Hierarchical Test Generation for Digital Circuits Represented by Decision Diagrams PDF Download
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Author: Jaan Raik
Publisher:
ISBN: 9789985592496
Category : Decision trees
Languages : en
Pages : 108
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Book Description
Author: Jaan Raik
Publisher:
ISBN: 9789985592496
Category : Decision trees
Languages : en
Pages : 108
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 702
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Book Description
Author: David Jin
Publisher: Springer Science & Business Media
ISBN: 3642315283
Category : Technology & Engineering
Languages : en
Pages : 526
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Book Description
This book includes the volume 3 of the proceedings of the 2012 International Conference on Mechanical and Electronic Engineering(ICMEE2012), held at June 23-24,2012 in Hefei, China. The conference provided a rare opportunity to bring together worldwide researchers who are working in the fields. This volume 3 is focusing on Electronic Engineering and Electronic Communication; Electronic Engineering and Electronic Image Processing.
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 550
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Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author: Louis Scheffer
Publisher: CRC Press
ISBN: 1351837591
Category : Technology & Engineering
Languages : en
Pages : 593
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Book Description
Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 88
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Book Description
Author: Ton J. Mouthaan
Publisher: Springer Science & Business Media
ISBN: 9401151105
Category : Technology & Engineering
Languages : en
Pages : 299
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Book Description
Dear participant in the second European Workshop on Microelectronics Education, It is a pleasure to present you the Proceedings of the Second European Workshop on Microelectronics Education and to welcome you at the Workshop. The Organising Committee is very pleased that it has found several key persons, with highly appreciated levels of knowledge and expertise, willing to present Invited Contributions to this Workshop. We have striven for an interesting spread over important areas like the expected demands for educated engineers in the wide field of Microelectronics, and Microsystems, in European industry (and beyond!) and innovations in method and focus of our educational programmes. This is the second European Workshop in this area; the first one was held in Grenoble in France in the spring of 1996. It was the initiative of Georges Kamarinos, Nadine Guillemot and Bernard Courtois to organise this Workshop because they felt that Microelectronics was 'at a turning point' to become the core of the largest industry in the world and that this warranted a serious (re-)consideration of our educational imperatives. It is now two years since and their feeling has become reality: nobody doubts that by the year 2000 the microelecnonics industry will be the largest industrial sector. It is also obvious that because of that and because of the predicted shortfall of educated engineers we must continuously reconsider the quality of our educational approach.
Author: Management Association, Information Resources
Publisher: IGI Global
ISBN: 1466620390
Category : Technology & Engineering
Languages : en
Pages : 2281
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Book Description
Developments in technologies have evolved in a much wider use of technology throughout science, government, and business; resulting in the expansion of geographic information systems. GIS is the academic study and practice of presenting geographical data through a system designed to capture, store, analyze, and manage geographic information. Geographic Information Systems: Concepts, Methodologies, Tools, and Applications is a collection of knowledge on the latest advancements and research of geographic information systems. This book aims to be useful for academics and practitioners involved in geographical data.
Author: Klaus Echtle
Publisher: Springer Science & Business Media
ISBN: 9783540584261
Category : Computers
Languages : en
Pages : 642
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Book Description
This book presents the proceedings of the First European Dependable Computing Conference (EDCC-1), held in Berlin, Germany, in October 1994. EDCC is the merger of two former European events on dependable computing. The volume comprises 34 refereed full papers selected from 106 submissions. The contributions address all current aspects of dependable computing and reflect the state of the art in dependable systems research and advanced applications; among the topics covered are hardware and software reliability, safety-critical and secure systems, fault-tolerance and detection, verification and validation, formal methods, hardware and software testing, and parallel and distributed systems.
Author: Matteo Sonza Reorda
Publisher: Springer Science & Business Media
ISBN: 1846281458
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
