Author: G. M. Johnson
Publisher:
ISBN:
Category :
Languages : en
Pages : 318
Book Description
The results of an extensive life test matrix demonstrated the general validity and effectiveness of accelerated tests of microcircuits using both temperature and voltage as accelerating stresses. Over 2500 microcircuits from TTL, CMOS and linear technologies were life tested at ambient temperatures between 125C and 285C. In general, bimodal failure distributions, comprised of early (Freak) and late (main) lognormal distributions, were observed. The relationship of median life with junction temperature could be represented with an Arrehenius reaction rate model. Activation energies for the freak distribution ranged from 0.7 eV to 1.3 eV, and in certain instances a short high temperature burn-in to eliminate the freak population results in a dramatic improvement in use-temperature failure rates. Complete high temperature microcircuit life characterization and lot acceptance tests are required to identify economically screenable lots. MIL-STD-883 test methods are proposed for general application of microcircuit high temperature accelerated tests as a new tool for assuring the reliability of semiconductor production lots, and for screening out potential surface related failures. Included in the proposed methods are guidelines for assuring test effectiveness. The inherent effectiveness of accelerated tests can only be assured through careful selection of the life-test circuit configuration, and test temperatures, and the effective analysis of the resulting failure data.
Evaluation of Microcircuit Accelerated Test Techniques
Author: G. M. Johnson
Publisher:
ISBN:
Category :
Languages : en
Pages : 318
Book Description
The results of an extensive life test matrix demonstrated the general validity and effectiveness of accelerated tests of microcircuits using both temperature and voltage as accelerating stresses. Over 2500 microcircuits from TTL, CMOS and linear technologies were life tested at ambient temperatures between 125C and 285C. In general, bimodal failure distributions, comprised of early (Freak) and late (main) lognormal distributions, were observed. The relationship of median life with junction temperature could be represented with an Arrehenius reaction rate model. Activation energies for the freak distribution ranged from 0.7 eV to 1.3 eV, and in certain instances a short high temperature burn-in to eliminate the freak population results in a dramatic improvement in use-temperature failure rates. Complete high temperature microcircuit life characterization and lot acceptance tests are required to identify economically screenable lots. MIL-STD-883 test methods are proposed for general application of microcircuit high temperature accelerated tests as a new tool for assuring the reliability of semiconductor production lots, and for screening out potential surface related failures. Included in the proposed methods are guidelines for assuring test effectiveness. The inherent effectiveness of accelerated tests can only be assured through careful selection of the life-test circuit configuration, and test temperatures, and the effective analysis of the resulting failure data.
Publisher:
ISBN:
Category :
Languages : en
Pages : 318
Book Description
The results of an extensive life test matrix demonstrated the general validity and effectiveness of accelerated tests of microcircuits using both temperature and voltage as accelerating stresses. Over 2500 microcircuits from TTL, CMOS and linear technologies were life tested at ambient temperatures between 125C and 285C. In general, bimodal failure distributions, comprised of early (Freak) and late (main) lognormal distributions, were observed. The relationship of median life with junction temperature could be represented with an Arrehenius reaction rate model. Activation energies for the freak distribution ranged from 0.7 eV to 1.3 eV, and in certain instances a short high temperature burn-in to eliminate the freak population results in a dramatic improvement in use-temperature failure rates. Complete high temperature microcircuit life characterization and lot acceptance tests are required to identify economically screenable lots. MIL-STD-883 test methods are proposed for general application of microcircuit high temperature accelerated tests as a new tool for assuring the reliability of semiconductor production lots, and for screening out potential surface related failures. Included in the proposed methods are guidelines for assuring test effectiveness. The inherent effectiveness of accelerated tests can only be assured through careful selection of the life-test circuit configuration, and test temperatures, and the effective analysis of the resulting failure data.
Microcircuit Reliability Bibliography
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 412
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 412
Book Description
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 994
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 994
Book Description
Microcircuit Screening Effectiveness
Author: Henry C. Rickers
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 120
Book Description
This information is utilized to determine efficiency factors of individual screens/tests and is combined with cost information to assess screening effectiveness and to provide the proper guidance in determining the optimal screening program for any specific situation. (Author).
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 120
Book Description
This information is utilized to determine efficiency factors of individual screens/tests and is combined with cost information to assess screening effectiveness and to provide the proper guidance in determining the optimal screening program for any specific situation. (Author).
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1372
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1372
Book Description
Large Scale Integrated Circuits Technology: State of the Art and Prospects
Author: Leo Esaki
Publisher: Springer Science & Business Media
ISBN: 9400976453
Category : Technology & Engineering
Languages : en
Pages : 745
Book Description
A NATO Advanced Study Institute on "Large Scale Integrated Circuits Technology: State of the Art and Prospects" was held at Ettore Majorana Centre for Scientific Culture, Erice (Italy) on July 15-27, 1981, the first course of the International School of Solid-State Device Research. This volume contains the School Proceedings: fundamentals as well as up-to-date information on each subject presented by qualified authors. The material covered in this volume has been arranged in self-consistent chapters. Therefore, the Proceedings may be used as a suitable textbook or authoritative review for research workers and advanced students in the relevant field. The nascent information society is based on advanced technologies which will revolutionize human abilities to manipulate and communicate information. One of the most important underpinnings for developing such an information society lies in innovations in semiconductor microelectronics. Such innova tions, indeed, are dramatically reducing the cost of transmitting, storing, and processing information with improved performance, ushering in an era charac terized by large scale integration -the subject of this book.
Publisher: Springer Science & Business Media
ISBN: 9400976453
Category : Technology & Engineering
Languages : en
Pages : 745
Book Description
A NATO Advanced Study Institute on "Large Scale Integrated Circuits Technology: State of the Art and Prospects" was held at Ettore Majorana Centre for Scientific Culture, Erice (Italy) on July 15-27, 1981, the first course of the International School of Solid-State Device Research. This volume contains the School Proceedings: fundamentals as well as up-to-date information on each subject presented by qualified authors. The material covered in this volume has been arranged in self-consistent chapters. Therefore, the Proceedings may be used as a suitable textbook or authoritative review for research workers and advanced students in the relevant field. The nascent information society is based on advanced technologies which will revolutionize human abilities to manipulate and communicate information. One of the most important underpinnings for developing such an information society lies in innovations in semiconductor microelectronics. Such innova tions, indeed, are dramatically reducing the cost of transmitting, storing, and processing information with improved performance, ushering in an era charac terized by large scale integration -the subject of this book.
Reliability Abstracts and Technical Reviews
Author:
Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 556
Book Description
Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 556
Book Description
Government Reports Announcements & Index
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 798
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 798
Book Description
Government reports annual index
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 1196
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 1196
Book Description
Corrosion Abstracts
Author:
Publisher:
ISBN:
Category : Corrosion and anti-corrosives
Languages : en
Pages : 564
Book Description
Publisher:
ISBN:
Category : Corrosion and anti-corrosives
Languages : en
Pages : 564
Book Description