Metrology at the Frontiers of Physics and Technology

Metrology at the Frontiers of Physics and Technology PDF Author: L. Crovini
Publisher: Elsevier
ISBN: 0444597832
Category : Science
Languages : en
Pages : 673

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Book Description
The spectroscopy of trapped ions or laser-cooled atoms offers the prospect of visible frequency standards to match or even exceed the accuracy of the caesium standard. The development of satellite methods for time comparisons has improved by more than an order of magnitude the accuracy with which national laboratories can routinely compare their clocks. Mechanical metrology has not been left behind. Driven by the need to improve manufacturing technology, major advances have taken place in computer control machining and mechanical measuring systems. These, and many other fascinating developments in the field of metrology are presented in this book.

Metrology at the Frontiers of Physics and Technology

Metrology at the Frontiers of Physics and Technology PDF Author: L. Crovini
Publisher: Elsevier
ISBN: 0444597832
Category : Science
Languages : en
Pages : 673

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Book Description
The spectroscopy of trapped ions or laser-cooled atoms offers the prospect of visible frequency standards to match or even exceed the accuracy of the caesium standard. The development of satellite methods for time comparisons has improved by more than an order of magnitude the accuracy with which national laboratories can routinely compare their clocks. Mechanical metrology has not been left behind. Driven by the need to improve manufacturing technology, major advances have taken place in computer control machining and mechanical measuring systems. These, and many other fascinating developments in the field of metrology are presented in this book.

New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science

New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science PDF Author: M.J.T. Milton
Publisher: IOS Press
ISBN: 1643682474
Category : Science
Languages : en
Pages : 480

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Book Description
The use of standard and reliable measurements is essential in many areas of life, but nowhere is it of more crucial importance than in the world of science, and physics in particular. This book contains 20 contributions presented as part of Course 206 of the International School of Physics Enrico Fermi on New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science, held in Varenna, Italy, from 4 -13 July 2019. The Course was the 7th in the Enrico Fermi series devoted to metrology, and followed a milestone in the history of measurement: the adoption of new definitions for the base units of the SI. During the Course, participants reviewed the decision and discussed how the new foundation for metrology is opening new possibilities for physics, with several of the lecturers reflecting on the implications for an easier exploration of the unification of quantum mechanics and gravity. A wide range of other topics were covered, from measuring color and appearance to atomic weights and radiation, and including the application of metrological principles to the management and interpretation of very large sets of scientific data and the application of metrology to biology. The book also contains a selection of posters from the best of those presented by students at the Course. Offering a fascinating exploration of the latest thinking on the subject of metrology, this book will be of interest to researchers and practitioners from many fields.

Frontiers of Manufacturing Science and Measuring Technology III

Frontiers of Manufacturing Science and Measuring Technology III PDF Author: Wen Pei Sung
Publisher: Trans Tech Publications Ltd
ISBN: 3038262277
Category : Technology & Engineering
Languages : en
Pages : 2500

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Book Description
Collection of selected, peer reviewed papers from the 2013 3rd International Conference on Frontiers of Manufacturing Science and Measuring Technology (ICFMM 2013), July 30-31, 2013, LiJiang, China. Volume is indexed by Thomson Reuters CPCI-S (WoS). The 518 papers are grouped as follows: Chapter 1: Practice of Design Engineering and Researches for Industry; Chapter 2: Applied Materials Engineering; Chapter 3: Measuring Technologies, Signal and Data Processing; Chapter 4: Control, Automation, Communication and Information Technologies; Chapter 5: Environmental Engineering, Urban Development, Transportation and Logistics; Chapter 6: Organization of Manufacture and Engineering Management.

Frontiers of Manufacturing Science and Measuring Technology

Frontiers of Manufacturing Science and Measuring Technology PDF Author: Ran Chen
Publisher: Trans Tech Publications Ltd
ISBN: 3038136069
Category : Technology & Engineering
Languages : en
Pages : 1580

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Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This book brings together 288 peer-reviewed papers on Manufacturing Science and Measuring Technology in order to promote the development of those fields, to strengthen international academic cooperation and communications and to exchange research ideas. It provides readers with a broad overview of the latest advances in the field of manufacturing science and measurement technology.

New Frontiers for Metrology: from Biology and Chemistry to Quantum and Data Science

New Frontiers for Metrology: from Biology and Chemistry to Quantum and Data Science PDF Author: M. J. T. Milton
Publisher:
ISBN: 9781643682464
Category :
Languages : en
Pages : 480

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Book Description
The use of standard and reliable measurements is essential in many areas of life, but nowhere is it of more crucial importance than in the world of science, and physics in particular.This book contains 20 contributions presented as part of Course 206 of the International School of Physics Enrico Fermi on New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science, held in Varenna, Italy, from 4 -13 July 2019. The Course was the 7th in the Enrico Fermi series devoted to metrology, and followed a milestone in the history of measurement: the adoption of new definitions for the base units of the SI. During the Course, participants reviewed the decision and discussed how the new foundation for metrology is opening new possibilities for physics, with several of the lecturers reflecting on the implications for an easier exploration of the unification of quantum mechanics and gravity. A wide range of other topics were covered, from measuring color and appearance to atomic weights and radiation, and including the application of metrological principles to the management and interpretation of very large sets of scientific data and the application of metrology to biology. The book also contains a selection of posters from the best of those presented by students at the Course.Offering a fascinating exploration of the latest thinking on the subject of metrology, this book will be of interest to researchers and practitioners from many fields.

Quantum Metrology

Quantum Metrology PDF Author: Ernst O. Göbel
Publisher: John Wiley & Sons
ISBN: 3527412654
Category : Science
Languages : en
Pages : 243

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Book Description
The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.

Frontiers of Manufacturing Science and Measuring Technology IV

Frontiers of Manufacturing Science and Measuring Technology IV PDF Author: Wen Pei Sung
Publisher: Trans Tech Publications Ltd
ISBN: 3038265756
Category : Technology & Engineering
Languages : en
Pages : 2376

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Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Frontiers of Manufacturing Science and Measuring Technology (ICFMM 2014), June 19-20, 2014, Guilin, China. The 487 papers are grouped as follows: Chapter 1: Materials Engineering, Technology and Application, Chapter 2: Applied Mechanics, Design, Simulation and Manufacturing, Chapter 3: Measurement, Monitoring, Control and Testing Technologies, Chapter 4: Communication and Navigation, Information Technologies, Algorithms and Numerical Methods, Image, Video, Signal and Data Processing, Chapter 5: New Technologies in Education and Sports, Chapter 6: Management Engineering, Business and Economics Engineering

Frontiers of Manufacturing Science and Measuring Technology

Frontiers of Manufacturing Science and Measuring Technology PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 465

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Book Description


Recent Advances in Metrology and Fundamental Constants

Recent Advances in Metrology and Fundamental Constants PDF Author: Terry J. Quinn
Publisher: IOS Press
ISBN: 9781586031671
Category : Science
Languages : en
Pages : 886

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Book Description
Over the last decade of the 20th century, many improvements took place in the field of metrology and fundamental constants. These developments and improvements are discussed in this book. The old caesium SI second definition has found a new realization with the fountain approach, replacing the classical thermal atomic beam. The use of cold atom techniques, slowed down and cooled, has opened a number of unexpected avenues for metrology and fundamental constants, one of these possibilities being the atom interferometry. Another development was the demonstration of the possiblility of performing a direct frequency division in the visible, using short femtosecond pulses. Many other developments are also discussed.

Ultra-fast Material Metrology

Ultra-fast Material Metrology PDF Author: Alexander Horn
Publisher: John Wiley & Sons
ISBN: 3527408878
Category : Science
Languages : en
Pages : 223

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Book Description
This book is the first to describe novel measurement techniques of processes during laser-matter interaction using ultra-fast lasers. Targeted at both engineers and physicists, initial chapters address the working tools, the history of laser ultra-fast metrology, an overview of ultra-fast laser sources, and the fundamentals of laser radiation-matter interaction. Ultra-fast laser radiation is discussed in chapter 4, while further chapters describe the methodology of pump and probe in practice, as well as applications for pump and probe metrology in engineering, including spectroscopy and imaging techniques. Chapter 7 describes the perspectives for this new field of research and predicts the metrology of the future, showing new potential applications of laser sources and new detectors in combination with improved pump and probe methods.