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Author: M.J. Buckingham
Publisher:
ISBN: 9780136244530
Category :
Languages : en
Pages : 372
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Book Description
Author: M.J. Buckingham
Publisher:
ISBN: 9780136244530
Category :
Languages : en
Pages : 372
Get Book Here
Book Description
Author: Douglas C. Smith
Publisher: Springer Science & Business Media
ISBN: 0442006365
Category : Technology & Engineering
Languages : en
Pages : 252
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Book Description
This ready reference provides electrical engineers with practical information on accurate methods for measuring signals and noise in electronic circuits as well as methods for locating and reducing high frequency noise generated by circuits or external interference. Engineers often find that measuring and mitigating high frequency noise signals in electronic circuits can be problematic when utilizing common measurement methods. Demonstrating the innovative solutions he developed as a Distinguished Member of Technical Staff at AT&T/Bell Laboratories, solutions which earned him numerous U.S. and foreign patents, Douglas Smith has written the most definitive work on this subject. Smith explains design problems related to the new high frequency electronic standards, and then systematically provides laboratory proven methods for making accurate noise measurements, while demonstrating how these results should be interpreted. The technical background needed to conduct these experiments is provided as an aid to the novice, and as a reference for the professional. Smith also discusses theoretical concepts as they relate to practical applications. Many of the techniques Smith details in this book have been previously unpublished, and have been proven to solve problems in hours rather than in the days or weeks of effort it would take conventional techniques to yield results. Comprehensive and informative, this volume provides detailed coverage of such areas as: scope probe impedance, grounding, and effective bandwidth, differential measurement techniques, noise source location and identification, current probe characteristics, operation, and applications, characteristics of sources of interference to measurements and the minimization of their effects, minimizing coupling of external noise into the equipment under test by measurements, estimating the effect of a measurement on equipment operation, using digital scopes for single shot noise measurements, prediction of equipment electromagnetic interference (EMI) emission and susceptibility of performance, null experiments for validating measurement data, the relationship between high frequency noise and final product reliability. With governmental regulations and MIL standards now governing the emission of high frequency electronic noise and the susceptibility to pulsed EMI, the information presented in this guide is extremely pertinent. Electrical engineers will find High Frequency Measurements and Noise in Electronic Circuits an essential desktop reference for information and solutions, and engineering students will rely on it as a virtual source book for deciphering the "mysteries" unique to high frequency electronic circuits.
Author: Peter J. Fish
Publisher: McGraw-Hill Companies
ISBN:
Category : Electronic circuits
Languages : en
Pages : 312
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Book Description
Author: Alexander A. Balandin
Publisher: Amer Scientific Pub
ISBN: 9781588830050
Category : Reference
Languages : en
Pages : 390
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Book Description
Noise and Fluctuations Control in Electronic Devices is the first single reference source to bring together the latest aspects of noise research for a wide range of multidisciplinary audiences. The goal of this book is to give an update of state-of-the-art in this interdisciplinary field, while focusing on new trends in electronic device noise research. Such new trends include investigation of noise in electronic devices based on novel materials, effects of the downscaling on the device noise performance, fluctuations and noise control in nanodevices, effective methods of noise control and suppression, etc. In addition, the book presents a historic overview of the development of the kinetic theory of fluctuation, essential for understanding of the present state-of-the art. This book contains 18 state-of-the-art review chapters written by 33 internationally renowned experts from 15 countries. This book has about 1,500 bibliographical citations and hundreds of illustrations, figures, tables and equations. This book is a definite reference source for students, scientists, engineers, and specialists both in academia and industry working in such different fields as electronic and optoelectronic devices, electrical and electronic engineering, solid-state physics, nanotechnology, wireless communication, telecommunication, and semiconductor device technology.
Author: Albert Van der Ziel
Publisher: Wiley-Interscience
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 328
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Book Description
Gives basic and up-to-date information about noise sources in electronic devices. Demonstrates how this information can be used to calculate the noise performance, in particular the noise figure, of electronic circuits using these devices. Optimization procedures, both for the circuits and for the devices, are then devised based on these data. Gives an elementary treatment of thermal noise, diffusion noise, and velocity-fluctuation noise, including quantum effects in thermal noise and maser noise.
Author: Josef Sikula
Publisher: Springer Science & Business Media
ISBN: 9781402021688
Category : Mathematics
Languages : en
Pages : 382
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Book Description
Proceedings of the NATO Advanced Research Workshop, held in Brno, Czech Republic, 14-16 August 2003
Author: Alper Demir
Publisher: Springer Science & Business Media
ISBN: 1461560632
Category : Technology & Engineering
Languages : en
Pages : 278
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Book Description
In electronic circuit and system design, the word noise is used to refer to any undesired excitation on the system. In other contexts, noise is also used to refer to signals or excitations which exhibit chaotic or random behavior. The source of noise can be either internal or external to the system. For instance, the thermal and shot noise generated within integrated circuit devices are in ternal noise sources, and the noise picked up from the environment through electromagnetic interference is an external one. Electromagnetic interference can also occur between different components of the same system. In integrated circuits (Ies), signals in one part of the system can propagate to the other parts of the same system through electromagnetic coupling, power supply lines and the Ie substrate. For instance, in a mixed-signal Ie, the switching activity in the digital parts of the circuit can adversely affect the performance of the analog section of the circuit by traveling through the power supply lines and the substrate. Prediction of the effect of these noise sources on the performance of an electronic system is called noise analysis or noise simulation. A methodology for the noise analysis or simulation of an electronic system usually has the following four components: 2 NOISE IN NONLINEAR ELECTRONIC CIRCUITS • Mathematical representations or models for the noise sources. • Mathematical model or representation for the system that is under the in fluence of the noise sources.
Author: Fabrizio Bonani
Publisher: Springer Science & Business Media
ISBN: 3662045303
Category : Technology & Engineering
Languages : en
Pages : 241
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Book Description
Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.
Author: Gabriel Vasilescu
Publisher: Springer Science & Business Media
ISBN: 3540265104
Category : Technology & Engineering
Languages : en
Pages : 716
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Book Description
Electronic Noise and Interfering Signals is a comprehensive reference book on noise and interference in electronic circuits, with particular focus on low-noise design. The first part of the book deals with mechanisms, modelling, and computation of intrinsic noise which is generated in every electronic device. The second part analyzes the coupling mechanisms which can lead to a contamination of circuits by parasitic signals and provides appropriate solutions to this problem. The last part contains more than 100 practical, elaborate case studies. The book requires no advanced mathematical training as it introduces the fundamental methods. Moreover, it provides insight into computational noise analysis with SPICE and NOF, a software developed by the author. The book addresses designers of electronic circuits as well as researchers from electrical engineering, physics, and material science. It should also be of interest for undergraduate and graduate students.
Author: Sh. Kogan
Publisher: Cambridge University Press
ISBN: 9780521070195
Category : Science
Languages : en
Pages : 376
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Book Description
This book looks at the physics of electronic fluctuations (noise) in solids. The author emphasizes many fundamental experiments that have become classics: physical mechanisms of fluctuations, and the nature and magnitude of noise. He also includes the most comprehensive and complete review of flicker (1/f) noise in the literature. It will be useful to graduate students and researchers in physics and electronic engineering, and especially those carrying out research in the fields of noise phenomena and highly sensitive electronic devices--detectors, electronic devices for low-noise amplifiers, and quantum magnetometers (SQUIDS).
