Characterization of Bicrystal Grain Boundary Properties Using Device Structures PDF Download
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Author: S. Hogan
Publisher:
ISBN:
Category : Crystal growth
Languages : en
Pages : 6
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Book Description
This work centers on the use of small (2 mm x 2 mm) photovoltaic devices to determine the electrical characteristics of selective grain boundaries. The edge supported pulling (ESP) bicrystal sheet growth method allows crystal orientation to be determined prior to growth and as such is an excellent tool for selective examination. Photolithographic techniques of a special pattern and mesa etching were used to isolate areas on an around the grain boundaries for device characterization. Spreading resistance measurements over and next to the grain boundaries, as well as characterization, were used to study electrical effects of these grain boundaries.
Author: S. Hogan
Publisher:
ISBN:
Category : Crystal growth
Languages : en
Pages : 6
Get Book Here
Book Description
This work centers on the use of small (2 mm x 2 mm) photovoltaic devices to determine the electrical characteristics of selective grain boundaries. The edge supported pulling (ESP) bicrystal sheet growth method allows crystal orientation to be determined prior to growth and as such is an excellent tool for selective examination. Photolithographic techniques of a special pattern and mesa etching were used to isolate areas on an around the grain boundaries for device characterization. Spreading resistance measurements over and next to the grain boundaries, as well as characterization, were used to study electrical effects of these grain boundaries.
Author: S. Hogan
Publisher:
ISBN:
Category : Crystal growth
Languages : en
Pages : 0
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Book Description
This work centers on the use of small (2 mm x 2 mm) photovoltaic devices to determine the electrical characteristics of selective grain boundaries. The edge supported pulling (ESP) bicrystal sheet growth method allows crystal orientation to be determined prior to growth and as such is an excellent tool for selective examination. Photolithographic techniques of a special pattern and mesa etching were used to isolate areas on an around the grain boundaries for device characterization. Spreading resistance measurements over and next to the grain boundaries, as well as characterization, were used to study electrical effects of these grain boundaries.
Author:
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ISBN:
Category : Aeronautics
Languages : en
Pages : 280
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Book Description
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 664
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Book Description
Author:
Publisher:
ISBN:
Category : Photovoltaic power generation
Languages : en
Pages : 180
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Book Description
Author:
Publisher:
ISBN:
Category : Solar energy
Languages : en
Pages : 884
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Book Description
Author:
Publisher:
ISBN:
Category : Photovoltaic cells
Languages : en
Pages : 1496
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Book Description
Author: Nigel D. Browning
Publisher: Cambridge University Press
ISBN: 1139429167
Category : Science
Languages : en
Pages : 409
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Book Description
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
Author:
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ISBN:
Category : Government publications
Languages : en
Pages : 48
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Book Description
Author: Paula M. Vilarinho
Publisher: Springer Science & Business Media
ISBN: 1402030193
Category : Science
Languages : en
Pages : 503
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Book Description
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
