Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 102
Book Description
Calibration Technique Based on LSTM Regression Neural Network for Time-Interleaved SAR Analog-to-Digital Converter
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 102
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 102
Book Description
All Digital, Background Calibration for Time-Interleaved and Successive Approximation Register Analog-to-Digital Converters
Author: Christopher Leonidas David
Publisher:
ISBN:
Category :
Languages : en
Pages : 370
Book Description
Abstract: The growth of digital systems underscores the need to convert analog information to the digital domain at high speeds and with great accuracy. Analog-to-Digital Converter (ADC) calibration is often a limiting factor, requiring longer calibration times to achieve higher accuracy. The goal of this dissertation is to perform a fully digital background calibration using an arbitrary input signal for A/D converters. The work presented here adapts the cyclic "Split-ADC" calibration method to the time interleaved (TI) and successive approximation register (SAR) architectures. The TI architecture has three types of linear mismatch errors: offset, gain and aperture time delay. By correcting all three mismatch errors in the digital domain, each converter is capable of operating at the fastest speed allowed by the process technology. The total number of correction parameters required for calibration is dependent on the interleaving ratio, M. To adapt the "Split-ADC" method to a TI system, 2M+1 half-sized converters are required to estimate 3(2M+1) correction parameters. This thesis presents a 4:1 "Split-TI" converter that achieves full convergence in less than 400,000 samples. The SAR architecture employs a binary weight capacitor array to convert analog inputs into digital output codes. Mismatch in the capacitor weights results in non-linear distortion error. By adding redundant bits and dividing the array into individual unit capacitors, the "Split-SAR" method can estimate the mismatch and correct the digital output code. The results from this work show a reduction in the non-linear distortion with the ability to converge in less than 750,000 samples.
Publisher:
ISBN:
Category :
Languages : en
Pages : 370
Book Description
Abstract: The growth of digital systems underscores the need to convert analog information to the digital domain at high speeds and with great accuracy. Analog-to-Digital Converter (ADC) calibration is often a limiting factor, requiring longer calibration times to achieve higher accuracy. The goal of this dissertation is to perform a fully digital background calibration using an arbitrary input signal for A/D converters. The work presented here adapts the cyclic "Split-ADC" calibration method to the time interleaved (TI) and successive approximation register (SAR) architectures. The TI architecture has three types of linear mismatch errors: offset, gain and aperture time delay. By correcting all three mismatch errors in the digital domain, each converter is capable of operating at the fastest speed allowed by the process technology. The total number of correction parameters required for calibration is dependent on the interleaving ratio, M. To adapt the "Split-ADC" method to a TI system, 2M+1 half-sized converters are required to estimate 3(2M+1) correction parameters. This thesis presents a 4:1 "Split-TI" converter that achieves full convergence in less than 400,000 samples. The SAR architecture employs a binary weight capacitor array to convert analog inputs into digital output codes. Mismatch in the capacitor weights results in non-linear distortion error. By adding redundant bits and dividing the array into individual unit capacitors, the "Split-SAR" method can estimate the mismatch and correct the digital output code. The results from this work show a reduction in the non-linear distortion with the ability to converge in less than 750,000 samples.
Calibration Techniques in Nyquist A/D Converters
Author: Hendrik van der Ploeg
Publisher: Springer Science & Business Media
ISBN: 1402046359
Category : Technology & Engineering
Languages : en
Pages : 203
Book Description
This book analyses different A/D-converter architectures with an emphasis on the maximum achievable power efficiency. It also provides an accessible overview of the state-of-the art in calibration techniques for Nyquist A/D converters. The calibration techniques presented are applicable to other analog-to-digital systems, such as those applied in integrated receivers. They allow implementation without introducing a speed or power penalty.
Publisher: Springer Science & Business Media
ISBN: 1402046359
Category : Technology & Engineering
Languages : en
Pages : 203
Book Description
This book analyses different A/D-converter architectures with an emphasis on the maximum achievable power efficiency. It also provides an accessible overview of the state-of-the art in calibration techniques for Nyquist A/D converters. The calibration techniques presented are applicable to other analog-to-digital systems, such as those applied in integrated receivers. They allow implementation without introducing a speed or power penalty.
A Calibration Service for Analog-to-digital and Digital-to-analog Converters
Author: T. Michael Souders
Publisher:
ISBN:
Category : Analog-to-digital converters
Languages : en
Pages : 84
Book Description
Publisher:
ISBN:
Category : Analog-to-digital converters
Languages : en
Pages : 84
Book Description
Blind Calibration for Time-interleaved Analog-to-digital Converters
Author: Yuhui Huang
Publisher:
ISBN:
Category :
Languages : en
Pages : 326
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 326
Book Description
Timing Skew Calibration for Time Interleaved Analog to Digital Converters
Author: Luke Wang
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
A Fast-Fourier-Transform-Based Digital Calibration Technique for Successive-Approximation-Register Analog-to-Digital Converters
Author: 李育丞
Publisher:
ISBN:
Category :
Languages : en
Pages : 81
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 81
Book Description
Background Digital Calibration for Interstage Gain Errors and Memory Effects in Pipelined Analog-to-digital Converters
Author: John Patrick Keane
Publisher:
ISBN:
Category :
Languages : en
Pages : 242
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 242
Book Description
Digital Background Calibration for Pipelined and Time-interleaved Analog-to-digital Converters
Author: Kamal Elsankary
Publisher:
ISBN:
Category :
Languages : en
Pages : 274
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 274
Book Description
A Background Calibration Technique and Self Testing Method for the Pipeline Analog to Digital Converter
Author: Jae Ki Yoo
Publisher:
ISBN:
Category : Analog-to-digital converters
Languages : en
Pages : 210
Book Description
Publisher:
ISBN:
Category : Analog-to-digital converters
Languages : en
Pages : 210
Book Description