Enhancing Test Effectiveness of Analog Circuits PDF Download
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Author: Rosco Anthony Newsom
Publisher:
ISBN:
Category :
Languages : en
Pages : 36
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Book Description
Author: Rosco Anthony Newsom
Publisher:
ISBN:
Category :
Languages : en
Pages : 36
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Book Description
Author: Electronic Device Failure Analysis Society
Publisher: ASM International
ISBN: 1615030891
Category : Technology & Engineering
Languages : en
Pages : 524
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Book Description
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 528
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Book Description
Author: Fakhfakh, Mourad
Publisher: IGI Global
ISBN: 1466666285
Category : Technology & Engineering
Languages : en
Pages : 488
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Book Description
Improving the performance of existing technologies has always been a focal practice in the development of computational systems. However, as circuitry is becoming more complex, conventional techniques are becoming outdated and new research methodologies are being implemented by designers. Performance Optimization Techniques in Analog, Mix-Signal, and Radio-Frequency Circuit Design features recent advances in the engineering of integrated systems with prominence placed on methods for maximizing the functionality of these systems. This book emphasizes prospective trends in the field and is an essential reference source for researchers, practitioners, engineers, and technology designers interested in emerging research and techniques in the performance optimization of different circuit designs.
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458
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Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Author: Pradip K. Chande
Publisher: Allied Publishers
ISBN: 9788170235125
Category : Automation
Languages : en
Pages : 836
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Book Description
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 448
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Book Description
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769506135
Category : Computers
Languages : en
Pages : 528
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Book Description
Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Author: Michel Renovell
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769514536
Category : Computers
Languages : en
Pages : 540
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Book Description
Annotation A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR.
Author: Ieee
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769521343
Category : Technology & Engineering
Languages : en
Pages : 468
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Book Description
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
