Low-Temperature Microscopy and Analysis PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Low-Temperature Microscopy and Analysis PDF full book. Access full book title Low-Temperature Microscopy and Analysis by Patrick Echlin. Download full books in PDF and EPUB format.
Author: Patrick Echlin
Publisher: Springer Science & Business Media
ISBN: 1489923020
Category : Science
Languages : en
Pages : 553
Get Book Here
Book Description
The frozen-hydrated specimen is the principal element that unifies the subject of low temperature microscopy, and frozen-hydrated specimens are what this book is all about. Freezing the sample as quickly as possible and then further preparing the specimen for microscopy or microanalysis, whether still embedded in ice or not: there seem to be as many variations on this theme as there are creative scientists with problems of structure and composition to investigate. Yet all share a body of com mon fact and theory upon which their work must be based. Low-Temperature Micros copy and Analysis provides, for the first time, a comprehensive treatment of all the elements to which one needs access. What is the appeal behind the use of frozen-hydrated specimens for biological electron microscopy, and why is it so important that such a book should now have been written? If one cannot observe dynamic events as they are in progress, rapid specimen freezing at least offers the possibility to trap structures, organelles, macro molecules, or ions and other solutes in a form that is identical to what the native structure was like at the moment of trapping. The pursuit of this ideal becomes all the more necessary in electron microscopy because of the enormous increase in resolution that is available with electron-optical instruments, compared to light optical microscopes.
Author: Patrick Echlin
Publisher: Springer Science & Business Media
ISBN: 1489923020
Category : Science
Languages : en
Pages : 553
Get Book Here
Book Description
The frozen-hydrated specimen is the principal element that unifies the subject of low temperature microscopy, and frozen-hydrated specimens are what this book is all about. Freezing the sample as quickly as possible and then further preparing the specimen for microscopy or microanalysis, whether still embedded in ice or not: there seem to be as many variations on this theme as there are creative scientists with problems of structure and composition to investigate. Yet all share a body of com mon fact and theory upon which their work must be based. Low-Temperature Micros copy and Analysis provides, for the first time, a comprehensive treatment of all the elements to which one needs access. What is the appeal behind the use of frozen-hydrated specimens for biological electron microscopy, and why is it so important that such a book should now have been written? If one cannot observe dynamic events as they are in progress, rapid specimen freezing at least offers the possibility to trap structures, organelles, macro molecules, or ions and other solutes in a form that is identical to what the native structure was like at the moment of trapping. The pursuit of this ideal becomes all the more necessary in electron microscopy because of the enormous increase in resolution that is available with electron-optical instruments, compared to light optical microscopes.
Author: Stefan G. Stanciu
Publisher: BoD – Books on Demand
ISBN: 9535125788
Category : Technology & Engineering
Languages : en
Pages : 444
Get Book Here
Book Description
Microscopes represent tools of the utmost importance for a wide range of disciplines. Without them, it would have been impossible to stand where we stand today in terms of understanding the structure and functions of organelles and cells, tissue composition and metabolism, or the causes behind various pathologies and their progression. Our knowledge on basic and advanced materials is also intimately intertwined to the realm of microscopy, and progress in key fields of micro- and nanotechnologies critically depends on high-resolution imaging systems. This volume includes a series of chapters that address highly significant scientific subjects from diverse areas of microscopy and analysis. Authoritative voices in their fields present in this volume their work or review recent trends, concepts, and applications, in a manner that is accessible to a broad readership audience from both within and outside their specialist area.
Author: M. Aindow
Publisher: CRC Press
ISBN: 9780750308120
Category : Science
Languages : en
Pages : 562
Get Book Here
Book Description
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.
Author: Mei Chen
Publisher: Academic Press
ISBN: 0128149736
Category : Computers
Languages : en
Pages : 230
Get Book Here
Book Description
Are you a computer scientist working on image analysis? Are you a biologist seeking tools to process the microscopy data from image-based experiments? Computer Vision for Microscopy Image Analysis provides a comprehensive and in-depth discussion of modern computer vision techniques, in particular deep learning, for microscopy image analysis that will advance your efforts.Progress in imaging techniques has enabled the acquisition of large volumes of microscopy data and made it possible to conduct large-scale, image-based experiments for biomedical discovery. The main challenge and bottleneck in such experiments is the conversion of "big visual data" into interpretable information.Visual analysis of large-scale microscopy data is a daunting task. Computer vision has the potential to automate this task. One key advantage is that computers perform analysis more reproducibly and less subjectively than human annotators. Moreover, high-throughput microscopy calls for effective and efficient techniques as there are not enough human resources to advance science by manual annotation.This book articulates the strong need for biologists and computer vision experts to collaborate to overcome the limits of human visual perception, and devotes a chapter each to the major steps in analyzing microscopy images, such as detection and segmentation, classification, tracking, and event detection. - Discover how computer vision can automate and enhance the human assessment of microscopy images for discovery - Grasp the state-of-the-art approaches, especially deep neural networks - Learn where to obtain open-source datasets and software to jumpstart his or her own investigation
Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 1441972005
Category : Technology & Engineering
Languages : en
Pages : 764
Get Book Here
Book Description
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
Get Book Here
Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: John C. Russ
Publisher: Springer Science & Business Media
ISBN: 1461305632
Category : Science
Languages : en
Pages : 461
Get Book Here
Book Description
The use of computer-based image analysis systems for all kinds of images, but especially for microscope images, has become increasingly widespread in recent years, as computer power has increased and costs have dropped. Software to perform each of the various tasks described in this book exists now, and without doubt additional algorithms to accomplish these same things more efficiently, and to perform new kinds of image processing, feature discrimination and measurement, will continue to be developed. This is likely to be true particularly in the field of three-dimensional imaging, since new microscopy methods are beginning to be used which can produce such data. It is not the intent of this book to train programmers who will assemble their own computer systems and write their own programs. Most users require only the barest of knowledge about how to use the computer, but the greater their understanding of the various image analysis operations which are possible, their advantages and limitations, the greater the likelihood of success in their application. Likewise, the book assumes little in the way of a mathematical background, but the researcher with a secure knowledge of appropriate statistical tests will find it easier to put some of these methods into real use, and have confidence in the results, than one who has less background and experience. Supplementary texts and courses in statistics, microscopy, and specimen preparation are recommended as necessary.
Author: Pietro Ferraro
Publisher: Springer Science & Business Media
ISBN: 3642158137
Category : Science
Languages : en
Pages : 378
Get Book Here
Book Description
This book deals with the latest achievements in the field of optical coherent microscopy. While many other books exist on microscopy and imaging, this book provides a unique resource dedicated solely to this subject. Similarly, many books describe applications of holography, interferometry and speckle to metrology but do not focus on their use for microscopy. The coherent light microscopy reference provided here does not focus on the experimental mechanics of such techniques but instead is meant to provide a users manual to illustrate the strengths and capabilities of developing techniques. The areas of application of this technique are in biomedicine, medicine, life sciences, nanotechnology and materials sciences.
Author: S. J. B. Reed
Publisher: Cambridge University Press
ISBN: 113944638X
Category : Science
Languages : en
Pages : 232
Get Book Here
Book Description
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461344220
Category : Technology & Engineering
Languages : en
Pages : 598
Get Book Here
Book Description
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
