Anomalous and Resonance Small Angle Scattering PDF Download
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Languages : en
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Significant changes in the small angle scattered intensity can be induced by making measurements with radiation close to an absorption edge of an appropriate atomic species contained in the sample. These changes can be related quantitatively to the real and imaginary anomalous dispersion terms for the scattering factor (x-rays) or scattering length (neutrons). The physics inherent in these anomalous dispersion terms is first discussed before considering how they enter the relevant scattering theory. Two major areas of anomalous scattering research have emerged; macromolecules in solution and unmixing of metallic alloys. Research in each area is reviewed, illustrating both the feasibility and potential of these techniques. All the experimental results reported to date have been obtained with x-rays. However, it is pointed out that the formalism is the same for the analogue experiment with neutrons, and a number of suitable isotopes exist which exhibit resonance in an accessible range of energy. Potential applications of resonance small angle neutron scatterings are discussed. 54 refs., 8 figs., 1 tab.
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Languages : en
Pages :
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Book Description
Significant changes in the small angle scattered intensity can be induced by making measurements with radiation close to an absorption edge of an appropriate atomic species contained in the sample. These changes can be related quantitatively to the real and imaginary anomalous dispersion terms for the scattering factor (x-rays) or scattering length (neutrons). The physics inherent in these anomalous dispersion terms is first discussed before considering how they enter the relevant scattering theory. Two major areas of anomalous scattering research have emerged; macromolecules in solution and unmixing of metallic alloys. Research in each area is reviewed, illustrating both the feasibility and potential of these techniques. All the experimental results reported to date have been obtained with x-rays. However, it is pointed out that the formalism is the same for the analogue experiment with neutrons, and a number of suitable isotopes exist which exhibit resonance in an accessible range of energy. Potential applications of resonance small angle neutron scatterings are discussed. 54 refs., 8 figs., 1 tab.
Author: H. Brumberger
Publisher: Springer Science & Business Media
ISBN: 9401584575
Category : Technology & Engineering
Languages : en
Pages : 470
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Proceedings of the NATO Advanced Study Institute, Como, Italy, May 12--22, 1993
Author:
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Category : Power resources
Languages : en
Pages : 840
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Author:
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ISBN:
Category : Power resources
Languages : en
Pages : 676
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Author: L.A. Feigin
Publisher: Springer Science & Business Media
ISBN: 1475766246
Category : Science
Languages : en
Pages : 339
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Book Description
Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.
Author: Eike Gericke
Publisher:
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Category :
Languages : en
Pages :
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Author: David E. Laughlin
Publisher: Newnes
ISBN: 0444537716
Category : Technology & Engineering
Languages : en
Pages : 2963
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Book Description
This fifth edition of the highly regarded family of titles that first published in 1965 is now a three-volume set and over 3,000 pages. All chapters have been revised and expanded, either by the fourth edition authors alone or jointly with new co-authors. Chapters have been added on the physical metallurgy of light alloys, the physical metallurgy of titanium alloys, atom probe field ion microscopy, computational metallurgy, and orientational imaging microscopy. The books incorporate the latest experimental research results and theoretical insights. Several thousand citations to the research and review literature are included. - Exhaustively synthesizes the pertinent, contemporary developments within physical metallurgy so scientists have authoritative information at their fingertips - Replaces existing articles and monographs with a single, complete solution - Enables metallurgists to predict changes and create novel alloys and processes
Author: Yoshiyuki Kawazoe
Publisher: Springer Science & Business Media
ISBN: 3662101165
Category : Science
Languages : en
Pages : 217
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Author: Françoise Hippert
Publisher: Springer Science & Business Media
ISBN: 1402033370
Category : Science
Languages : en
Pages : 580
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Book Description
- Up-to-date account of the principles and practice of inelastic and spectroscopic methods available at neutron and synchrotron sources - Multi-technique approach set around a central theme, rather than a monograph on one technique - Emphasis on the complementarity of neutron spectroscopy and X-ray spectroscopy which are usually treated in separate books
Author: Eric Lifshin
Publisher: John Wiley & Sons
ISBN: 3527613757
Category : Technology & Engineering
Languages : en
Pages : 277
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Book Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
