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Author: Jeroen Walter Gerard Wildöer
Publisher:
ISBN: 9789090095738
Category :
Languages : en
Pages : 107
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Book Description
Zsfassung in niederländ. Sprache.
Author: Jeroen Walter Gerard Wildöer
Publisher:
ISBN: 9789090095738
Category :
Languages : en
Pages : 107
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Book Description
Zsfassung in niederländ. Sprache.
Author: Jörg Rychen
Publisher:
ISBN:
Category :
Languages : en
Pages : 91
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Book Description
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3642254136
Category : Science
Languages : en
Pages : 634
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Book Description
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author: Kentwell Lee McCormick
Publisher:
ISBN:
Category :
Languages : en
Pages : 296
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Book Description
Author: Seizo Morita
Publisher: Springer Science & Business Media
ISBN: 364201495X
Category : Technology & Engineering
Languages : en
Pages : 410
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Book Description
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
The authors present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1 pm could successfully be resolved. In addition, lateral drifts rates of below 15 pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.
Author: Scott Alan Elrod
Publisher:
ISBN:
Category :
Languages : en
Pages : 336
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Book Description
Author: Baird Bankovic
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Book Description
Scanning tunneling microscopy is a technique that enables the study of the surfaces of materials with sub-nanometer resolution. A scanning tunneling microscope (STM) gives local electronic information about the surface and is an invaluable analysis technique in modern condensed matter physics. The goal of my project was to restore an existing low temperature STM which had fallen into disrepair. This thesis outlines the restoration process, along with a description of the supporting techniques that were necessary. In parallel with the restoration process, I also developed an automated tungsten tip fabricator for making atomically sharp tips for the STM. This is an original design that I have shared on an open source website. Additionally, I explored the use of a low temperature transimpedance preamplifier that would improve the performance of our STM and tested a number of operational amplifiers that could be used to this end.
Author: Joseph A. Stroscio
Publisher: Academic Press
ISBN: 1483292878
Category : Science
Languages : en
Pages : 481
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Book Description
Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.
Author: Timo Kandra
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Book Description
