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Author: Maria Losurdo
Publisher: Springer Science & Business Media
ISBN: 3642339565
Category : Technology & Engineering
Languages : en
Pages : 740
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Book Description
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Author: Maria Losurdo
Publisher: Springer Science & Business Media
ISBN: 3642339565
Category : Technology & Engineering
Languages : en
Pages : 740
Get Book
Book Description
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Author: Jai Singh
Publisher: John Wiley & Sons
ISBN: 111950631X
Category : Science
Languages : en
Pages : 667
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Book Description
Provides a semi-quantitative approach to recent developments in the study of optical properties of condensed matter systems Featuring contributions by noted experts in the field of electronic and optoelectronic materials and photonics, this book looks at the optical properties of materials as well as their physical processes and various classes. Taking a semi-quantitative approach to the subject, it presents a summary of the basic concepts, reviews recent developments in the study of optical properties of materials and offers many examples and applications. Optical Properties of Materials and Their Applications, 2nd Edition starts by identifying the processes that should be described in detail and follows with the relevant classes of materials. In addition to featuring four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry, the book covers: optical properties of disordered condensed matter and glasses; concept of excitons; photoluminescence, photoinduced changes, and electroluminescence in noncrystalline semiconductors; and photoinduced bond breaking and volume change in chalcogenide glasses. Also included are chapters on: nonlinear optical properties of photonic glasses; kinetics of the persistent photoconductivity in crystalline III-V semiconductors; and transparent white OLEDs. In addition, readers will learn about excitonic processes in quantum wells; optoelectronic properties and applications of quantum dots; and more. Covers all of the fundamentals and applications of optical properties of materials Includes theory, experimental techniques, and current and developing applications Includes four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry Appropriate for materials scientists, chemists, physicists and electrical engineers involved in development of electronic materials Written by internationally respected professionals working in physics and electrical engineering departments and government laboratories Optical Properties of Materials and Their Applications, 2nd Edition is an ideal book for senior undergraduate and postgraduate students, and teaching and research professionals in the fields of physics, chemistry, chemical engineering, materials science, and materials engineering.
Author: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
ISBN: 9780470060186
Category : Technology & Engineering
Languages : en
Pages : 388
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Book Description
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Author: Harland G. Tompkins
Publisher: Momentum Press
ISBN: 1606507281
Category : Technology & Engineering
Languages : en
Pages : 178
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Book Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Author: Alain Diebold
Publisher: Springer Nature
ISBN: 3030803236
Category : Technology & Engineering
Languages : en
Pages : 495
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Book Description
This book covers the optical and electrical properties of nanoscale materials with an emphasis on how new and unique material properties result from the special nature of their electronic band structure. Beginning with a review of the optical and solid state physics needed for understanding optical and electrical properties, the book then introduces the electronic band structure of solids and discusses the effect of spin orbit coupling on the valence band, which is critical for understanding the optical properties of most nanoscale materials. Excitonic effects and excitons are also presented along with their effect on optical absorption. 2D materials, such as graphene and transition metal dichalcogenides, are host to unique electrical properties resulting from the electronic band structure. This book devotes significant attention to the optical and electrical properties of 2D and topological materials with an emphasis on optical measurements, electrical characterization of carrier transport, and a discussion of the electronic band structures using a tight binding approach. This book succinctly compiles useful fundamental and practical information from one of the fastest growing research topics in materials science and is thus an essential compendium for both students and researchers in this rapidly moving field.
Author: Guillaume Baffou
Publisher: Cambridge University Press
ISBN: 1108307868
Category : Science
Languages : en
Pages : 310
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Book Description
Plasmonics is an important branch of optics concerned with the interaction of metals with light. Under appropriate illumination, metal nanoparticles can exhibit enhanced light absorption, becoming nanosources of heat that can be precisely controlled. This book provides an overview of the exciting new field of thermoplasmonics and a detailed discussion of its theoretical underpinning in nanophotonics. This topic has developed rapidly in the last decade, and is now a highly-active area of research due to countless applications in nanoengineering and nanomedicine. These important applications include photothermal cancer therapy, drug and gene delivery, nanochemistry and photothermal imaging. This timely and self-contained text is suited to all researchers and graduate students working in plasmonics, nano-optics and thermal-induced processes at the nanoscale.
Author: Matthew M. Hawkeye
Publisher: John Wiley & Sons
ISBN: 1118847334
Category : Technology & Engineering
Languages : en
Pages : 435
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Book Description
This book provides a highly practical treatment of Glancing Angle Deposition (GLAD), a thin film fabrication technology optimized to produce precise nanostructures from a wide range of materials. GLAD provides an elegant method for fabricating arrays of nanoscale helices, chevrons, columns, and other porous thin film architectures using physical vapour deposition processes such as sputtering or evaporation. The book gathers existing procedures, methodologies, and experimental designs into a single, cohesive volume which will be useful both as a ready reference for those in the field and as a definitive guide for those entering it. It covers: Development and description of GLAD techniques for nanostructuring thin films Properties and characterization of nanohelices, nanoposts, and other porous films Design and engineering of optical GLAD films including fabrication and testing, and chiral films Post-deposition processing and integration to optimize film behaviour and structure Deposition systems and requirements for GLAD fabrication A patent survey, extensive relevant literature, and a survey of GLAD's wide range of material properties and diverse applications.
Author: Karsten Hinrichs
Publisher: Springer Science & Business Media
ISBN: 3642401287
Category : Science
Languages : en
Pages : 369
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Book Description
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Author: Dale A. Stirling
Publisher: CRC Press
ISBN: 1351617230
Category : Science
Languages : en
Pages : 202
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Book Description
Nanotechnology is changing the world in a very big way, but at the atomic and sub-atomic level. Although the roots of nanotechnology can be traced back to more than a century ago, the last three decades have witnessed an explosion of nano-based technologies and products. This reference work examines the history, current status, and future directions of nanotechnology through an exhaustive search of the technical and scientific literature. The more than 4000 bibliographic citations it includes are carefully organized into core subject areas, and a geographic and subject index allows readers to quickly locate documents of interest. Although a sense of the global reach and interest in nanotechnology can be gleaned from the reference sections of countless journal articles, conference papers, and books, this is the only reference work providing an in-depth global perspective that is ready-made for nanotechnology professionals and those interested in learning more about all things nanotechnology. Despite the abundance of online resources, there is still an urgent need for well-researched, well-presented, concise, and thematically organized reference works. Instead of relying on wiki pages, citation aggregators, and related websites, the author searched the databases and databanks of scholarly literature search providers such as EBSCO, ProQuest, PUBMED, STN International, and Thomson Reuters. In addition, he used select serials-related databases to account for pertinent documents from countries in which English is not the primary national language (i.e., China Online Journals, e-periodica, J-STAGE, and SciELO Brazil among others).
Author: Faquir C Jain
Publisher: World Scientific
ISBN: 9811227268
Category : Technology & Engineering
Languages : en
Pages : 152
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Book Description
This volume on Nanotechnology in Electronics, Photonics, Biosensors, and Emerging Technologies comprises research papers spanning from novel materials and devices, biosensors and bio-nano-systems, artificial intelligence, robotics and emerging technologies, to applications in each of these fields. These include blockchain improving security; ultra-sensitive Point of Care biosensor for detecting pathogeneses and detection of RNA-Virus infections; and advanced materials and devices such as ROM for anti-reverse engineering, FPGA bit-stream encryption, switching transients in memristors, and high-speed multi-bit logic and memories. Applications such as 3D-4D inkjet-printed wireless ultra-broadband modules for IOT, smarttag, and smart city applications are also included. In the area of material synthesis, carbon nanotube synthesis, III-nitride film growth via plasma-enhanced atomic layer deposition are noted. Threading dislocation behavior in InGaAs/GaAs (001) superlattice buffer layers brings a novel approach.Papers presented in this volume cover various aspects of high performance materials and devices for implementing high-speed electronic systems. This volume will serve as a useful reference for recent developments in nanotechnology.
