Author: Bernard Taub Feld
Publisher:
ISBN:
Category : Neutrons
Languages : en
Pages : 16
Book Description
On the Interpretation on Inelastic Scattering Data
Author: Bernard Taub Feld
Publisher:
ISBN:
Category : Neutrons
Languages : en
Pages : 16
Book Description
Publisher:
ISBN:
Category : Neutrons
Languages : en
Pages : 16
Book Description
Elastic and Inelastic Scattering in Electron Diffraction and Imaging
Author: Zhong-lin Wang
Publisher: Springer Science & Business Media
ISBN: 1489915796
Category : Science
Languages : en
Pages : 461
Book Description
Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.
Publisher: Springer Science & Business Media
ISBN: 1489915796
Category : Science
Languages : en
Pages : 461
Book Description
Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.
Fundamentals of Inelastic Electron Scattering
Author: P. Schattschneider
Publisher: Springer Science & Business Media
ISBN: 3709188660
Category : Technology & Engineering
Languages : en
Pages : 205
Book Description
Electron energy loss spectroscopy (ELS) is a vast subject with a long and honorable history. The problem of stopping power for high energy particles interested the earliest pioneers of quantum mechanics such as Bohr and Bethe, who laid the theoretical foun dations of the subject. The experimental origins might perhaps be traced to the original Franck-Hertz experiment. The modern field includes topics as diverse as low energy reflection electron energy loss studies of surface vibrational modes, the spectroscopy of gases and the modern theory of plasmon excitation in crystals. For the study of ELS in electron microscopy, several historically distinct areas of physics are relevant, including the theory of the Debye Waller factor for virtual inelastic scattering, the use of complex optical potentials, lattice dynamics for crystalline specimens and the theory of atomic ionisation for isolated atoms. However the field of electron energy loss spectroscopy contains few useful texts which can be recommended for students. With the recent appearance of Raether's and Egerton's hooks (see text for references), we have for the first time both a comprehensive review text-due to Raether-and a lucid introductory text which emphasizes experimental aspects-due to Egerton. Raether's text tends to emphasize the recent work on surface plasmons, while the strength of Egerton's book is its treatment of inner shell excitations for microanalysis, based on the use of atomic wavefunctions for crystal electrons.
Publisher: Springer Science & Business Media
ISBN: 3709188660
Category : Technology & Engineering
Languages : en
Pages : 205
Book Description
Electron energy loss spectroscopy (ELS) is a vast subject with a long and honorable history. The problem of stopping power for high energy particles interested the earliest pioneers of quantum mechanics such as Bohr and Bethe, who laid the theoretical foun dations of the subject. The experimental origins might perhaps be traced to the original Franck-Hertz experiment. The modern field includes topics as diverse as low energy reflection electron energy loss studies of surface vibrational modes, the spectroscopy of gases and the modern theory of plasmon excitation in crystals. For the study of ELS in electron microscopy, several historically distinct areas of physics are relevant, including the theory of the Debye Waller factor for virtual inelastic scattering, the use of complex optical potentials, lattice dynamics for crystalline specimens and the theory of atomic ionisation for isolated atoms. However the field of electron energy loss spectroscopy contains few useful texts which can be recommended for students. With the recent appearance of Raether's and Egerton's hooks (see text for references), we have for the first time both a comprehensive review text-due to Raether-and a lucid introductory text which emphasizes experimental aspects-due to Egerton. Raether's text tends to emphasize the recent work on surface plasmons, while the strength of Egerton's book is its treatment of inner shell excitations for microanalysis, based on the use of atomic wavefunctions for crystal electrons.
Structure Analysis by Small-Angle X-Ray and Neutron Scattering
Author: L.A. Feigin
Publisher: Springer Science & Business Media
ISBN: 1475766246
Category : Science
Languages : en
Pages : 339
Book Description
Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.
Publisher: Springer Science & Business Media
ISBN: 1475766246
Category : Science
Languages : en
Pages : 339
Book Description
Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.
Materials Characterization Using Nondestructive Evaluation (NDE) Methods
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 322
Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 322
Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Nuclear Science Abstracts
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 744
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 744
Book Description
Practical Approaches to Biological Inorganic Chemistry
Author: Robert R. Crichton
Publisher: Elsevier
ISBN: 0444642269
Category : Science
Languages : en
Pages : 506
Book Description
Practical Approaches to Biological Inorganic Chemistry, Second Edition, reviews the use of spectroscopic and related analytical techniques to investigate the complex structures and mechanisms of biological inorganic systems that contain metals. Each chapter presents an overview of the technique, including relevant theory, a clear explanation of what it is, how it works, and how the technique is actually used to evaluate biological structures. New chapters cover Raman Spectroscopy and Molecular Magnetochemistry, but all chapters have been updated to reflect the latest developments in discussed techniques. Practical examples, problems and many color figures are also included to illustrate key concepts. The book is designed for researchers and students who want to learn both the basics and more advanced aspects of key methods in biological inorganic chemistry. - Presents new chapters on Raman Spectroscopy and Molecular Magnetochemistry, as well as updated figures and content throughout - Includes color images throughout to enable easier visualization of molecular mechanisms and structures - Provides worked examples and problems to help illustrate and test the reader's understanding of each technique - Written by leading experts who use and teach the most important techniques used today to analyze complex biological structures
Publisher: Elsevier
ISBN: 0444642269
Category : Science
Languages : en
Pages : 506
Book Description
Practical Approaches to Biological Inorganic Chemistry, Second Edition, reviews the use of spectroscopic and related analytical techniques to investigate the complex structures and mechanisms of biological inorganic systems that contain metals. Each chapter presents an overview of the technique, including relevant theory, a clear explanation of what it is, how it works, and how the technique is actually used to evaluate biological structures. New chapters cover Raman Spectroscopy and Molecular Magnetochemistry, but all chapters have been updated to reflect the latest developments in discussed techniques. Practical examples, problems and many color figures are also included to illustrate key concepts. The book is designed for researchers and students who want to learn both the basics and more advanced aspects of key methods in biological inorganic chemistry. - Presents new chapters on Raman Spectroscopy and Molecular Magnetochemistry, as well as updated figures and content throughout - Includes color images throughout to enable easier visualization of molecular mechanisms and structures - Provides worked examples and problems to help illustrate and test the reader's understanding of each technique - Written by leading experts who use and teach the most important techniques used today to analyze complex biological structures
The Spin Structure of the Nucleon
Author: Bernard Frois
Publisher: World Scientific Publishing Company Incorporated
ISBN: 9789810233235
Category : Science
Languages : en
Pages : 685
Book Description
From its early beginnings at SLAC in the 1970's, the study of nucleon spin structure using polarized lepton beams and polarized nucleon targets has become increasingly important in nuclear and particle physics, with current experiments at several of the world's high energy laboratories (CERN, DESY and SLAC) and with enormous related theoretical studies. The understanding of the fascinating but complicated problem of nucleon spin structure has progressed substantially, but fundamental questions remain and it can be confidently predicted that future activity will be high. The Erice Course on The Spin Structure of the Nucleon covered both the experimental and theoretical aspects of the subject, and this volume includes the lectures given at the School. In many cases the lecture material has been extended and updated by the authors. In addition, several recent publications on experimental work have been added in an appendix.
Publisher: World Scientific Publishing Company Incorporated
ISBN: 9789810233235
Category : Science
Languages : en
Pages : 685
Book Description
From its early beginnings at SLAC in the 1970's, the study of nucleon spin structure using polarized lepton beams and polarized nucleon targets has become increasingly important in nuclear and particle physics, with current experiments at several of the world's high energy laboratories (CERN, DESY and SLAC) and with enormous related theoretical studies. The understanding of the fascinating but complicated problem of nucleon spin structure has progressed substantially, but fundamental questions remain and it can be confidently predicted that future activity will be high. The Erice Course on The Spin Structure of the Nucleon covered both the experimental and theoretical aspects of the subject, and this volume includes the lectures given at the School. In many cases the lecture material has been extended and updated by the authors. In addition, several recent publications on experimental work have been added in an appendix.
Nuclear Data Tables
Author: U.S. Atomic Energy Commission
Publisher:
ISBN:
Category : Nuclear physics
Languages : en
Pages : 460
Book Description
Publisher:
ISBN:
Category : Nuclear physics
Languages : en
Pages : 460
Book Description
Transmission Electron Microscopy
Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 1475725191
Category : Science
Languages : en
Pages : 708
Book Description
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Publisher: Springer Science & Business Media
ISBN: 1475725191
Category : Science
Languages : en
Pages : 708
Book Description
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.