Determination of Nuclear Decay Schemes by the Coincidence Method PDF Download
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Author: James Arthur Cooley
Publisher:
ISBN:
Category :
Languages : en
Pages : 168
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Author: James Arthur Cooley
Publisher:
ISBN:
Category :
Languages : en
Pages : 168
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Author: John Patrick Lonergan
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Donald G. Gardner
Publisher:
ISBN:
Category : Coincidence circuits
Languages : en
Pages : 10
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In the analysis of nuclear decay schemes, where half-lives in the order of minutes or less are involved and where multi-channel pulse height analyzers are not available, some type of photographic technique is generally used to obtain coincidence information. Of the several photographic methods described in the literature, one method requires the use of a motion picture camera while other require specially modified oscilliscopes. All require additional circuitry of varying complexity. The method described here requires a minimum of additional circuitry, is simple to construct and to operate, and is easily adaptable to Gray Wedge analysis.
Author: William W. Pratt
Publisher:
ISBN:
Category : Beta ray spectrometry
Languages : en
Pages : 94
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The use of a beta-ray spectrometer, in the analysis of nuclear decay schemes, makes possible the solution of many of the problems which arise in the course of such analyses. Of particular interest is the application of the instrument to the determination of the energy of beta and gamma-radiation from radioactive isotopes. In addition, it is possible to use the instrument to estimate the relative intensities of the various components of radiation; and to apply the coincidence method, in conjunction with the spectrometer, to the determination of the order in which these components are emitted from the nucleus. The present work was concerned with three particular problems arising in beta-ray spectrometry. A method of improving the intensity-resolution relationship of a thin lens magnetic beta-ray spectrometer, by means of ring focusing, was investigated. The existence of a ring-shaped constriction in the electron beam was demonstrated experimentally by a photographic film method. A theoretical analysis was carried out in an attempt to determine relations from which the relative intensities of beta-rays, gamma-rays and internal conversion electrons might be determined from data obtained with the spectrometer. Simplifying assumptions were made concerning the focusing action of the instrument, and effects due to scattering of electrons in the source of photoelectric radiator were neglected. Formulae were derived from which the observed spectrometer counting rates due to sources of known activity, emitting beta-rays, gamma-rays or internal conversion electrons may be predicted.
Author: John Peter Unik
Publisher:
ISBN:
Category : Radioactive decay
Languages : en
Pages : 110
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Author:
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ISBN:
Category :
Languages : en
Pages :
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The decay schemes of the isomers of Tc/sup 95/ and Tc/sup 97/ were studied by using high-resolution conversionelectron spectrographs, gamma-ray scintillation detectors, and coincidence techniques. The half life of the 74.6- kev excited state in Np/sup 239/ was measured by the delayed coincidence technique as 1.2 plus or minus 0.1 m mu scc. The directional correlations of two gamma-ray cascades following the beta decay of U/sup 237/ to Np/sup 237/ were studied and the results were found to be consistent with previous assignments of the total angular momenta of the excited states. An upper limit on the half life of the 332-kev excited state in Np/sup 237/ was determined to be 1.0 M mu sec. Electron-electron coincidence measurements were performed on the beta decay of Pa/ sup 233/. The transmission of one-half of the original electron-electron coincidence spectrometer was increased by a factor of six without sacrificing resolution. This increased transmission was achieved by converting the original thin-lens magnetic field to a thick-lens triangular magnetic field. (auth).
Author: George I. Coats
Publisher:
ISBN:
Category : Coincidence circuits
Languages : en
Pages : 48
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Author: J. Adam
Publisher:
ISBN:
Category :
Languages : en
Pages : 34
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Author: Jan Lindskog
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ISBN:
Category :
Languages : sv
Pages : 8
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Author: Doug Reilly
Publisher:
ISBN: 9780160327247
Category : Non-destructive testing
Languages : en
Pages : 700
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