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Author:
Publisher:
ISBN:
Category : Engineering inspection
Languages : en
Pages : 616
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Book Description
Author:
Publisher:
ISBN:
Category : Engineering inspection
Languages : en
Pages : 616
Get Book Here
Book Description
Author: Christophe Gorecki
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Mathematics
Languages : en
Pages : 608
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Book Description
Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 1498779506
Category : Science
Languages : en
Pages : 585
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Book Description
Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS
Author: Toru Yoshizawa
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
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Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 1420019163
Category : Science
Languages : en
Pages : 524
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Book Description
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.
Author: Richard Leach
Publisher: Springer Science & Business Media
ISBN: 3642120121
Category : Technology & Engineering
Languages : en
Pages : 333
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Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Author: Wolfgang Osten
Publisher: John Wiley & Sons
ISBN: 3527648461
Category : Science
Languages : en
Pages : 471
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Book Description
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Author: Michel Grediac
Publisher: John Wiley & Sons
ISBN: 1118578473
Category : Science
Languages : en
Pages : 376
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Book Description
This timely book presents cutting-edge developments by experts in the field on the rapidly developing and scientifically challenging area of full-field measurement techniques used in solid mechanics – including photoelasticity, grid methods, deflectometry, holography, speckle interferometry and digital image correlation. The evaluation of strains and the use of the measurements in subsequent parameter identification techniques to determine material properties are also presented. Since parametric identification techniques require a close coupling of theoretical models and experimental measurements, the book focuses on specific modeling approaches that include finite element model updating, the equilibrium gap method, constitutive equation gap method, virtual field method and reciprocity gap method. In the latter part of the book, the authors discuss two particular applications of selected methods that are of special interest to many investigators: the analysis of localized phenomenon and connections between microstructure and constitutive laws. The final chapter highlights infrared measurements and their use in the mechanics of materials. Written and edited by knowledgeable scientists, experts in their fields, this book will be a valuable resource for all students, faculties and scientists seeking to expand their understanding of an important, growing research area
Author: Dietrich Marcuse
Publisher: Elsevier
ISBN: 0323153690
Category : Technology & Engineering
Languages : en
Pages : 373
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Book Description
Principles of Optical Fiber Measurements focuses on the optical fiber systems, which are being added to the telephone networks of various countries around the world. This book explores the significance of optical fiber systems in the increasing variety of fiber-related products on the market. Comprised of seven chapters, this book starts with an overview of the fiber fabrication process with emphasis on the method of measurements to reduce fiber loss in the field of optical communication. This text then examines the special methods to measure extremely low dispersion in single-mode fibers. Other chapters consider the measurement requirements of commercial fiber manufacturers to allow them to specify their products as well as for fiber users to verify that they get what they expect. The final chapter deals with the various measurement methods for determining the V value of fibers as well as the geometrical dimensions of fibers and preforms. This book is a valuable resource for specialists and readers who desire a better understanding of fiber specifications.
Author: Pramod Rastogi
Publisher: Artech House
ISBN: 1608078078
Category : Technology & Engineering
Languages : en
Pages : 473
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Book Description
This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.
