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Author: Renliang Xu
Publisher: Springer Science & Business Media
ISBN: 0306471248
Category : Science
Languages : en
Pages : 411
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Book Description
Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.
Author: Renliang Xu
Publisher: Springer Science & Business Media
ISBN: 0306471248
Category : Science
Languages : en
Pages : 411
Get Book Here
Book Description
Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.
Author: John C. Stover
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
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Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Author: Alvin Lieberman
Publisher: Springer Science & Business Media
ISBN: 1468465120
Category : Technology & Engineering
Languages : en
Pages : 419
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Book Description
Contamination control standards and techniques for all phases of the production of high-technology products are spelled out in this applications-orientated guide. Practical cleaning methods for products and process fluids are accompanied by tips on selecting operations based on economy and efficiency. Explanations of contaminant measurement devices cover operation, error sources and remedial methods. Engineers will find vital data on contaminant sources, as well as coverage of operations and procedures that aggravate contaminant effects.
Author: Beddow
Publisher: CRC Press
ISBN: 1351083805
Category : Science
Languages : en
Pages : 263
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Book Description
Volume I present an important exposition of some of the most significant areas where particle characterization is applied. The technological fields include pharmaceutical materials, bulk solids, and explosions.
Author: T. Allen
Publisher: Elsevier
ISBN: 0080539327
Category : Technology & Engineering
Languages : en
Pages : 683
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Book Description
Powder technology is a rapidly expanding technology and nowhere more than in particle characterization. There has been an explosion of new particle measuring techniques in the past ten year particularly in the field of on-line measurement. One of the main aims of this book is to bring the reader up-to-date with current practices. One important area of interest is the improvements in on-line light scattering instruments and the introduction of ultrasonic on-line devices. Another is the introduction of on-line microscopy, which permits shape analysis in conjunction with particle sizing.Schools of powder technology are common in Europe and Japan but the importance of this subject has only recently been recognised in America with the emergence of the Particle Research Centre (PERC) at the University of Florida in Gainsville.- Details all the latest developments in powder technology - Written by established authority on powder technology- A comprehensive text covering all aspects of powder technology and handling of particulate solids including characterization, handling and applications
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 1744
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Book Description
Author: Efstathios E. Michaelides
Publisher: CRC Press
ISBN: 1000790576
Category : Technology & Engineering
Languages : en
Pages : 478
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Book Description
Multiphase Flows with Droplets and Particles provides an organized, pedagogical study of multiphase flows with particles and droplets. This revised edition presents new information on particle interactions, particle collisions, thermophoresis and Brownian movement, computational techniques and codes, and the treatment of irregularly shaped particles. An entire chapter is devoted to the flow of nanoparticles and applications of nanofluids. Features Discusses the modelling and analysis of nanoparticles. Covers all fundamental aspects of particle and droplet flows. Includes heat and mass transfer processes. Features new and updated sections throughout the text. Includes chapter exercises and a Solutions Manual for adopting instructors. Designed to complement a graduate course in multiphase flows, the book can also serve as a supplement in short courses for engineers or as a stand-alone reference for engineers and scientists who work in this area.
Author: N G Stanley-Wood
Publisher: Royal Society of Chemistry
ISBN: 1847551629
Category : Science
Languages : en
Pages : 557
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Book Description
Particle Size Analysis reviews the development of particle characterization over the past 25 years and also speculates on its future. Interest in the subject has increased enormously over the years and this book highlights the changes and advances made within the field. This book is comprehensive in its coverage of particle size analysis and includes contributions on such characterization techniques as microscopy using fractal analysis, light diffraction, light scattering with the phase doppler technique, light observation, and photon correlation spectroscopy. A number of chapters address the interest in on-line in-stream particle size analysis and illustrate the progress being made in achieving this long sought after ideal of in-situ in-process particle characterization. Applications to other technological fields are detailed by chapters covering biological systems and the pharmaceutical industry. The subject of surface area determination is considered with particular emphasis on the measurements on porosity of powders, the characterization and comparability of reference materials, and the need for standards. Particle Size Analysis should provide stimulating reading for technologists, scientists, and engineers involved in particle characterization and powder technology worldwide.
Author: Microbeam Analysis Society
Publisher:
ISBN:
Category : Ann Arbor, MI
Languages : en
Pages : 236
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Book Description
Author: United States. National Bureau of Standards. Technical Information and Publications Division
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 788
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Book Description
