Design of a novel ultra-high vacuum scanning tunneling microscope and application in the identification of the facet planes of TiO2(001) rutile PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Design of a novel ultra-high vacuum scanning tunneling microscope and application in the identification of the facet planes of TiO2(001) rutile PDF full book. Access full book title Design of a novel ultra-high vacuum scanning tunneling microscope and application in the identification of the facet planes of TiO2(001) rutile by Gregory Ernest Poirier. Download full books in PDF and EPUB format.
Author: Gregory Ernest Poirier
Publisher:
ISBN:
Category : Scanning electron microscopes
Languages : en
Pages : 288
Get Book Here
Book Description
Author: Gregory Ernest Poirier
Publisher:
ISBN:
Category : Scanning electron microscopes
Languages : en
Pages : 288
Get Book Here
Book Description
Author: Scott K. Lewis
Publisher:
ISBN:
Category :
Languages : en
Pages : 194
Get Book Here
Book Description
Author: Ashley R. Gans-Forrest
Publisher:
ISBN:
Category :
Languages : en
Pages : 61
Get Book Here
Book Description
Author: Fredrik Owman
Publisher:
ISBN: 9789178711895
Category :
Languages : en
Pages : 194
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author: Robert S. Kilbourn
Publisher:
ISBN:
Category : Nanoelectronics
Languages : en
Pages : 104
Get Book Here
Book Description
Author: Suchit Sharma
Publisher: GRIN Verlag
ISBN: 3668588252
Category : Technology & Engineering
Languages : en
Pages : 21
Get Book Here
Book Description
Literature Review from the year 2015 in the subject Engineering - General, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation. These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed. Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical "touch" while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyistâs lab in form of ambient-condition scanning environment as opposed to an ultra-high vacuum of sophisticated labs and self-assembled instrumentations. The success of ATM as a cost-effective imaging tool with dramatically increased ease of conceptual understanding and use particularly with the assistance of significant computing power in the form of personal computers which offsets the computational difficulty of resolving experimental information which makes up for physical simplicity of instrument design has seen its proliferation to numerous labs in universities and technology companies worldwide.
Author: Moris Musa Dovek
Publisher:
ISBN:
Category :
Languages : en
Pages : 298
Get Book Here
Book Description
Author: Aidan Quinn
Publisher:
ISBN:
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author: Roland Wiesendanger
Publisher: Cambridge University Press
ISBN: 9780521428477
Category : Science
Languages : en
Pages : 664
Get Book Here
Book Description
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
