Author: Michel Renovell
Publisher: IEEE
ISBN: 9780769514536
Category : Computers
Languages : en
Pages : 517
Book Description
This volume originates from the 2002 International Workshop on Electronic Design, Test and Applications examines computer hardware design and testing, and is aimed at researchers, professors, practitioners and students.
International Workshop on Electronic Design, Test and Applications
Author: Michel Renovell
Publisher: IEEE
ISBN: 9780769514536
Category : Computers
Languages : en
Pages : 517
Book Description
This volume originates from the 2002 International Workshop on Electronic Design, Test and Applications examines computer hardware design and testing, and is aimed at researchers, professors, practitioners and students.
Publisher: IEEE
ISBN: 9780769514536
Category : Computers
Languages : en
Pages : 517
Book Description
This volume originates from the 2002 International Workshop on Electronic Design, Test and Applications examines computer hardware design and testing, and is aimed at researchers, professors, practitioners and students.
Third IEEE International Workshop on Electronic Design, Test and Applications
Author:
Publisher:
ISBN: 9781509094479
Category : Electronic book
Languages : en
Pages : 521
Book Description
Publisher:
ISBN: 9781509094479
Category : Electronic book
Languages : en
Pages : 521
Book Description
International Workshop on Electronic Design, Test and Applications
Author: Michel Renovell
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769514536
Category : Computers
Languages : en
Pages : 540
Book Description
Annotation A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR.
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769514536
Category : Computers
Languages : en
Pages : 540
Book Description
Annotation A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR.
2010 IEEE 5th International Workshop on Electronic Design, Test and Application
Author: IEEE Staff
Publisher:
ISBN: 9781424460250
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9781424460250
Category :
Languages : en
Pages :
Book Description
2011 Sixth IEEE International Symposium on Electronic Design, Test and Application 17.01-19.01.2011
Author:
Publisher:
ISBN: 9780769543062
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9780769543062
Category :
Languages : en
Pages :
Book Description
2008 IEEE International Workshop on Electronic Design, Test and Application (Delta)
Author: IEEE Staff
Publisher: IEEE
ISBN: 9781424430918
Category : Technology & Engineering
Languages : en
Pages : 610
Book Description
Publisher: IEEE
ISBN: 9781424430918
Category : Technology & Engineering
Languages : en
Pages : 610
Book Description
2002 Electronic Design Test and Applictns(Delta W
Author: IEEE Computer Society
Publisher: IEEE
ISBN: 9780769514543
Category : Computers
Languages : en
Pages : 536
Book Description
Publisher: IEEE
ISBN: 9780769514543
Category : Computers
Languages : en
Pages : 536
Book Description
Third IEEE International Workshop on Electronic Design, Test and Applications
Author: Patrick Girard
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Proceedings First IEEE International Workshop on Electronic Design, Test and Applications 2002
Author:
Publisher:
ISBN:
Category : Electronic books
Languages : en
Pages : 141
Book Description
Publisher:
ISBN:
Category : Electronic books
Languages : en
Pages : 141
Book Description
Proceedings
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 517
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 517
Book Description