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Author: C.H. Stapper
Publisher: Springer Science & Business Media
ISBN: 1475799578
Category : Technology & Engineering
Languages : en
Pages : 313
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Book Description
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
Author: C.H. Stapper
Publisher: Springer Science & Business Media
ISBN: 1475799578
Category : Technology & Engineering
Languages : en
Pages : 313
Get Book Here
Book Description
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
Author: Israel Koren
Publisher: Springer Science & Business Media
ISBN: 1461567998
Category : Computers
Languages : en
Pages : 362
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Book Description
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Author: C. H. Stapper
Publisher:
ISBN: 9781475799583
Category :
Languages : en
Pages : 332
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Book Description
Author: Robert Aitken
Publisher:
ISBN: 9780769522418
Category : Technology & Engineering
Languages : en
Pages : 524
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Book Description
DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Author: Israel Koren
Publisher: Elsevier
ISBN: 0080492681
Category : Computers
Languages : en
Pages : 399
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Book Description
Fault-Tolerant Systems is the first book on fault tolerance design with a systems approach to both hardware and software. No other text on the market takes this approach, nor offers the comprehensive and up-to-date treatment that Koren and Krishna provide. This book incorporates case studies that highlight six different computer systems with fault-tolerance techniques implemented in their design. A complete ancillary package is available to lecturers, including online solutions manual for instructors and PowerPoint slides. Students, designers, and architects of high performance processors will value this comprehensive overview of the field. - The first book on fault tolerance design with a systems approach - Comprehensive coverage of both hardware and software fault tolerance, as well as information and time redundancy - Incorporated case studies highlight six different computer systems with fault-tolerance techniques implemented in their design - Available to lecturers is a complete ancillary package including online solutions manual for instructors and PowerPoint slides
Author: Israel Koren
Publisher: Springer
ISBN: 9780306432248
Category : Computers
Languages : en
Pages : 362
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Book Description
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Author: Israel Koren
Publisher: Morgan Kaufmann
ISBN: 0128181060
Category : Computers
Languages : en
Pages : 418
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Book Description
Fault-Tolerant Systems, Second Edition, is the first book on fault tolerance design utilizing a systems approach to both hardware and software. No other text takes this approach or offers the comprehensive and up-to-date treatment that Koren and Krishna provide. The book comprehensively covers the design of fault-tolerant hardware and software, use of fault-tolerance techniques to improve manufacturing yields, and design and analysis of networks. Incorporating case studies that highlight more than ten different computer systems with fault-tolerance techniques implemented in their design, the book includes critical material on methods to protect against threats to encryption subsystems used for security purposes. The text's updated content will help students and practitioners in electrical and computer engineering and computer science learn how to design reliable computing systems, and how to analyze fault-tolerant computing systems. - Delivers the first book on fault tolerance design with a systems approach - Offers comprehensive coverage of both hardware and software fault tolerance, as well as information and time redundancy - Features fully updated content plus new chapters on failure mechanisms and fault-tolerance in cyber-physical systems - Provides a complete ancillary package, including an on-line solutions manual for instructors and PowerPoint slides
Author: Daniel Sorin
Publisher: Springer Nature
ISBN: 3031017234
Category : Technology & Engineering
Languages : en
Pages : 103
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Book Description
For many years, most computer architects have pursued one primary goal: performance. Architects have translated the ever-increasing abundance of ever-faster transistors provided by Moore's law into remarkable increases in performance. Recently, however, the bounty provided by Moore's law has been accompanied by several challenges that have arisen as devices have become smaller, including a decrease in dependability due to physical faults. In this book, we focus on the dependability challenge and the fault tolerance solutions that architects are developing to overcome it. The two main purposes of this book are to explore the key ideas in fault-tolerant computer architecture and to present the current state-of-the-art - over approximately the past 10 years - in academia and industry. Table of Contents: Introduction / Error Detection / Error Recovery / Diagnosis / Self-Repair / The Future
Author: Olga Goloubeva
Publisher: Springer Science & Business Media
ISBN: 0387329374
Category : Technology & Engineering
Languages : en
Pages : 238
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Book Description
This book presents the theory behind software-implemented hardware fault tolerance, as well as the practical aspects needed to put it to work on real examples. By evaluating accurately the advantages and disadvantages of the already available approaches, the book provides a guide to developers willing to adopt software-implemented hardware fault tolerance in their applications. Moreover, the book identifies open issues for researchers willing to improve the already available techniques.
Author: Swee-Huay Heng
Publisher: Springer
ISBN: 3642176194
Category : Computers
Languages : en
Pages : 366
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Book Description
The 9th International Conference on Cryptology and Network Security (CANS 2010) was held in Kuala Lumpur, Malaysia during December 12–14, 2010. The conference was co-organized by the Multimedia University (MMU), Malaysia, and Universiti Tunku Abdul Rahman (UTAR), Malaysia. The conference received 64 submissions from 22 countries, out of which 21 were accepted after a careful and thorough review process. These proceedings also contain abstracts for two invited talks. All submissions were reviewed by at least three members of the Program Committee; those authored or co-authored by Program Committee members were reviewed by at least ?ve reviewers. P- gram Committee members were allowed to use external reviewers to assist with their reviews, but remained responsible for the contents of the review and r- resenting papers during the discussion and decision making. The review phase was followed by a 10-day discussion phase in which each paper with at least one supporting review was discussed, additional experts were consulted where needed, and ?nal decisions were made. We thank the Program Committee for their hard work in selecting the p- gram. We also thank the external reviewers who assisted with reviewing and the CANS Steering Committee for their help. We thank Shai Halevi for use of his Web-Submission-and-Review software that was used for the electronic s- mission and review of the submitted papers, and we thank the International Association for Cryptologic Research (IACR) for Web hosting of the software.
