An Investigation of the Microstructure and Magnetic Properties of Pulsed-laser Deposited Co2MnSi Thin Films PDF Download
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Author: Anna May Booton
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Languages : en
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Author: Anna May Booton
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Languages : en
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Author: Ning Shu
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Category : Dissertations, Academic
Languages : en
Pages : 244
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Author: Yōichi Uchiyama
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Category :
Languages : en
Pages : 215
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Author: Li Tang
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Category :
Languages : en
Pages : 312
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Author: Alexandra Caoline Ford
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Category :
Languages : en
Pages : 94
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Author: Brookhaven National Laboratory. National Synchrotron Light Source
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Languages : en
Pages : 208
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Languages : en
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Thin film ferroelectricss are widely considered for tunable microwave applications, the reduced small dimensions leading to low tuning voltages. The incipient ferroelectric strontium titanate is an ideal solution for tunable microwave devices, particularly in conjunction with high temperature superconductors. It has no spontaneous polarisation yet possesses a large permittivity at low temperatures that is sensitive to an electric field bias with relatively low loss. For such applications it is essential to use a low loss substrate such as magnesium oxide. In general, thin films have less favourable dielectric properties compared with their bulk counterparts due to differences in microstructure. strontium titanate films on MgO substrate prove difficult to grow due to the high lattice mismatch and issues connected with chemical incompatibility at the film/substrate interface. It has been shown here that it is possible to engineer the growth mode of this system, altering the strain and the defect concentration. These are both known factors influencing the dielectric properties of thin films. Reflection high energy electron diffraction (RHEED) in combination with interval pulsed laser deposition (PLD) has been used to achieve a two dimensional, layer-by-layer growth mode. Crucial to this was the deposition of a unit-cell thick titanium dioxide buffer layer on the surface, the deposition of which was also controlled by RHEED. The growth mode and microstructure of films grown using standard PLD with and without the buffer layer and films grown by interval PLD with and without the buffer layer have been compared by analysis of the RHEED data and transmission electron microscopy. This is the first time layer-by-layer growth has been achieved in this highly-mismatched epitaxial systems. The results point the way towards control of defects in oxide thin films from which microstructure-property relationships may be more clearly determined.
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Author: Rajiv Kumar Singh
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Category :
Languages : en
Pages : 836
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Languages : en
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Abstract : Co2 MnSi thin films are made by magnetron sputtering onto MgO (001) substrates. The crystalline quality is improved by increasing depositing temperature and/or annealing temperature. The sample deposited at 550°C and subsequently annealed at 550°C (sample I) exhibits a pseudo-epitaxial growth with partially ordered L21 phase. Sample I shows a four-fold magnetic anisotropy, in addition to a relatively weak uniaxial anisotropy. The Gilbert damping factor of sample I is smaller than 0.001, much smaller than reported ones. The possible reasons responsible for the small Gilbert damping factor are discussed, including weak spin-orbit coupling, small density of states at Fermi level, and so on.
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Languages : en
Pages : 6
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Growth of LaMnO3 films that exhibit colossal magnetoresistance (CMR) has concentrated heavily on Ca doped materials. However, since the 33% Sr doped films are ferromagnetic at room temperature, they are ideal candidates for dual growth-magnetic structure studies using scanned probe techniques. In this study, interest was focused on the relations between growth/processing parameters, film morphology, and electronic/magnetic properties. In addition, films were grown on both LaAlO3 (LAO) and SrTiO3 (STO) to examine the results of stress induced by different substrate mismatches. La{sub 0.67}Sr{sub 0.33}MnO3 (LSMO) was grown using pulsed laser deposition (PLD) at temperatures between 500 C and 800 C. The film microstructure, crystallinity, and magnetic and electrical properties were characterized by room temperature scanning tunneling microscopy (STM), atomic force microscopy (AFM), magnetic force microscopy (MFM), x-ray diffraction, and temperature dependent transport and magnetization measurements. The growth trends follow those previously reported for Ca doped films. Grains increase in size with increasing temperature and coalesce into extended layers after annealing. Although topographic contributions complicate interpretation of some MFM data, local magnetic structure observed here is generally associated with film defects.
