Functional and Pattern Sensitive Fault Testing Algorithms for Semiconductor Random Access Memories PDF Download
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Author: Dong Sung Suk
Publisher:
ISBN:
Category : Algorithms
Languages : en
Pages : 178
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Book Description
Author: Dong Sung Suk
Publisher:
ISBN:
Category : Algorithms
Languages : en
Pages : 178
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Book Description
Author: Samiha Mourad
Publisher: John Wiley & Sons
ISBN: 9780471319313
Category : Technology & Engineering
Languages : en
Pages : 444
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Book Description
A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references
Author: Ireneusz Mrozek
Publisher: Springer
ISBN: 3319912046
Category : Technology & Engineering
Languages : en
Pages : 142
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Book Description
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Author: G. Russell
Publisher: Springer Science & Business Media
ISBN: 9780747600015
Category : Computers
Languages : en
Pages : 406
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Book Description
Author: A. J. van de Goor
Publisher: John Wiley & Sons
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 542
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Book Description
Comprehensive coverage of memory test problems at chip, array and board level is provided in this book. For each of these test levels a class of fault models is introduced along with tests for these models. The author also presents algorithms of relevant fault models, together with proofs of their correctness. Special attention is given to why a fault model belongs to a particular class and why it is of interest. A software package, suitable for use on IBM PCs and compatibles, is also available which consists of a set of memory test programs and a simulation package demonstrating how the algorithms are executed and the relationship of the algorithm with the memory
Author: M. Bushnell
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1460
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Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: K.-E. Grosspietsch
Publisher: Springer Science & Business Media
ISBN: 3642696988
Category : Computers
Languages : en
Pages : 444
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Book Description
In the last decade of Computer Science development, we can observe a growing interest in fault-tolerant computing. This interest is the result of a rising number of appl'ications where reliable operation of computing systems is an essential requirement. Besides basic research in the field of fault-tolerant computing, there is an increasing num ber of systems especially designed to achieve fault-tolerance. It is the objective of this conference to offer a survey of present research and development activities in these areas. The second GI/NTG/GM~ Conference on Fault-Tolerant Computing Systems has had a preparatory time of about two years. In March 1982, the first GI conference concerning fault-tolerant computing systems was held in Munich. One of the results of the conference was to bring an organiza tional framework to the FTC community in Germany. This led to the founding of the common interest group "Fault-Tolerant Computing Systems" of the Gesellschaft fur Informatik (GI), the Nachrichtentechnische Gesellschaft (NTG), and the Gesellschaft fur MeB- und Regelungstechnik (VDI/VDE-GMR) in November 1982. At that time, it was also decided to schedule a biannual conference on fault-tolerant computing systems. One of the goals of this second conference is to strengthen the relations with the international FTC community; thus, the call for papers was extended not only to German-speaking countries, but to other countries as well.
Author:
Publisher:
ISBN:
Category : Electronic data processing
Languages : en
Pages : 468
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Book Description
Author: Stanley Leonard Hurst
Publisher: IET
ISBN: 9780852969014
Category : Computers
Languages : en
Pages : 560
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Book Description
Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
