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Author:
Publisher: Elsevier
ISBN: 0443297878
Category : Technology & Engineering
Languages : en
Pages : 234
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Book Description
Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series
Author:
Publisher: Elsevier
ISBN: 0443297878
Category : Technology & Engineering
Languages : en
Pages : 234
Get Book Here
Book Description
Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series
Author:
Publisher: Academic Press
ISBN: 0080912168
Category : Technology & Engineering
Languages : en
Pages : 406
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Book Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0080525474
Category : Technology & Engineering
Languages : en
Pages : 481
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Book Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 934
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Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 892
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Author:
Publisher: Academic Press
ISBN: 0080577393
Category : Computers
Languages : en
Pages : 337
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Book Description
Advances in Electronics and Electron Physics
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1030
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Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 762
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Semiannual, with semiannual and annual indexes. References to all scientific and technical literature coming from DOE, its laboratories, energy centers, and contractors. Includes all works deriving from DOE, other related government-sponsored information, and foreign nonnuclear information. Arranged under 39 categories, e.g., Biomedical sciences, basic studies; Biomedical sciences, applied studies; Health and safety; and Fusion energy. Entry gives bibliographical information and abstract. Corporate, author, subject, report number indexes.
Author: Roger D. Spence
Publisher: CRC Press
ISBN: 9780873717489
Category : Science
Languages : en
Pages : 290
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Book Description
Chemistry and Microstructure of Solidified Waste Forms presents a comprehensive summary of mechanisms of immobilization in cementitious waste forms and the effect of waste species on cement chemistry and morphology. The book introduces the well-known chemistry and microstructure of cement pastes, in addition to common mechanisms of immobilization of waste species in cementitious waste forms. The fundamental chemical and microstructural fate of waste species is reviewed, and a technique for studying cementitious waste forms using scanning transmission electron microscopy (STEM) is described with examples of its application. Chemistry and Microstructure of Solidified Waste Forms also presents evidence to prove that chromium in waste becomes part of the cement matrix, and the potentially harmful effect of this process is discussed. Data for interpretations are included so that other researchers can analyze the data and draw their own conclusions. The book also discusses how solubility and solubility theory can be combined with leach theory and diffusion theory to predict the leaching performance of cementitious waste forms. Chemistry and Microstructure of Solidified Waste Forms will prove invaluable to hazardous waste professionals, engineers, environmental engineers, chemical engineers, waste disposal managers, waste form developers and researchers, and regulators.
Author:
Publisher:
ISBN:
Category : Military research
Languages : en
Pages : 302
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Book Description
