Author: Robert E. Peddenpohl
Publisher:
ISBN:
Category :
Languages : en
Pages : 204
Book Description
Analytical Modeling of Thermal Effects in Pnp InP-based Heterojunction Bipolar Transistors
Author: Robert E. Peddenpohl
Publisher:
ISBN:
Category :
Languages : en
Pages : 204
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 204
Book Description
Contributions to the analytical modeling of distributed thermal and electrical substrate coupling effects in heterojunction bipolar transistors
Author: Yves Zimmermann
Publisher:
ISBN: 9783959081092
Category :
Languages : en
Pages : 184
Book Description
Publisher:
ISBN: 9783959081092
Category :
Languages : en
Pages : 184
Book Description
An Analytical Approach to Modeling InP-based NPN Heterojunction Bipolar Transistors
Author: Todd Conklin
Publisher:
ISBN:
Category :
Languages : en
Pages : 346
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 346
Book Description
Physics-based compact modeling and parameter extraction for InP heterojunction bipolar transistors with special emphasis on material-specific physical effects and geometry scaling
Author: Tobias Nardmann
Publisher: BoD – Books on Demand
ISBN: 3744847063
Category : Technology & Engineering
Languages : en
Pages : 242
Book Description
The trend in modern electronics towards ever higher frequencies of operation and complexity as well as power efficiency requires a whole palette of different technologies to be available to circuit designers for various applications. While MOSFETs dominate the digital world, they have apparently reached their top analogue performance around the 65nm node. Emerging technologies such as CNTFETs offer excellent properties such as very high linearity and speed in theory, but have yet to deliver on those promises in practice. Heterojunction bipolar transistors (HBTs), on the other hand, offer a number of key advantages over competing technologies: A very high transconductance and therefore a relatively low impact of a load impedance on the transistor operation, a high transit frequency and maximum frequency of oscillation at a comparatively relaxed feature size and favorable noise characteristics. Like all semiconductor devices, HBTs can be fabricated in diferent semiconductor materials. The most common are SiGe HBTs, which even today reach values above (ft; fmax) = (300; 500) GHz and are projected to eventually reach the THz range. However, HBTs fabricated in III-V materials offer a versatile alternative. Depending on the materials that are used, III-V HBTs can be the fastest available bipolar transistors (competing only with HEMTs, also fabricated in III-V materials, for the title of fastest available transistors overall), offer very high breakdown voltages and therefore excellent power-handling capability, show good linearity or low noise figures at high frequencies. Typical applications for III-V HBTs include handset PAs, high-effciency and high-speed amplifiers as well as high-speed oscillators . Overall, III-V-based HBTs and especially InP HBTs are excellent candidates for future high-speed communication circuits. The goal of this work is to include important effects occurring in III-V materials in a compact model for circuit design in a physical, yet intuitive way in order to aid deployment of III-V HBTs in prototypes and products. Additionally, the parameter extraction procedure for the compact model is described and analyzed in detail so an accurate, physics-based parameter set can be obtained. Finally, the agreement of the model with measurements is demonstrated for three different III-V HBT processes.
Publisher: BoD – Books on Demand
ISBN: 3744847063
Category : Technology & Engineering
Languages : en
Pages : 242
Book Description
The trend in modern electronics towards ever higher frequencies of operation and complexity as well as power efficiency requires a whole palette of different technologies to be available to circuit designers for various applications. While MOSFETs dominate the digital world, they have apparently reached their top analogue performance around the 65nm node. Emerging technologies such as CNTFETs offer excellent properties such as very high linearity and speed in theory, but have yet to deliver on those promises in practice. Heterojunction bipolar transistors (HBTs), on the other hand, offer a number of key advantages over competing technologies: A very high transconductance and therefore a relatively low impact of a load impedance on the transistor operation, a high transit frequency and maximum frequency of oscillation at a comparatively relaxed feature size and favorable noise characteristics. Like all semiconductor devices, HBTs can be fabricated in diferent semiconductor materials. The most common are SiGe HBTs, which even today reach values above (ft; fmax) = (300; 500) GHz and are projected to eventually reach the THz range. However, HBTs fabricated in III-V materials offer a versatile alternative. Depending on the materials that are used, III-V HBTs can be the fastest available bipolar transistors (competing only with HEMTs, also fabricated in III-V materials, for the title of fastest available transistors overall), offer very high breakdown voltages and therefore excellent power-handling capability, show good linearity or low noise figures at high frequencies. Typical applications for III-V HBTs include handset PAs, high-effciency and high-speed amplifiers as well as high-speed oscillators . Overall, III-V-based HBTs and especially InP HBTs are excellent candidates for future high-speed communication circuits. The goal of this work is to include important effects occurring in III-V materials in a compact model for circuit design in a physical, yet intuitive way in order to aid deployment of III-V HBTs in prototypes and products. Additionally, the parameter extraction procedure for the compact model is described and analyzed in detail so an accurate, physics-based parameter set can be obtained. Finally, the agreement of the model with measurements is demonstrated for three different III-V HBT processes.
Simulation, Design, and Fabrication of InP-based Pnp Heterojunction Bipolar Transistors
Author: Suman Datta
Publisher:
ISBN:
Category :
Languages : en
Pages : 552
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 552
Book Description
International Conference on Indium Phosphide and Related Materials
Author:
Publisher:
ISBN:
Category : Electrooptical devices
Languages : en
Pages : 602
Book Description
Publisher:
ISBN:
Category : Electrooptical devices
Languages : en
Pages : 602
Book Description
A Numerical Simulation of InP-based PNP Heterojunction Bipolar Transistors
Author: Shen Shi
Publisher:
ISBN:
Category :
Languages : en
Pages : 402
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 402
Book Description
Thermionic Emission Diffusion Model of InP-based Pnp Heterojunction Bipolar Transistor with Non-uniform Base Doping
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
In the past few years, GaAs and InP and, more recently, GaN based Npn and Pnp Heterojunction Bipolar Transistors (HBTs) have been grown and their performance has been evaluated in great details due to their potential applications in microwave, millimeter-wave, optoelectronics and high-speed applications. This model includes the physics of hole thermionic-emission-diffusion injection at the emitter-base heterojunction and transport of holes across a linearly doped base, a calculation of the recombination currents in the base current including the effects of linear base doping, and a comparison of the effects of linear and uniform doping on current gain and base transit time. Our simulations show that the use of non-uniform doping in the base of Pnp HBTs helps increasing the DC current gain by as much as a factor of 4. Simultaneously, we show that the base transit time, which is the major component to the overall delay time, is reduced by factor of 2. This should help increasing the unit current gain frequency and high frequency performance of Pnp HBTs.
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
In the past few years, GaAs and InP and, more recently, GaN based Npn and Pnp Heterojunction Bipolar Transistors (HBTs) have been grown and their performance has been evaluated in great details due to their potential applications in microwave, millimeter-wave, optoelectronics and high-speed applications. This model includes the physics of hole thermionic-emission-diffusion injection at the emitter-base heterojunction and transport of holes across a linearly doped base, a calculation of the recombination currents in the base current including the effects of linear base doping, and a comparison of the effects of linear and uniform doping on current gain and base transit time. Our simulations show that the use of non-uniform doping in the base of Pnp HBTs helps increasing the DC current gain by as much as a factor of 4. Simultaneously, we show that the base transit time, which is the major component to the overall delay time, is reduced by factor of 2. This should help increasing the unit current gain frequency and high frequency performance of Pnp HBTs.
Thermal Characterization and Modeling of Heterojunction Bipolar Transistors
Author: David S. Whitefield
Publisher:
ISBN:
Category : Bipolar transistors
Languages : en
Pages : 246
Book Description
Publisher:
ISBN:
Category : Bipolar transistors
Languages : en
Pages : 246
Book Description
A Physics-based Model for Microwave Heterojunction Bipolar Transistors
Author: Shean-Yih Chiu
Publisher:
ISBN:
Category :
Languages : en
Pages : 288
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 288
Book Description