Author:
Publisher: Elsevier
ISBN: 0081003587
Category : Science
Languages : en
Pages : 636
Book Description
As the requirements of the semiconductor industry have become more demanding in terms of resolution and speed it has been necessary to push photoresist materials far beyond the capabilities previously envisioned. Currently there is significant worldwide research effort in to so called Next Generation Lithography techniques such as EUV lithography and multibeam electron beam lithography. These developments in both the industrial and the academic lithography arenas have led to the proliferation of numerous novel approaches to resist chemistry and ingenious extensions of traditional photopolymers. Currently most texts in this area focus on either lithography with perhaps one or two chapters on resists, or on traditional resist materials with relatively little consideration of new approaches. This book therefore aims to bring together the worlds foremost resist development scientists from the various community to produce in one place a definitive description of the many approaches to lithography fabrication. - Assembles up-to-date information from the world's premier resist chemists and technique development lithographers on the properties and capabilities of the wide range of resist materials currently under investigation - Includes information on processing and metrology techniques - Brings together multiple approaches to litho pattern recording from academia and industry in one place
Materials and Processes for Next Generation Lithography
Author:
Publisher: Elsevier
ISBN: 0081003587
Category : Science
Languages : en
Pages : 636
Book Description
As the requirements of the semiconductor industry have become more demanding in terms of resolution and speed it has been necessary to push photoresist materials far beyond the capabilities previously envisioned. Currently there is significant worldwide research effort in to so called Next Generation Lithography techniques such as EUV lithography and multibeam electron beam lithography. These developments in both the industrial and the academic lithography arenas have led to the proliferation of numerous novel approaches to resist chemistry and ingenious extensions of traditional photopolymers. Currently most texts in this area focus on either lithography with perhaps one or two chapters on resists, or on traditional resist materials with relatively little consideration of new approaches. This book therefore aims to bring together the worlds foremost resist development scientists from the various community to produce in one place a definitive description of the many approaches to lithography fabrication. - Assembles up-to-date information from the world's premier resist chemists and technique development lithographers on the properties and capabilities of the wide range of resist materials currently under investigation - Includes information on processing and metrology techniques - Brings together multiple approaches to litho pattern recording from academia and industry in one place
Publisher: Elsevier
ISBN: 0081003587
Category : Science
Languages : en
Pages : 636
Book Description
As the requirements of the semiconductor industry have become more demanding in terms of resolution and speed it has been necessary to push photoresist materials far beyond the capabilities previously envisioned. Currently there is significant worldwide research effort in to so called Next Generation Lithography techniques such as EUV lithography and multibeam electron beam lithography. These developments in both the industrial and the academic lithography arenas have led to the proliferation of numerous novel approaches to resist chemistry and ingenious extensions of traditional photopolymers. Currently most texts in this area focus on either lithography with perhaps one or two chapters on resists, or on traditional resist materials with relatively little consideration of new approaches. This book therefore aims to bring together the worlds foremost resist development scientists from the various community to produce in one place a definitive description of the many approaches to lithography fabrication. - Assembles up-to-date information from the world's premier resist chemists and technique development lithographers on the properties and capabilities of the wide range of resist materials currently under investigation - Includes information on processing and metrology techniques - Brings together multiple approaches to litho pattern recording from academia and industry in one place
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 892
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 892
Book Description
Directory of Graduate Research
Author: American Chemical Society. Committee on Professional Training
Publisher:
ISBN:
Category : Biochemistry
Languages : en
Pages : 1932
Book Description
Faculties, publications and doctoral theses in departments or divisions of chemistry, chemical engineering, biochemistry and pharmaceutical and/or medicinal chemistry at universities in the United States and Canada.
Publisher:
ISBN:
Category : Biochemistry
Languages : en
Pages : 1932
Book Description
Faculties, publications and doctoral theses in departments or divisions of chemistry, chemical engineering, biochemistry and pharmaceutical and/or medicinal chemistry at universities in the United States and Canada.
Physics Briefs
Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 1244
Book Description
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 1244
Book Description
Dissertation Abstracts International
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 632
Book Description
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 632
Book Description
Advances in Resist Technology and Processing III
Author:
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 360
Book Description
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 360
Book Description
Advances in Resist Technology and Processing
Author:
Publisher:
ISBN:
Category : Photoresists
Languages : en
Pages : 364
Book Description
Publisher:
ISBN:
Category : Photoresists
Languages : en
Pages : 364
Book Description
University of Michigan Official Publication
Author: University of Michigan
Publisher: UM Libraries
ISBN:
Category : Education, Higher
Languages : en
Pages : 448
Book Description
Each number is the catalogue of a specific school or college of the University.
Publisher: UM Libraries
ISBN:
Category : Education, Higher
Languages : en
Pages : 448
Book Description
Each number is the catalogue of a specific school or college of the University.
American Doctoral Dissertations
Author:
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 776
Book Description
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 776
Book Description
Advances in Resist Technology and Processing IV
Author: M. J. Bowden
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description