Early Papers on Diffraction of X-rays by Crystals PDF Download
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Author: J.M. Bijvoet
Publisher: Springer Science & Business Media
ISBN: 1461568781
Category : Technology & Engineering
Languages : en
Pages : 493
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Book Description
In the Preface to Early Papers on Diffraction of X-rays by Crystals Volume I (containing Chapters I-V and published in 1969), the history and planning of the complete book were outlined. The publication in two separate and consecutive volumes was merely a matter of management; the compilation of both volumes was done at the same time. There is a distinct difference in subject-matter between both volumes: Volume I contains the fundamentals of the theory, while Volume II treats the practical development of the 'trial' -method and the genesis and first applications of the Fourier method. In the period covered by Early Papers (1912-1935), the trial method leads to the successful conquest of structures with up to a hundred parameters. We conclude the book with Patterson's discovery (1934) of the p2-series as described in his second, more detailed and extended paper of 1935. With this method the apparatus was completed which led to the present undreamt-of successes of the Fourier method in the field of organic chemistry. We have considered the inclusion of Robertson's famous synthesis of the structure of phtalocyanine (1936). However, we decided that its proper place would be at the beginning of a book which, no doubt, will appear one day, describing this later period. Considerations of space caused us to give up the chapter on Texture planned at first.
Author: J.M. Bijvoet
Publisher: Springer Science & Business Media
ISBN: 1461568781
Category : Technology & Engineering
Languages : en
Pages : 493
Get Book Here
Book Description
In the Preface to Early Papers on Diffraction of X-rays by Crystals Volume I (containing Chapters I-V and published in 1969), the history and planning of the complete book were outlined. The publication in two separate and consecutive volumes was merely a matter of management; the compilation of both volumes was done at the same time. There is a distinct difference in subject-matter between both volumes: Volume I contains the fundamentals of the theory, while Volume II treats the practical development of the 'trial' -method and the genesis and first applications of the Fourier method. In the period covered by Early Papers (1912-1935), the trial method leads to the successful conquest of structures with up to a hundred parameters. We conclude the book with Patterson's discovery (1934) of the p2-series as described in his second, more detailed and extended paper of 1935. With this method the apparatus was completed which led to the present undreamt-of successes of the Fourier method in the field of organic chemistry. We have considered the inclusion of Robertson's famous synthesis of the structure of phtalocyanine (1936). However, we decided that its proper place would be at the beginning of a book which, no doubt, will appear one day, describing this later period. Considerations of space caused us to give up the chapter on Texture planned at first.
Author: Myeongkyu Lee
Publisher: CRC Press
ISBN: 1315361973
Category : Science
Languages : en
Pages : 302
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Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Leonid V. Azároff
Publisher: McGraw-Hill Companies
ISBN:
Category : Science
Languages : en
Pages : 686
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Book Description
Author: René Guinebretière
Publisher: John Wiley & Sons
ISBN: 1118613953
Category : Technology & Engineering
Languages : en
Pages : 290
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Book Description
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Author: William Henry Bragg
Publisher:
ISBN:
Category : Crystallography
Languages : en
Pages : 364
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Book Description
Author: Mikhail A. Krivoglaz
Publisher: Springer Science & Business Media
ISBN: 3642742912
Category : Science
Languages : en
Pages : 483
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Book Description
Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter ing of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first mono graph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two volume monograph published in Russian in 1983-84 (this edition is the revised translation of the latter).
Author: Michael M. Woolfson
Publisher: Cambridge University Press
ISBN: 9780521423595
Category : Medical
Languages : en
Pages : 422
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Book Description
A textbook for the student beginning a serious study of X-ray crystallography.
Author: Bernard D. Cullity
Publisher: Pearson
ISBN: 9781292040547
Category : X-ray crystallography
Languages : en
Pages : 656
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Book Description
Designed for Junior/Senior undergraduate courses. This revision of a classical text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The text is a collection of principles and methods designed directly for the student and not a reference tool for the advanced reader
Author: Shih-Lin Chang
Publisher: Springer Science & Business Media
ISBN: 9783540211969
Category : Science
Languages : en
Pages : 458
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Book Description
This comprehensive text describes the fundamentals of X-ray multiple-wave interaction in crystals and its applications in condensed matter physics and crystallography. It covers current theoretical approaches and application methods for many materials, including macromolecular crystals, thin films, semiconductors, quasicrystals and nonlinear optical materials. X-ray optics is also addressed. Designed primarily as a reference for researchers in condensed matter, crystallography, materials science, and synchrotron-related topics, the book will also be useful as a textbook for graduate and senior-year undergraduate courses on special topics in X-ray diffraction.
Author: Yoshio Waseda
Publisher: Springer Science & Business Media
ISBN: 3642166350
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
