Nist Measurement Assurance Program for Capacitance Standards at 1 Khz (Classic Reprint) PDF Download
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Author: Y. May Chang
Publisher: Forgotten Books
ISBN: 9780266913702
Category : Business & Economics
Languages : en
Pages : 32
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Book Description
Excerpt from Nist Measurement Assurance Program for Capacitance Standards at 1 Khz Key Words: assigned values; capacitance standards; coverage factor; error analysis; measurement assurance program; transport standard; uncertainties. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Author: Y. May Chang
Publisher: Forgotten Books
ISBN: 9780266913702
Category : Business & Economics
Languages : en
Pages : 32
Get Book
Book Description
Excerpt from Nist Measurement Assurance Program for Capacitance Standards at 1 Khz Key Words: assigned values; capacitance standards; coverage factor; error analysis; measurement assurance program; transport standard; uncertainties. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 400
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Book Description
Author: James F. Schooley
Publisher:
ISBN:
Category :
Languages : en
Pages : 1006
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Book Description
Author: Robert B. Northrop
Publisher: CRC Press
ISBN: 1466596821
Category : Technology & Engineering
Languages : en
Pages : 952
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Book Description
Weighing in on the growth of innovative technologies, the adoption of new standards, and the lack of educational development as it relates to current and emerging applications, the third edition of Introduction to Instrumentation and Measurements uses the authors’ 40 years of teaching experience to expound on the theory, science, and art of modern instrumentation and measurements (I&M). What’s New in This Edition: This edition includes material on modern integrated circuit (IC) and photonic sensors, micro-electro-mechanical (MEM) and nano-electro-mechanical (NEM) sensors, chemical and radiation sensors, signal conditioning, noise, data interfaces, and basic digital signal processing (DSP), and upgrades every chapter with the latest advancements. It contains new material on the designs of micro-electro-mechanical (MEMS) sensors, adds two new chapters on wireless instrumentation and microsensors, and incorporates extensive biomedical examples and problems. Containing 13 chapters, this third edition: Describes sensor dynamics, signal conditioning, and data display and storage Focuses on means of conditioning the analog outputs of various sensors Considers noise and coherent interference in measurements in depth Covers the traditional topics of DC null methods of measurement and AC null measurements Examines Wheatstone and Kelvin bridges and potentiometers Explores the major AC bridges used to measure inductance, Q, capacitance, and D Presents a survey of sensor mechanisms Includes a description and analysis of sensors based on the giant magnetoresistive effect (GMR) and the anisotropic magnetoresistive (AMR) effect Provides a detailed analysis of mechanical gyroscopes, clinometers, and accelerometers Contains the classic means of measuring electrical quantities Examines digital interfaces in measurement systems Defines digital signal conditioning in instrumentation Addresses solid-state chemical microsensors and wireless instrumentation Introduces mechanical microsensors (MEMS and NEMS) Details examples of the design of measurement systems Introduction to Instrumentation and Measurements is written with practicing engineers and scientists in mind, and is intended to be used in a classroom course or as a reference. It is assumed that the reader has taken core EE curriculum courses or their equivalents.
Author: French College of Metrology
Publisher: John Wiley & Sons
ISBN: 1118614941
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
Metrology is an integral part of the structure of today’s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data. Moreover, international trade practices increasingly require institutions to display demonstrated conformity to written standards and specifications. As such, having relevant and reliable results of measurements and tests in compliance with mutually recognised standards can be a technical, commercial and statutory necessity for a company. This book, the results of a working group from the French College of Metrology and featuring chapters written by a range of experts from a variety of European countries, gives a comprehensive and international treatment of the subject. Academics involved in metrology as well as people involved in the metrology capacities of companies and institutions will find this book of great interest.
Author: Edward B. Magrab
Publisher:
ISBN:
Category : Microphone
Languages : en
Pages : 124
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Book Description
Author: Radu Mavrodineanu
Publisher:
ISBN:
Category : Fluorimetry
Languages : en
Pages : 276
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Book Description
Author: Murray W.. Bullis
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 84
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Book Description
Author: Byron Emerson Blair
Publisher:
ISBN:
Category : Atomic frequency standards
Languages : en
Pages : 468
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Book Description
The document is a tutorial Monograph describing various aspects of time and frequency (T/F). Included are chapters relating to elemental concepts of precise time and frequency; basic principles of quartz oscillators and atomic frequency standards; historical review, recent progress, and current status of atomic frequency standards; promising areas for developing future primary frequency standards; relevance of frequency standards to other areas of metrology including a unified standard concept; statistics of T/F data analysis coupled with the theory and construction of the NBS atomic time scale; an overview of T/F dissemination techniques; and the standards of T/F in the USA. The Monograph addresses both the specialist in the field as well as those desiring basic information about time and frequency. The authors trace the development and scope of T/F technology, its improvement over periods of decades, its status today, and its possible use, applications, and development in days to come.
Author: Andrej Rumiantsev
Publisher: Electronic Materials and Devic
ISBN: 9788770221122
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.
