Fifth International Symposium on Control of Semiconductor Interfaces PDF Download
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Author: Yukio Yasuda
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages :
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Author: Yukio Yasuda
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages :
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Author: Junichi Murota
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Junichi Murota
Publisher:
ISBN:
Category :
Languages : en
Pages : 279
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Author: Junichi Murota
Publisher:
ISBN:
Category :
Languages : en
Pages : 280
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Author:
Publisher:
ISBN:
Category :
Languages : un
Pages :
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Author: M. Cahay
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 712
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Book Description
Author: Iwao Ohdomari
Publisher: Elsevier Publishing Company
ISBN: 9780444818898
Category : Science
Languages : en
Pages : 583
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Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in...
Author: Jerzy Rużyłło
Publisher: The Electrochemical Society
ISBN: 9781566771887
Category : Technology & Engineering
Languages : en
Pages : 668
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Author: I. Ohdomari
Publisher: Elsevier
ISBN: 1483290484
Category : Science
Languages : en
Pages : 600
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Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization including STM and SR techniques, single ion implementation, self-organization crystal growth, in situ measurements for process control and extremely high-spatial resolution analysis techniques, are also included. Furthermore it bridges the macroscopic, mesoscopic, and atomic-scale regimes of semicondutor interfaces, describing the state of the art in forming, controlling and characterizating unique semiconductor interfaces, which will be of practical importance in advanced devices. Intended for both technologists who require an up-to-date assessment of methods for interface formation, processing and characterization, and solid state researchers who desire the latest developments in understanding the basic mechanisms of interface physics, chemistry and electronics, this book will be a welcome addition to the existing literature.
Author: ISCSI. 2, 1996, Karuizawa
Publisher:
ISBN:
Category :
Languages : en
Pages : 856
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