Applied Electron Spectroscopy for Chemical Analysis PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Applied Electron Spectroscopy for Chemical Analysis PDF full book. Access full book title Applied Electron Spectroscopy for Chemical Analysis by Hassan Windawi. Download full books in PDF and EPUB format.
Author: Hassan Windawi
Publisher: John Wiley & Sons
ISBN:
Category : Electron spectroscopy
Languages : en
Pages : 238
Get Book Here
Book Description
Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.
Author: Hassan Windawi
Publisher: John Wiley & Sons
ISBN:
Category : Electron spectroscopy
Languages : en
Pages : 238
Get Book Here
Book Description
Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.
Author: Tery L. Barr
Publisher: CRC Press
ISBN: 100014240X
Category : Science
Languages : en
Pages : 376
Get Book Here
Book Description
Modern ESCA: The Principles and Practice of X-Ray Photoelectron Spectroscopy is a unique text/reference that focuses on the branch of electron spectroscopy generally labeled as either Electron Spectroscopy for Chemical Analysis (ESCA) or X-ray Photoelectron Spectroscopy (XPS). The book emphasizes the use of core level and valence band binding energies, their shifts, and line widths. It describes the background, present status, and possible future uses of a number of recently developed branches of ESCA, including:
Author: John G. Dillard
Publisher:
ISBN:
Category : Air
Languages : en
Pages : 90
Get Book Here
Book Description
Author: A. D. Baker
Publisher: Elsevier
ISBN: 1483152367
Category : Science
Languages : en
Pages : 193
Get Book Here
Book Description
Photoelectron Spectroscopy provides an introduction to the principles of photoelectron spectroscopy, including its applications in structural and analytical chemistry. It deals with both X-ray and UV-photoelectron spectroscopy. This book begins with the basic principles of electron spectroscopy and describes the UV photoelectron spectrometers and X-ray photoelectron spectrometers. It then lists several factors influencing the appearance of the photoelectron spectra. This book concludes by describing other forms of electron spectroscopy and photoelectron techniques. Students and chemists who are looking for a readable introduction to photoelectron spectroscopy will find this book useful.
Author: Jerry Nelson Black
Publisher:
ISBN:
Category : Chemistry, Analytic
Languages : en
Pages : 58
Get Book Here
Book Description
Author: Thomas Carlson
Publisher: Springer Science & Business Media
ISBN: 1475701187
Category : Science
Languages : en
Pages : 427
Get Book Here
Book Description
In 1970 when I first seriously contemplated writing a book on electron spectroscopy, I recognized the impossibility of completely reaching my desired goals. First, the field was expanding (and still is) at such a rate that a definitive statement of the subject is not possible. The act of following the literature comprehensively and summarizing its essential content proved to be a diver gent series. On the other hand, the field has increased to such a size that violent changes in its basic makeup no longer occur with the frequency that was present in its early days. Furthermore, the excitement of electron spectro scopy lies in its many-faceted interrelationships. In the era of specialization, electron spectroscopy is an open-ended subject continually bringing together new aspects of science. I wished to discuss not just one type of electron spectro scopy, but as many as would be possible. The book as it stands concentrates its attention on x-ray photoelectron spectroscopy, but also presents the basis of Auger electron spectroscopy and uv photoelectron spectroscopy, as well as mentioning many of the other branches of the field. A large, many-author volume might be an answer to some of these problems. However, though anyone person possesses only a limited amount of expertise, I have always enjoyed books by a single author since what they lack in detailed knowledge they gain in a unified viewpoint. I hope the final product, though limited in its attainment of these goals, will still be of some merit.
Author: Kai Siegbahn
Publisher:
ISBN:
Category :
Languages : en
Pages : 200
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 282
Get Book Here
Book Description
Author: C. R. Brundle
Publisher: Mittal Publications
ISBN: 9788170998259
Category : Electron spectroscopy
Languages : en
Pages : 274
Get Book Here
Book Description
Author: Siegfried Hofmann
Publisher: Springer Science & Business Media
ISBN: 3642273815
Category : Science
Languages : en
Pages : 545
Get Book Here
Book Description
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
