Colloquium on Jitter in Digital Communication Systems PDF Download
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Author: T. R. Rowbotham
Publisher:
ISBN:
Category :
Languages : en
Pages : 80
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Book Description
Author: T. R. Rowbotham
Publisher:
ISBN:
Category :
Languages : en
Pages : 80
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Institution of Electrical Engineers. Professional Group E7 (Telecommunication Networks & Systems)
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Frank F. E. Owen
Publisher: McGraw-Hill Companies
ISBN:
Category : Computers
Languages : en
Pages : 332
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Book Description
Author:
Publisher:
ISBN:
Category : Communication
Languages : en
Pages : 992
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Book Description
Author: Dennis Derickson
Publisher: Pearson Education
ISBN: 0132797216
Category : Technology & Engineering
Languages : en
Pages : 1242
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Book Description
A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works. Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout. Coverage includes Signal integrity from a measurement point of view Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes Bit error ratio measurements for both electrical and optical links Extensive coverage on the topic of jitter in high-speed networks State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing Channel and system characterization: TDR/T and frequency domain-based alternatives Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM
Author: Kokula Krishna Hari K
Publisher: Association of Scientists, Developers and Faculties (ASDF)
ISBN: 8192986616
Category : Computers
Languages : en
Pages : 257
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Book Description
ICSSCCET 2015 will be the most comprehensive conference focused on the various aspects of advances in Systems, Science, Management, Medical Sciences, Communication, Engineering, Technology, Interdisciplinary Research Theory and Technology. This Conference provides a chance for academic and industry professionals to discuss recent progress in the area of Interdisciplinary Research Theory and Technology. Furthermore, we expect that the conference and its publications will be a trigger for further related research and technology improvements in this important subject. The goal of this conference is to bring together the researchers from academia and industry as well as practitioners to share ideas, problems and solutions relating to the multifaceted aspects of Interdisciplinary Research Theory and Technology.
Author:
Publisher:
ISBN:
Category : Telecommunication
Languages : en
Pages : 712
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Book Description
Author: Yongquan Fan
Publisher: Springer Science & Business Media
ISBN: 9048193982
Category : Technology & Engineering
Languages : en
Pages : 200
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Book Description
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces. Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.
Author:
Publisher: Allied Publishers
ISBN: 9788177640151
Category : Soft computing
Languages : en
Pages : 678
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Book Description
