Author: Joseph C. Richmond
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 624
Book Description
Measurement of Thermal Radiation Properties of Solids
Author: Joseph C. Richmond
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 624
Book Description
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 624
Book Description
Measurement of Thermal Radiation Properties of Solids
Author:
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 612
Book Description
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 612
Book Description
Measurement of Thermal Radiation of Properties of Solids
Author: Joseph C. Richmond
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 608
Book Description
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 608
Book Description
NBS Technical Note
Author:
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 92
Book Description
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 92
Book Description
Radiative Properties of Semiconductors
Author: N.M. Ravindra
Publisher: Morgan & Claypool Publishers
ISBN: 1681741768
Category : Science
Languages : en
Pages : 160
Book Description
Optical properties, particularly in the infrared range of wavelengths, continue to be of enormous interest to both material scientists and device engineers. The need for the development of standards for data of optical properties in the infrared range of wavelengths is very timely considering the on-going transition of nano-technology from fundamental R&D to manufacturing. Radiative properties play a critical role in the processing, process control and manufacturing of semiconductor materials, devices, circuits and systems. The design and implementation of real-time process control methods in manufacturing requires the knowledge of the radiative properties of materials. Sensors and imagers operate on the basis of the radiative properties of materials. This book reviews the optical properties of various semiconductors in the infrared range of wavelengths. Theoretical and experimental studies of the radiative properties of semiconductors are presented. Previous studies, potential applications and future developments are outlined. In Chapter 1, an introduction to the radiative properties is presented. Examples of instrumentation for measurements of the radiative properties is described in Chapter 2. In Chapters 3-11, case studies of the radiative properties of several semiconductors are elucidated. The modeling and applications of these properties are explained in Chapters 12 and 13, respectively. In Chapter 14, examples of the global infrastructure for these measurements are illustrated.
Publisher: Morgan & Claypool Publishers
ISBN: 1681741768
Category : Science
Languages : en
Pages : 160
Book Description
Optical properties, particularly in the infrared range of wavelengths, continue to be of enormous interest to both material scientists and device engineers. The need for the development of standards for data of optical properties in the infrared range of wavelengths is very timely considering the on-going transition of nano-technology from fundamental R&D to manufacturing. Radiative properties play a critical role in the processing, process control and manufacturing of semiconductor materials, devices, circuits and systems. The design and implementation of real-time process control methods in manufacturing requires the knowledge of the radiative properties of materials. Sensors and imagers operate on the basis of the radiative properties of materials. This book reviews the optical properties of various semiconductors in the infrared range of wavelengths. Theoretical and experimental studies of the radiative properties of semiconductors are presented. Previous studies, potential applications and future developments are outlined. In Chapter 1, an introduction to the radiative properties is presented. Examples of instrumentation for measurements of the radiative properties is described in Chapter 2. In Chapters 3-11, case studies of the radiative properties of several semiconductors are elucidated. The modeling and applications of these properties are explained in Chapters 12 and 13, respectively. In Chapter 14, examples of the global infrastructure for these measurements are illustrated.
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 700
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 700
Book Description
Technical Publications Announcements with Indexes
Author: United States. National Aeronautics and Space Administration
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 796
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 796
Book Description
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1036
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1036
Book Description
Journal of Research of the National Bureau of Standards
Author:
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 624
Book Description
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 624
Book Description
A Peak AC-DC Voltage Comparator for Use in a Standards Laboratory
Author: L A. Marzetta
Publisher:
ISBN:
Category : Electric measurements
Languages : en
Pages : 650
Book Description
Publisher:
ISBN:
Category : Electric measurements
Languages : en
Pages : 650
Book Description