IEEE Std 539-2005 (Revision of IEEE Std 539-1990) PDF Download
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Category : Electronic books
Languages : en
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Author:
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Category : Electronic books
Languages : en
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ISBN: 9780738146867
Category :
Languages : en
Pages : 0
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Author: Costas N. Georghiades
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 240
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Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Author: Amir Pnueli
Publisher: Springer
ISBN: 3642114865
Category : Computers
Languages : en
Pages : 437
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Book Description
This volume contains the ?nal proceedings of the 7th International Andrei Ershov Memorial Conference on Perspectives of System Informatics Akad- gorodok (Novosibirsk, Russia), June 15–19, 2009. PSI is a forum for academic and industrial researchers, developers and users working on topics relating to computer, software and information sciences. The conference serves to bridge the gaps between di?erent communities whose - searchareasarecoveredbybutnotlimitedtofoundationsofprogramandsystem development and analysis, programming methodology and softwareengineering, and information technologies. PSI 2009 was dedicated to the memory of a prominent scientist, academician Andrei Ershov (1931–1988),and to a signi?cant date in the history of computer science in the country, namely, the 50th anniversary of the Programming - partment founded by Andrei Ershov. Initially, the department was a part of the Institute of Mathematics and later, in 1964, it joined the newly established Computing Center of the Siberian Branch of the USSR Academy of Sciences. Andrei Ershov, who was responsible for forming the department, gathered a team of young graduates from leading Soviet universities. The ?rst signi?cant project of the department was aimed at the development of ALPHA system, an optimizing compiler for an extension of Algol 60 implemented on a Soviet c- puterM-20. Later,theresearchersofthedepartmentcreatedtheAlgibr,Epsilon, Sigma, and Alpha-6 programming systems for the BESM-6 computers. The list of their achievements also includes the ?rst Soviet time-sharing system AIST-0, the multi-language system BETA, research projects in arti?cial intelligence and parallel programming, integrated tools for text processing and publishing, and many others.
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ISBN: 9780738148502
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Languages : en
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Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9781504419970
Category :
Languages : en
Pages :
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Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780738149325
Category : Electric power-plants
Languages : en
Pages : 300
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Book Description
This recommended practice provides short-circuit current information including calculated short-circuit current duties for the application in industrial plants and commercial buildings, at all power system voltages, of power system equipment that senses, carries, or interrupts short-circuit currents.
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
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Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author: Warren Sack
Publisher: MIT Press
ISBN: 0262039702
Category : Computers
Languages : en
Pages : 401
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Book Description
An alternative history of software that places the liberal arts at the very center of software's evolution. In The Software Arts, Warren Sack offers an alternative history of computing that places the arts at the very center of software's evolution. Tracing the origins of software to eighteenth-century French encyclopedists' step-by-step descriptions of how things were made in the workshops of artists and artisans, Sack shows that programming languages are the offspring of an effort to describe the mechanical arts in the language of the liberal arts. Sack offers a reading of the texts of computing—code, algorithms, and technical papers—that emphasizes continuity between prose and programs. He translates concepts and categories from the liberal and mechanical arts—including logic, rhetoric, grammar, learning, algorithm, language, and simulation—into terms of computer science and then considers their further translation into popular culture, where they circulate as forms of digital life. He considers, among other topics, the “arithmetization” of knowledge that presaged digitization; today's multitude of logics; the history of demonstration, from deduction to newer forms of persuasion; and the post-Chomsky absence of meaning in grammar. With The Software Arts, Sack invites artists and humanists to see how their ideas are at the root of software and invites computer scientists to envision themselves as artists and humanists.
Author: David M. Pozar
Publisher: John Wiley & Sons
ISBN: 0470631554
Category : Technology & Engineering
Languages : en
Pages : 752
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Book Description
Pozar's new edition of Microwave Engineering includes more material on active circuits, noise, nonlinear effects, and wireless systems. Chapters on noise and nonlinear distortion, and active devices have been added along with the coverage of noise and more material on intermodulation distortion and related nonlinear effects. On active devices, there's more updated material on bipolar junction and field effect transistors. New and updated material on wireless communications systems, including link budget, link margin, digital modulation methods, and bit error rates is also part of the new edition. Other new material includes a section on transients on transmission lines, the theory of power waves, a discussion of higher order modes and frequency effects for microstrip line, and a discussion of how to determine unloaded.
