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Author: Herman Casier
Publisher: Springer Science & Business Media
ISBN: 9400703910
Category : Technology & Engineering
Languages : en
Pages : 369
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Book Description
Analog Circuit Design contains the contribution of 18 tutorials of the 19th workshop on Advances in Analog Circuit Design. Each part discusses a specific to-date topic on new and valuable design ideas in the area of analog circuit design. Each part is presented by six experts in that field and state of the art information is shared and overviewed. This book is number 20 in this successful series of Analog Circuit Design, providing valuable information and excellent overviews of: Robust Design, chaired by Herman Casier, Consultant Sigma Delta Converters, chaired by Prof. Michiel Steyaert, Catholic University Leuven RFID, chaired by Prof. Arthur van Roermund, Eindhoven University of Technology Analog Circuit Design is an essential reference source for analog circuit designers and researchers wishing to keep abreast with the latest development in the field. The tutorial coverage also makes it suitable for use in an advanced design course.
Author: Herman Casier
Publisher: Springer Science & Business Media
ISBN: 9400703910
Category : Technology & Engineering
Languages : en
Pages : 369
Get Book Here
Book Description
Analog Circuit Design contains the contribution of 18 tutorials of the 19th workshop on Advances in Analog Circuit Design. Each part discusses a specific to-date topic on new and valuable design ideas in the area of analog circuit design. Each part is presented by six experts in that field and state of the art information is shared and overviewed. This book is number 20 in this successful series of Analog Circuit Design, providing valuable information and excellent overviews of: Robust Design, chaired by Herman Casier, Consultant Sigma Delta Converters, chaired by Prof. Michiel Steyaert, Catholic University Leuven RFID, chaired by Prof. Arthur van Roermund, Eindhoven University of Technology Analog Circuit Design is an essential reference source for analog circuit designers and researchers wishing to keep abreast with the latest development in the field. The tutorial coverage also makes it suitable for use in an advanced design course.
Author:
Publisher: Allied Publishers
ISBN: 9780780381629
Category : Artificial intelligence
Languages : en
Pages : 434
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Book Description
Author:
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 442
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Book Description
Author: Cheng Wang
Publisher: Springer Science & Business Media
ISBN: 1468485474
Category : Science
Languages : en
Pages : 345
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Book Description
As device dimensions decrease, hot-carrier effects, which are due mainly to the presence of a high electric field inside the device, are becoming a major design concern. On the one hand, the detrimental effects-such as transconductance degradation and threshold shift-need to be minimized or, if possible, avoided altogether. On the other hand, performance such as the programming efficiency of nonvolatile memories or the carrier velocity inside the devices-need to be maintained or improved through the use of submicron technologies, even in the presence of a reduced power supply. As a result, one of the major challenges facing MOS design engineers today is to harness the hot-carrier effects so that, without sacrificing product performance, degradation can be kept to a minimum and a reli able design obtained. To accomplish this, the physical mechanisms re sponsible for the degradations should first be experimentally identified and characterized. With adequate models thus obtained, steps can be taken to optimize the design, so that an adequate level of quality assur ance in device or circuit performance can be achieved. This book ad dresses these hot-carrier design issues for MOS devices and circuits, and is used primarily as a professional guide for process development engi neers, device engineers, and circuit designers who are interested in the latest developments in hot-carrier degradation modeling and hot-carrier reliability design techniques. It may also be considered as a reference book for graduate students who have some research interests in this excit ing, yet sometime controversial, field.
Author: Tibor Grasser
Publisher: Springer
ISBN: 3319089943
Category : Technology & Engineering
Languages : en
Pages : 518
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Book Description
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
Author: Khandker Nazrul Quader
Publisher:
ISBN:
Category :
Languages : en
Pages : 368
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Book Description
Author: Trent McConaghy
Publisher: Springer Science & Business Media
ISBN: 1461422698
Category : Technology & Engineering
Languages : en
Pages : 198
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Book Description
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 702
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Book Description
Author: Ashutosh Tiwari
Publisher: John Wiley & Sons
ISBN: 1119242797
Category : Technology & Engineering
Languages : en
Pages : 592
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Book Description
Overall, this book presents a detailed and comprehensive overview of the state-of-the-art development of different nanoscale intelligent materials for advanced applications. Apart from fundamental aspects of fabrication and characterization of nanomaterials, it also covers key advanced principles involved in utilization of functionalities of these nanomaterials in appropriate forms. It is very important to develop and understand the cutting-edge principles of how to utilize nanoscale intelligent features in the desired fashion. These unique nanoscopic properties can either be accessed when the nanomaterials are prepared in the appropriate form, e.g., composites, or in integrated nanodevice form for direct use as electronic sensing devices. In both cases, the nanostructure has to be appropriately prepared, carefully handled, and properly integrated into the desired application in order to efficiently access its intelligent features. These aspects are reviewed in detail in three themed sections with relevant chapters: Nanomaterials, Fabrication and Biomedical Applications; Nanomaterials for Energy, Electronics, and Biosensing; Smart Nanocomposites, Fabrication, and Applications.
Author: Shahrzad Salemi
Publisher: RIAC
ISBN: 1933904291
Category : Electronic apparatus and appliances
Languages : en
Pages : 271
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Book Description
