An in Situ Transmission Electron Microscopy Study of the Ion Irradiation Induced Amorphisation of Silicon by He and Xe PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download An in Situ Transmission Electron Microscopy Study of the Ion Irradiation Induced Amorphisation of Silicon by He and Xe PDF full book. Access full book title An in Situ Transmission Electron Microscopy Study of the Ion Irradiation Induced Amorphisation of Silicon by He and Xe by . Download full books in PDF and EPUB format.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 4
Get Book Here
Book Description
We used transmission electron microscopy with in situ ion irradiation to examine the ion-beam-induced amorphisation of crystalline silicon under irradiation with light (He) and heavy (Xe) ions at room temperature. Analysis of the electron diffraction data reveal the heterogeneous amorphisation mechanism to be dominant in both cases. Moreover, for the differences in the amorphisation curves are discussed in terms of intra-cascade dynamic recovery, and the role of electronic and nuclear loss mechanisms.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 4
Get Book Here
Book Description
We used transmission electron microscopy with in situ ion irradiation to examine the ion-beam-induced amorphisation of crystalline silicon under irradiation with light (He) and heavy (Xe) ions at room temperature. Analysis of the electron diffraction data reveal the heterogeneous amorphisation mechanism to be dominant in both cases. Moreover, for the differences in the amorphisation curves are discussed in terms of intra-cascade dynamic recovery, and the role of electronic and nuclear loss mechanisms.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 17
Get Book Here
Book Description
Interfacing an ion accelerator to a transmission electron microscope (TEM) allows the analytical functions of TEM imaging and diffraction to be employed during ion-irradiation effects studies. At present there are twelve such installations in Japan, one in France and one in the US. This paper treats several aspects of in situ studies involving electron and ion beam induced and enhanced phase transformations and presents results of several in situ experiments to illustrate the dynamics of this approach in the materials science of irradiation effects. The paper describes the ion- and electron-induced amorphization of CuTi; the ion-irradiation-enhanced transformation of TiCr2; and the ion- and electron-irradiation-enhanced crystallization of CoSi2.
Author: Litao Sun
Publisher: Springer Nature
ISBN: 9811968454
Category : Technology & Engineering
Languages : en
Pages : 378
Get Book Here
Book Description
This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.
Author: Renu Sharma
Publisher: John Wiley & Sons
ISBN: 3527834842
Category : Science
Languages : en
Pages : 389
Get Book Here
Book Description
In-Situ Transmission Electron Microscopy Experiments Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals. In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements, incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research. In-Situ Transmission Electron Microscopy Experiments readers will also find: Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more Discussion of future challenges and opportunities facing this field of research In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 13
Get Book Here
Book Description
Motivated at least initially by materials needs for nuclear reactor development, extensive irradiation effects studies employing TEMs have been performed for several decades, involving irradiation-induced and irradiation-enhanced, microstructural changes, including phase transformations such as precipitation, dissolution, crystallization, amorphization, and order-disorder phenomena. From the introduction of commercial high voltage electron microscopes (HVEM) in the mid-1960s, studies of electron irradiation effects have constituted a major aspect of HVEM application in materials science. For irradiation effects studies two additional developments have had particularly significant impact: (1) The availability of TEM specimen holders in which specimen temperature can be controlled in the range 10--2200 K; and (2) the interfacing of ion accelerators which allows in situ TEM studies of irradiation effects and the ion beam modification of materials within this broad temperature range. This paper treats several aspects of in situ studies of electron and ion beam-induced and enhanced phase changes, including the current state of in situ ion beam capability internationally, and presents two case studies involving in situ experiments performed in an HVEM to illustrate the dynamics of such an approach in materials research.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 652
Get Book Here
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 13
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 600
Get Book Here
Book Description
Author: Materials Research Society. Meeting
Publisher:
ISBN:
Category : Materials science
Languages : en
Pages : 684
Get Book Here
Book Description
Author: David A. Howell
Publisher:
ISBN:
Category : Magnetic alloys
Languages : en
Pages : 216
Get Book Here
Book Description
