September 1992, comprise papers, panels, and tutorials in the areas of design and test integration; test management; software; test hardware; device, assembly, and system test; and IEEE test standards. ITC's 1992 theme, Discover the New World of Test and Design, reflects the growing emphasis on tighter integration of test and design to assure the highest quality products. No subject index. Ruggedly bound for heavy use. Annotation copyrighted by Book News, Inc., Portland, OR.
Author:
Publisher: Conference
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1090
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Annotation Proceedings of the 24th International Test Conference held in Baltimore, October 1993--the premier conference for the testing of electronic devices, assemblies, and systems, including design for testability and diagnostics. This year's leading edge topics are mixed-signal testing, multichip modules, systems test, automatic synthesis of test structures in design, boundary scan, and Iddq. Core topics represented included ATPG, modeling, test equipment hardware, delay fault testing, software testing, DFT, applied BIST, board testing, memory and microprocessor testing, test economics, and test quality and reliability. Annotation copyright by Book News, Inc., Portland, OR.
Author:
Publisher:
ISBN:
Category : Automatic checkout equipment
Languages : en
Pages : 1012
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Book Description
Author:
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1012
Get Book Here
Book Description
