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Author: Jürgen Beyerer
Publisher: Springer
ISBN: 3662477947
Category : Technology & Engineering
Languages : en
Pages : 802
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Book Description
The book offers a thorough introduction to machine vision. It is organized in two parts. The first part covers the image acquisition, which is the crucial component of most automated visual inspection systems. All important methods are described in great detail and are presented with a reasoned structure. The second part deals with the modeling and processing of image signals and pays particular regard to methods, which are relevant for automated visual inspection.
Author: Jürgen Beyerer
Publisher: Springer
ISBN: 3662477947
Category : Technology & Engineering
Languages : en
Pages : 802
Get Book Here
Book Description
The book offers a thorough introduction to machine vision. It is organized in two parts. The first part covers the image acquisition, which is the crucial component of most automated visual inspection systems. All important methods are described in great detail and are presented with a reasoned structure. The second part deals with the modeling and processing of image signals and pays particular regard to methods, which are relevant for automated visual inspection.
Author: Herbert Freeman
Publisher: Elsevier
ISBN: 0323155588
Category : Technology & Engineering
Languages : en
Pages : 333
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Book Description
Machine Vision for Inspection and Measurement contains the proceedings of the Second Annual Workshop on Machine Vision sponsored by the Center for Computer Aids for Industrial Productivity (CAIP) at Rutgers University and held on April 25-26, 1988 in New Brunswick, New Jersey. The papers explore the application of machine vision to inspection and measurement and cover topics such as the problem of object-pose estimation and depth recovery through inverse optics. The use of machine vision techniques in inspection of integrated circuits and semiconductor wafers is also discussed. Comprised of 11 chapters, this book opens with the problem of using fine-grained parallel machines for VLSI inspection. The discussion then turns to a variety of real-life applications of machine vision, including inspection of integrated circuits, semiconductor wafers, TV-tube glass, and mechanical parts. The use of machine vision to measure the curvature of the human cornea for vision correction and contact lens fitting purposes is also considered. The remaining chapters focus on motion estimation from stereo sequences using orthographic-view algorithms; photometric sampling for determining surface shape and reflectance; and efficient depth recovery by means of inverse optics. A chapter addresses the question of whether the industry is ready for machine vision and comes up with some optimistic predictions. This monograph will be of interest to practitioners in the fields of computer science and applied mathematics.
Author: Muthukumaran Malarvel
Publisher: John Wiley & Sons
ISBN: 1119786118
Category : Computers
Languages : en
Pages : 352
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Book Description
Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Now a day's the current research on machine inspection gained more popularity among various researchers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examining while inspection process. This volume 2 covers machine learning-based approaches in MVIS applications and it can be employed to a wide diversity of problems particularly in Non-Destructive testing (NDT), presence/absence detection, defect/fault detection (weld, textile, tiles, wood, etc.), automated vision test & measurement, pattern matching, optical character recognition & verification (OCR/OCV), natural language processing, medical diagnosis, etc. This edited book is designed to address various aspects of recent methodologies, concepts, and research plan out to the readers for giving more depth insights for perusing research on machine vision using machine learning-based approaches.
Author: Mohammadikaji, Mahsa
Publisher: KIT Scientific Publishing
ISBN: 373150989X
Category : Computers
Languages : en
Pages : 238
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Book Description
Author: E. R. Davies
Publisher: Elsevier
ISBN: 0080473245
Category : Computers
Languages : en
Pages : 973
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Book Description
In the last 40 years, machine vision has evolved into a mature field embracing a wide range of applications including surveillance, automated inspection, robot assembly, vehicle guidance, traffic monitoring and control, signature verification, biometric measurement, and analysis of remotely sensed images. While researchers and industry specialists continue to document their work in this area, it has become increasingly difficult for professionals and graduate students to understand the essential theory and practicalities well enough to design their own algorithms and systems. This book directly addresses this need.As in earlier editions, E.R. Davies clearly and systematically presents the basic concepts of the field in highly accessible prose and images, covering essential elements of the theory while emphasizing algorithmic and practical design constraints. In this thoroughly updated edition, he divides the material into horizontal levels of a complete machine vision system. Application case studies demonstrate specific techniques and illustrate key constraints for designing real-world machine vision systems.· Includes solid, accessible coverage of 2-D and 3-D scene analysis.· Offers thorough treatment of the Hough Transform—a key technique for inspection and surveillance.· Brings vital topics and techniques together in an integrated system design approach.· Takes full account of the requirement for real-time processing in real applications.
Author: Sheila Anand
Publisher: CRC Press
ISBN: 100075409X
Category : Computers
Languages : en
Pages : 205
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Book Description
Machine Vision systems combine image processing with industrial automation. One of the primary areas of application of Machine Vision in the Industry is in the area of Quality Control. Machine vision provides fast, economic and reliable inspection that improves quality as well as business productivity. Building machine vision applications is a challenging task as each application is unique, with its own requirements and desired outcome. A Guide to Machine Vision in Quality Control follows a practitioner’s approach to learning machine vision. The book provides guidance on how to build machine vision systems for quality inspections. Practical applications from the Industry have been discussed to provide a good understanding of usage of machine vision for quality control. Real-world case studies have been used to explain the process of building machine vision solutions. The book offers comprehensive coverage of the essential topics, that includes: Introduction to Machine Vision Fundamentals of Digital Images Discussion of various machine vision system components Digital image processing related to quality control Overview of automation The book can be used by students and academics, as well as by industry professionals, to understand the fundamentals of machine vision. Updates to the on-going technological innovations have been provided with a discussion on emerging trends in machine vision and smart factories of the future. Sheila Anand is a PhD graduate and Professor at Rajalakshmi Engineering College, Chennai, India. She has over three decades of experience in teaching, consultancy and research. She has worked in the software industry and has extensive experience in development of software applications and in systems audit of financial, manufacturing and trading organizations. She guides Ph.D. aspirants and many of her research scholars have since been awarded their doctoral degree. She has published many papers in national and international journals and is a reviewer for several journals of repute. L Priya is a PhD graduate working as Associate Professor and Head, Department of Information Technology at Rajalakshmi Engineering College, Chennai, India. She has nearly two decades of teaching experience and good exposure to consultancy and research. She has delivered many invited talks, presented papers and won several paper awards in International Conferences. She has published several papers in International journals and is a reviewer for SCI indexed journals. Her areas of interest include Machine Vision, Wireless Communication and Machine Learning.
Author: Carsten Steger
Publisher: John Wiley & Sons
ISBN: 3527413650
Category : Science
Languages : en
Pages : 533
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Book Description
The second edition of this successful machine vision textbook is completely updated, revised and expanded by 35% to reflect the developments of recent years in the fields of image acquisition, machine vision algorithms and applications. The new content includes, but is not limited to, a discussion of new camera and image acquisition interfaces, 3D sensors and technologies, 3D reconstruction, 3D object recognition and state-of-the-art classification algorithms. The authors retain their balanced approach with sufficient coverage of the theory and a strong focus on applications. All examples are based on the latest version of the machine vision software HALCON 13.
Author: Sergiyenko, Oleg
Publisher: IGI Global
ISBN: 179986524X
Category : Computers
Languages : en
Pages : 346
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Book Description
The research and exploitation of optoelectronic properties in the industrial branch of electronics is becoming more popular each day due to the important role they play in the development of a large variety of sensors, devices, and systems for identifying, measuring, and constructing. While optoelectronics study the applications of electronic devices that source, detect, and transform light, machine vision generates and detects light in order to provide imaging-based automatic inspections and analysis for such applications as automatic object and environmental inspection, process control, and robot/mobile machine guidance in industry. Machine vision is less efficient without optoelectronics, and thus, it is important to investigate the theoretical approaches to different optoelectronic devices available for machine vision as well as current scanning technologies. Examining Optoelectronics in Machine Vision and Applications in Industry 4.0 focuses on the examination of emerging technologies for the design, fabrication, and implementation of optoelectronic sensors, devices, and systems in a machine vision approach to support industrial, commercial, and scientific applications. The book covers topics such as the design, fabrication, and implementation of sensors and devices as well as the development viewpoint of optoelectronic systems and artificial vision techniques using optoelectronic devices. The interaction and informational communication between all these mentioned devices in the complex solution of the same task is the subject of modern challenges in Industry 4.0. Thus, this book supports engineers, technology developers, academicians, researchers, and students who seek machine vision techniques for detection, measurement, and 3D reconstruction.
Author: Kye-Si Kwon
Publisher: John Wiley & Sons
ISBN: 3527684115
Category : Computers
Languages : en
Pages : 290
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Book Description
For both students and engineers in R&D, this book explains machine vision in a concise, hands-on way, using the Vision Development Module of the LabView software by National Instruments. Following a short introduction to the basics of machine vision and the technical procedures of image acquisition, the book goes on to guide readers in the use of the various software functions of LabView's machine vision module. It covers typical machine vision tasks, including particle analysis, edge detection, pattern and shape matching, dimension measurements as well as optical character recognition, enabling readers to quickly and efficiently use these functions for their own machine vision applications. A discussion of the concepts involved in programming the Vision Development Module rounds off the book, while example problems and exercises are included for training purposes as well as to further explain the concept of machine vision. With its step-by-step guide and clear structure, this is an essential reference for beginners and experienced researchers alike.
Author: J. Paulo Davim
Publisher: Springer
ISBN: 303003822X
Category : Technology & Engineering
Languages : en
Pages : 159
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Book Description
This book presents the research advances in the science of measurement, giving special focus to the field of machining and tribology. Topics such as dimensional metrology, precision measurements, industrial metrology, accuracy and precision in measurement are covered. Also theoretical aspects such as modelling and simulation are highlighted.
