X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK PDF Download
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Author: P.B. Kenway
Publisher: CRC Press
ISBN: 9780750302555
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.
Author: P.B. Kenway
Publisher: CRC Press
ISBN: 9780750302555
Category : Technology & Engineering
Languages : en
Pages : 690
Get Book Here
Book Description
The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1082
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Book Description
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 726
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Book Description
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461502152
Category : Technology & Engineering
Languages : en
Pages : 708
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Book Description
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Author: A. Haase
Publisher: World Scientific
ISBN: 9789810230852
Category : Science
Languages : en
Pages : 726
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Book Description
To honour W C Rntgen and review the entire area of X-ray development in the various fields of natural, technical, and life sciences, his successors at the Physikalisches Institut of the Universitt Wrzburg organized a conference, named ?Rntgen Centennial?. It took place at the new ?Physikalisches Institut? not far from the historical site shortly before the actual 100th anniversary of the discovery. Over forty renowned scientists were invited as representative speakers in the various subfields of X-ray activities. They reviewed the development, gave examples, and described the present status. Most of them provided survey articles, which are gathered in this book. Since most X-ray-related activities are somehow represented, an almost complete overview of the entire field is provided. This book thus represents the enormous breadth of X-ray activities and allows one to recognize the potential and quality of today's X-ray research.
Author: Gunji Shinoda
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 936
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Author: National Library of Medicine (U.S.)
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages :
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Book Description
First multi-year cumulation covers six years: 1965-70.
Author: Christopher Barshick
Publisher: CRC Press
ISBN: 9780824702434
Category : Science
Languages : en
Pages : 538
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Book Description
Providing a theoretical background for inorganic mass spectrometry, this text describes classical applications of four modern mass spectrometers - magnetic sector, quadrupole, time-of-flight, and ion trap - and illustrates how they have impacted elemental and isotopic analysis. The book features examples that concentrate on routine and non-routine applications of inorganic analysis techniques.
Author: Kurt F. J. Heinrich
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 180
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Book Description
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 728
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Book Description
