Enhancement of the Deposition Processes of Cu(In, Ga)Se2 and Cds Thin Films Via In-situ and Ex-situ Measurements for Solar Cell Application PDF Download

Author: Vikash Ranjan
Publisher:
ISBN:
Category : Solar cells
Languages : en
Pages : 164

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Book Description
Thin films of Cu(In, Ga)Se2 deposited by 1-stage, 2-stage and 3-stage co-evaporation processes result into the highest efficiency solar cells. Controlling the rate and sequences of individual sources during these co-evaporation processes are important for better quality Cu(In, Ga)Se2 absorber layers. At the same time, spectroscopic ellipsometry due to its ex-situ as well as in-situ application is considered as a very powerful tool to understand the material properties as well as to monitor the process. Nevertheless, spectroscopic ellipsometry was not properly utilized until now to characterize Cu(In, Ga)Se2 thin films. In this study, one of our goal is to understand the optical and electrical properties of Cu(In, Ga)Se2 as a function of process and composition. In the first part of this study, we implemented ex-situ spectroscopic ellipsometry (SE) along with other characterization techniques like Secondary ion mass spectroscopy (SIMS), Scanning electron microscopy (SEM), Auger electron spectroscopy (AES), x-ray diffraction (XRD), atomic force microscopy (AFM) etc. to compare Cu(In, Ga)Se2 thin films deposited by the above mentioned three co-evaporation processes. During this study, we were able to use SE to find the thickness, roughness, band gap, Ga grading of the Cu(In, Ga)Se2 deposited by 2-stage and 3-stage process. Finding of SE were correlated by SIMS, AES, SEM etc. In the case of Cu(In, Ga)Se2 deposited by 1-stage process, due to the high surface roughness, we are not able to implement the ex-situ spectroscopic ellipsometry. In the second and third part of this study, real time spectroscopic ellipsometry is implemented to study the material properties of Cu(In, Ga)Se2 thin films as a function of Cu and Ga concentration. Effectively, in a 3-stage co-evaporation process, the composition of the film changes during the process. To monitor and control the composition of Cu(In, Ga)Se2 during the 3-stage process by in-situ ellipsometry, it was necessary to understand the optical properties of Cu(In, Ga)Se2 as a function of Cu atomic percentage (at.%) as well as Ga at.%. Along with this, the inability to implement ex-situ SE for Cu(In, Ga)Se2 thin film motivated us to implement the spectroscopic ellipsometry in real time i.e. during the growth of the film. This in-situ real time application of SE helped us in understanding the micostructural evolution and dependence of the band gap with the Cu atomic percentage (at.%) as well as the Ga at.%. We also used this opportunity to understand the shift in the critical points as a function of temperature for CuInSe2 alloys. Characterization like AES, XRD, AFM etc were performed after the growth at room temperature to corroborate the RTSE findings. In the fourth and last part of this study, the growth of CdS on a Cu(In, Ga)Se2 surface as a function of time was studied using SE as well as AFM. We also used this opportunity to compare the growth of CdS on another substrate (SiO2). Spectroscopic ellipsometry and AFM revealed a quantum confinement effect in the case of CdS on SiO2 whereas no such effect was observed for CdS on Cu(In, Ga)Se2 surface due to the growth of compact CdS layers.