Author: Sheldon Tan
Publisher: Springer Nature
ISBN: 3030261727
Category : Technology & Engineering
Languages : en
Pages : 487
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Book Description
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.
Author: Ricardo Reis
Publisher: Springer
ISBN: 1461440785
Category : Technology & Engineering
Languages : en
Pages : 271
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Book Description
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 0080556809
Category : Technology & Engineering
Languages : en
Pages : 893
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Book Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1904
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Book Description
Author: Alfons Schuster
Publisher: Springer Science & Business Media
ISBN: 1848002610
Category : Computers
Languages : en
Pages : 297
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Book Description
Our time recognizes robustness as an important, all-pervading feature in the world around us. Despite its omnipresence, robustness is not entirely understood, rather dif?cult to de?ne, and, despite its obvious value in many situations, rather dif?cult to achieve. One of the goals of this edited book is to report on the topic of robustness from a variety and diverse range of ?elds and perspectives. We are interested, for instance, in fundamental strategies nature applies to make systems robust—and arguably “intelligent”—and how these strategies may hold as general design principles in modern technology. A particular focus is on computer-based systems and appli- tions. This in mind, the book has four main sections: Part I has a look at robustness in terms of underlying technologies and infrastr- tures upon which many computer-based “intelligent” systems reside and inves- gates robustness on the hardware and software level, but also in larger environments such as the Internet and self-managing systems. The contributions in Part II target robustness in research areas that are inspired by biology, including brain-computer interfaces, biological networks, and biological immune systems, for example. Part III involves the exciting ?eld of arti?cial intelligence. The chapters here discuss the value of robustness as a general design principle for arti?cial intelligence, stressing its potential in areas such as humanoid robotics and image processing.
Author: Ming-Bo Lin
Publisher: CRC Press
ISBN: 143986859X
Category : Technology & Engineering
Languages : en
Pages : 917
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Book Description
With the advance of semiconductors and ubiquitous computing, the use of system-on-a-chip (SoC) has become an essential technique to reduce product cost. With this progress and continuous reduction of feature sizes, and the development of very large-scale integration (VLSI) circuits, addressing the harder problems requires fundamental understanding of circuit and layout design issues. Furthermore, engineers can often develop their physical intuition to estimate the behavior of circuits rapidly without relying predominantly on computer-aided design (CAD) tools. Introduction to VLSI Systems: A Logic, Circuit, and System Perspective addresses the need for teaching such a topic in terms of a logic, circuit, and system design perspective. To achieve the above-mentioned goals, this classroom-tested book focuses on: Implementing a digital system as a full-custom integrated circuit Switch logic design and useful paradigms that may apply to various static and dynamic logic families The fabrication and layout designs of complementary metal-oxide-semiconductor (CMOS) VLSI Important issues of modern CMOS processes, including deep submicron devices, circuit optimization, interconnect modeling and optimization, signal integrity, power integrity, clocking and timing, power dissipation, and electrostatic discharge (ESD) Introduction to VLSI Systems builds an understanding of integrated circuits from the bottom up, paying much attention to logic circuit, layout, and system designs. Armed with these tools, readers can not only comprehensively understand the features and limitations of modern VLSI technologies, but also have enough background to adapt to this ever-changing field.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 804
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Book Description
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540012184
Category : Technology & Engineering
Languages : en
Pages : 1232
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Book Description
This major work has established itself as the definitive reference in the nanoscience and nanotechnology area in one volume. In presents nanostructures, micro/nanofabrication, and micro/nanodevices. Special emphasis is on scanning probe microscopy, nanotribology and nanomechanics, molecularly thick films, industrial applications and microdevice reliability, and on social aspects. Reflecting further developments, the new edition has grown from six to eight parts. The latest information is added to fields such as bionanotechnology, nanorobotics, and NEMS/MEMS reliability. This classic reference book is orchestrated by a highly experienced editor and written by a team of distinguished experts for those learning about the field of nanotechnology.
Author: Harry Veendrick
Publisher: Springer Nature
ISBN: 303164249X
Category :
Languages : en
Pages : 697
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Book Description
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 850
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Book Description
