Mechanical Properties and Microstructural Characterization of Polycrystalline Silicon Thin Films PDF Download
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Author: Swaminathan Jayaraman
Publisher:
ISBN:
Category :
Languages : en
Pages : 170
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Book Description
Author: Swaminathan Jayaraman
Publisher:
ISBN:
Category :
Languages : en
Pages : 170
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Book Description
Author: Harold J. Frost
Publisher: Materials Research Society
ISBN: 9781558993068
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
This interdisciplinary book brings together researchers from a wide range of scientific fields to offer insights into the nature of polycrystalline thin films. These films have properties that are different from those of a bulk polycrystal and from those of a single crystal film. In particular, the volume focuses on film deposition and processing techniques which allow the fabrication of films with innovative microstructures and technologically relevant properties. The work presented ranges from theoretical studies to technological applications. Topics include: microstructural evolution; interfaces and mechanical properties; characterization of microstructure; hard and refractory films; polycrystalline silicon; electrical properties; optical properties; gas sensors; ferroelectric films; metallization; and magnetic and MEMS applications.
Author: R. K. MacCrone
Publisher: Elsevier
ISBN: 1483218201
Category : Technology & Engineering
Languages : en
Pages : 473
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Book Description
Treatise on Materials Science and Technology, Volume 11: Properties And Microstructure covers the parameters important to understanding microstructural effects. The book discusses the direct observation and characterization of defects in materials; the cause and effect of crystal defects in silicon integrated circuits; as well as the microstructure of some noncrystalline ceramics. The text also describes microstructural defects in the important semiconductors silicon and germanium, microstructural effects in glasses, microstructural effects on the mechanical properties of ceramics, and finally, microstructures in ferrites. Materials scientists, materials engineers, and graduate students taking related courses will find the book invaluable.
Author: Fariborz Maseeh-Tehrani
Publisher:
ISBN:
Category : Microstructure
Languages : en
Pages : 392
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Book Description
Author: Christopher L. Muhlstein
Publisher: ASTM International
ISBN: 0803128894
Category : Gold films
Languages : en
Pages : 333
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Book Description
Recent advances in the mechanical properties of structural films are described in these papers from a November 2000 symposium held in Orlando, Florida. Papers are organized in sections on fracture and fatigue of structural films, elastic behavior and residual stress in thin films, tensile testing of
Author: Brent L. Adams
Publisher: Materials Research Society
ISBN: 9781558993761
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
Thin films are used in virtually every manufacturing and technological area. A large fraction of these films are polycrystalline. Their uses range from critical components in the microelectronics industry, to hard coatings for wear resistance, corrosion resistance and thermal barriers, to magnetic, optical and medical applications. It is essential to the functional properties of these films that the microstructure, composition, architecture and stress state be produced with a high level of control which demands a detailed understanding of the mechanisms which are responsible for the formation of structure in polycrystalline thin films. This book focuses on thin polycrystalline metallic, ceramic and semiconducting films of thicknesses in the range of tens to thousands of nanometers. Topics range from fundamental to technological. Topics include: evolution of texture and microstructure; grain boundaries and interfaces; microstructure, stress and texture; characterization and representation; microstructure, texture and reliability; processing, characterization and application and polycrystalline Si and SiGe films.
Author: S. Lombardo
Publisher:
ISBN:
Category : Microstructure
Languages : en
Pages : 56
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Book Description
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704
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Author: David Brandon
Publisher: John Wiley & Sons
ISBN: 1118681487
Category : Technology & Engineering
Languages : en
Pages : 517
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Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Author: Jay S. Mitchell
Publisher:
ISBN:
Category :
Languages : en
Pages : 254
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Book Description
