Multiple Scattering Theory for Spectroscopies PDF Download
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Author: Didier Sébilleau
Publisher: Springer
ISBN: 3319738119
Category : Science
Languages : en
Pages : 416
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Book Description
This edited book, based on material presented at the EU Spec Training School on Multiple Scattering Codes and the following MSNano Conference, is divided into two distinct parts. The first part, subtitled “basic knowledge”, provides the basics of the multiple scattering description in spectroscopies, enabling readers to understand the physics behind the various multiple scattering codes available for modelling spectroscopies. The second part, “extended knowledge”, presents “state- of-the-art” short chapters on specific subjects associated with improving of the actual description of spectroscopies within the multiple scattering formalism, such as inelastic processes, or precise examples of modelling.
Author: Didier Sébilleau
Publisher: Springer
ISBN: 3319738119
Category : Science
Languages : en
Pages : 416
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Book Description
This edited book, based on material presented at the EU Spec Training School on Multiple Scattering Codes and the following MSNano Conference, is divided into two distinct parts. The first part, subtitled “basic knowledge”, provides the basics of the multiple scattering description in spectroscopies, enabling readers to understand the physics behind the various multiple scattering codes available for modelling spectroscopies. The second part, “extended knowledge”, presents “state- of-the-art” short chapters on specific subjects associated with improving of the actual description of spectroscopies within the multiple scattering formalism, such as inelastic processes, or precise examples of modelling.
Author: Jeroen A. van Bokhoven
Publisher: John Wiley & Sons
ISBN: 1118844238
Category : Science
Languages : en
Pages : 940
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Book Description
X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x-ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x-ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X-ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X-ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials
Author: Yasuhiro Iwasawa
Publisher: Springer
ISBN: 3319438662
Category : Science
Languages : en
Pages : 545
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Book Description
This book is a comprehensive, theoretical, practical, and thorough guide to XAFS spectroscopy. The book addresses XAFS fundamentals such as experiments, theory and data analysis, advanced XAFS methods such as operando XAFS, time-resolved XAFS, spatially resolved XAFS, total-reflection XAFS, high energy resolution XAFS, and practical applications to a variety of catalysts, nanomaterials and surfaces. This book is accessible to a broad audience in academia and industry, and will be a useful guide for researchers entering the subject and graduate students in a wide variety of disciplines.
Author: Leon Brillouin
Publisher: Courier Corporation
ISBN: 0486497550
Category : Science
Languages : en
Pages : 370
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Book Description
Geared toward upper-level undergraduates and graduate students, this classic resource by a giant of 20th-century mathematics applies principles of information theory to Maxwell's demon, thermodynamics, and measurement problems. 1962 edition.
Author: Grant Bunker
Publisher: Cambridge University Press
ISBN: 1139485091
Category : Science
Languages : en
Pages : 269
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Book Description
X-ray absorption fine structure spectroscopy (XAFS) is a powerful and versatile technique for studying structures of materials in chemistry, physics, biology and other fields. This textbook is a comprehensive, practical guide to carrying out and interpreting XAFS experiments. Assuming only undergraduate-level physics and mathematics, the textbook is ideally suited for graduate students in physics and chemistry starting XAFS-based research. It contains concise executable example programs in Mathematica 7. Supplementary material available at www.cambridge.org/9780521767750 includes Mathematica code from the book, related Mathematica programs, and worked data analysis examples. The textbook addresses experiment, theory, and data analysis, but is not tied to specific data analysis programs or philosophies. This makes it accessible to a broad audience in the sciences, and a useful guide for researchers entering the subject.
Author: Tsun-Kong Sham
Publisher: World Scientific
ISBN: 9789810249786
Category : Science
Languages : en
Pages : 648
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Book Description
Author: Boon K. Teo
Publisher: Springer Science & Business Media
ISBN: 3642500315
Category : Science
Languages : en
Pages : 359
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Book Description
The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners.
Author: Andrea Di Cicco
Publisher: Springer Nature
ISBN: 3030720055
Category : Science
Languages : en
Pages : 239
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Book Description
This book collects several contributions presented at the 2019 meeting of the Italian Synchrotron Radiation Society (SILS), held in Camerino, Italy, from 9 to 11 September 2019. Topics included are recent developments in synchrotron radiation facilities and instrumentation, novel methods for data analysis, applications in the fields of materials physics and chemistry, Earth and environmental science, coherence in x-ray experiments. The book is intended for advanced students and researchers interested in synchrotron-based techniques and their application in diverse fields.
Author: Christopher Chantler
Publisher: John Wiley & Sons
ISBN: 1119433940
Category : Science
Languages : en
Pages : 1090
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Book Description
X-ray absorption spectroscopy and X-ray emission spectroscopy are complementary to crystallographic methods, particularly for materials science and the study of nanostructure and systems with partial disorder and partial local order, including solutions, gases, liquids, glasses and powders. This new volume of International Tables for Crystallography has nine parts and over 150 chapters contributed by a wide range of international experts. Part 1 provides a brief overview and introduction to the background of X-ray absorption spectroscopy (XAS) and experimental facilities. Part 2 discusses the quantum theory of XAS and related approaches. Part 3 describes both standard and advanced experimental methods used in XAS, X-ray emission spectroscopy (XES) and related techniques. Part 4 covers both standard and more advanced pre-processing of data. Part 5 gives an extensive overview of the analysis of experimental data. Part 6 provides details of the major software packages for data collection, reduction and analysis. Part 7 outlines the importance in science, reporting and hypothesis testing of the exchange of input and processed output data, and data deposition. It also presents excerpts of tables of data and supplementary material for XAS, pre-edge studies, X-ray absorption near-edge spectroscopy (XANES) and X-ray absorption fine structure (XAFS) studies. These tables are also available in full as online supporting information. Part 8 explores a wide range of applications of XAS in fields including materials science, physics, chemistry, biology, earth sciences, catalysis and cultural heritage. Part 9 presents definitions of the terms and quantities used, as developed by the International Union of Crystallography's Commission on XAFS. The volume has been written for the worldwide XAS community of thousands of practitioners, beamline scientists, experts and academics, and for the novice user who wishes to know what XAS and XES can do for them and how they may use these techniques for their particular purposes. The volume is therefore intended to be a self-contained, authoritative reference work that can also be used for training, learning or teaching, providing practical guidance for readers of all levels of experience. More information on the volumes in the series International Tables for Crystallography can be found at https://it.iucr.org.
Author: Scott Calvin
Publisher: CRC Press
ISBN: 1439878633
Category : Science
Languages : en
Pages : 459
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Book Description
XAFS for Everyone provides a practical, thorough guide to x-ray absorption fine-structure (XAFS) spectroscopy for both novices and seasoned practitioners from a range of disciplines. The text is enhanced with more than 200 figures as well as cartoon characters who offer informative commentary on the different approaches used in XAFS spectroscopy. The book covers sample preparation, data reduction, tips and tricks for data collection, fingerprinting, linear combination analysis, principal component analysis, and modeling using theoretical standards. It describes both near-edge (XANES) and extended (EXAFS) applications in detail. Examples throughout the text are drawn from diverse areas, including materials science, environmental science, structural biology, catalysis, nanoscience, chemistry, art, and archaeology. In addition, five case studies from the literature demonstrate the use of XAFS principles and analysis in practice. The text includes derivations and sample calculations to foster a deeper comprehension of the results. Whether you are encountering this technique for the first time or looking to hone your craft, this innovative and engaging book gives you insight on implementing XAFS spectroscopy and interpreting XAFS experiments and results. It helps you understand real-world trade-offs and the reasons behind common rules of thumb.
