Encyclopedia of Scanning Electron Microscopy PDF Download
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Author: Lisa Page
Publisher:
ISBN: 9781632381668
Category :
Languages : en
Pages : 0
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Book Description
This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. This book includes contributions by renowned researchers and experts in this field.
Author: Lisa Page
Publisher:
ISBN: 9781632381668
Category :
Languages : en
Pages : 0
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Book Description
This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. This book includes contributions by renowned researchers and experts in this field.
Author: Charles A. Evans
Publisher: Gulf Professional Publishing
ISBN: 9780750691680
Category : Science
Languages : en
Pages : 784
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Book Description
"This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.
Author: Mark Armitage
Publisher: iUniverse
ISBN: 0595492983
Category : Fiction
Languages : en
Pages : 72
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Book Description
Electron microscopes operate in an unworldly vacuum and with an electron beam generated by many tens of thousands of volts. Similarly, when I become a Christian, I am invited to operate in an otherworldly environment, and with the energy generated by the Creator of the universe.
Author: P.W. Hawkes
Publisher: Springer Science & Business Media
ISBN: 3642815162
Category : Science
Languages : en
Pages : 474
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Book Description
No single volume has been entirely devoted to the properties of magnetic lenses, so far as I am aware, although of course all the numerous textbooks on electron optics devote space to them. The absence of such a volume, bringing together in formation about the theory and practical design of these lenses, is surprising, for their introduction some fifty years ago has created an entirely new family of commercial instruments, ranging from the now traditional transmission electron microscope, through the reflection and transmission scanning microscopes, to co lumns for micromachining and microlithography, not to mention the host of experi mental devices not available commercially. It therefore seemed useful to prepare an account of the various aspects of mag netic lens studies. These divide naturally into the five chapters of this book: the theoretical background, in which the optical behaviour is described and formu lae given for the various aberration coefficients; numerical methods for calculat ing the field distribution and trajectory tracing; extensive discussion of the paraxial optical properties and aberration coefficients of practical lenses, il lustrated with curves from which numerical information can be obtained; a comple mentary account of the practical, engineering aspects of lens design, including permanent magnet lenses and the various types of superconducting lenses; and final ly, an up-to-date survey of several kinds of highly unconventional magnetic lens, which may well change the appearance of future electron optical instruments very considerably after they cease to be unconventional.
Author: Sandra L. Olsen
Publisher: BAR International Series
ISBN: 9780860545798
Category : Archaeology
Languages : en
Pages : 408
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Book Description
Rasterelektronenmikroskopie - Methodik.
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
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Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: P.W. Hawkes
Publisher: Springer Science & Business Media
ISBN: 0387497625
Category : Technology & Engineering
Languages : en
Pages : 1336
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Book Description
This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.
Author: Goerg H. Michler
Publisher: Springer Science & Business Media
ISBN: 3540363521
Category : Technology & Engineering
Languages : en
Pages : 472
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Book Description
The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book. The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Author: Allan S. Gilbert
Publisher: Springer
ISBN: 9789400748279
Category : Social Science
Languages : en
Pages : 0
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Book Description
Geoarchaeology is the archaeological subfield that focuses on archaeological information retrieval and problem solving utilizing the methods of geological investigation. Archaeological recovery and analysis are already geoarchaeological in the most fundamental sense because buried remains are contained within and removed from an essentially geological context. Yet geoarchaeological research goes beyond this simple relationship and attempts to build collaborative links between specialists in archaeology and the earth sciences to produce new knowledge about past human behavior using the technical information and methods of the geosciences. The principal goals of geoarchaeology lie in understanding the relationships between humans and their environment. These goals include (1) how cultures adjust to their ecosystem through time, (2) what earth science factors were related to the evolutionary emergence of humankind, and (3) which methodological tools involving analysis of sediments and landforms, documentation and explanation of change in buried materials, and measurement of time will allow access to new aspects of the past. This encyclopedia defines terms, introduces problems, describes techniques, and discusses theory and strategy, all in a format designed to make specialized details accessible to the public as well as practitioners. It covers subjects in environmental archaeology, dating, materials analysis, and paleoecology, all of which represent different sources of specialist knowledge that must be shared in order to reconstruct, analyze, and explain the record of the human past. It will not specifically cover sites, civilizations, and ancient cultures, etc., that are better described in other encyclopedias of world archaeology. The Editor Allan S. Gilbert is Professor of Anthropology at Fordham University in the Bronx, New York. He holds a B.A. from Rutgers University, and his M.A., M.Phil., and Ph.D. were earned at Columbia University. His areas of research interest include the Near East (late prehistory and early historic periods) as well as the Middle Atlantic region of the U.S. (historical archaeology). His specializations are in archaeozoology of the Near East and geoarchaeology, especially mineralogy and compositional analysis of pottery and building materials. Publications have covered a range of subjects, including ancient pastoralism, faunal quantification, skeletal microanatomy, brick geochemistry, and two co-edited volumes on the marine geology and geoarchaeology of the Black Sea basin.
Author: S. Amelinckx
Publisher: John Wiley & Sons
ISBN: 3527614559
Category : Technology & Engineering
Languages : en
Pages : 527
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Book Description
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
