Bifurcation Behavior in Laser Direct-write Metallization from Thin Films PDF Download
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Author: Peter Everett Price
Publisher:
ISBN:
Category :
Languages : en
Pages : 656
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Book Description
Author: Peter Everett Price
Publisher:
ISBN:
Category :
Languages : en
Pages : 656
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Book Description
Author:
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 768
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Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 802
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Author: University of Minnesota. Graduate School
Publisher:
ISBN:
Category :
Languages : en
Pages : 102
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Book Description
Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 1146
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Book Description
Author: Peter Schaaf
Publisher: Springer Science & Business Media
ISBN: 3642132812
Category : Science
Languages : en
Pages : 241
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Book Description
Laser materials processing has made tremendous progress and is now at the forefront of industrial and medical applications. The book describes recent advances in smart and nanoscaled materials going well beyond the traditional cutting and welding applications. As no analytical methods are described the examples are really going into the details of what nowadways is possible by employing lasers for sophisticated materials processing giving rise to achievements not possible by conventional materials processing.
Author:
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Category : Mechanics, Applied
Languages : en
Pages : 390
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Author:
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Category : Electrical engineering
Languages : en
Pages : 2240
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Book Description
Author: Ismail C. Noyan
Publisher: Springer
ISBN: 1461395704
Category : Technology & Engineering
Languages : en
Pages : 286
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Book Description
Author: A. Christou
Publisher: Springer Science & Business Media
ISBN: 9400924828
Category : Technology & Engineering
Languages : en
Pages : 571
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Book Description
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
